An Adaptive Decompressor for Test Application with Variable-Length Coding

• Item type: Journal(1)
• 公開日: 2006-06-15
• タイトル: An Adaptive Decompressor for Test Application with Variable-Length Coding
• タイトル / 言語: en
• タイトル: An Adaptive Decompressor for Test Application with Variable-Length Coding
• 言語: eng
• キーワード / 主題Scheme: Other
• キーワード / 主題: 特集：システムＬＳＩ設計とその技術
• 資源タイプ / 資源タイプ識別子: http://purl.org/coar/resource_type/c_6501
• 資源タイプ: journal article
• その他タイトル / その他のタイトル: テスト容易化設計
• 著者所属: Faculty of Information Sciences Hiroshima City University
• 著者所属: Graduate School of Information Sciences Hiroshima City University Presently with Koga Software Company
• 著者所属: Graduate School of Information Sciences Hiroshima City University Presently with Semiconductor Company Matsushita Electric Industrial Co. Ltd.
• 著者所属: Faculty of Information Sciences Hiroshima City University
• 著者所属(英): en
• 著者所属(英): Faculty of Information Sciences, Hiroshima City University
• 著者所属(英): en
• 著者所属(英): Graduate School of Information Sciences, Hiroshima City University,Presently with Koga Software Company
• 著者所属(英): en
• 著者所属(英): Graduate School of Information Sciences, Hiroshima City University,Presently with Semiconductor Company, Matsushita Electric Industrial Co., Ltd.
• 著者所属(英): en
• 著者所属(英): Faculty of Information Sciences, Hiroshima City University
• 著者名: Hideyuki, Ichihara; Masakuni, Ochi; Michihiro, Shintani; Tomoo, Inoue
• 著者名(英): Hideyuki, Ichihara; Masakuni, Ochi; Michihiro, Shintani; Tomoo, Inoue
• 論文抄録 / 内容記述タイプ: Other
• 論文抄録 / 内容記述: Test compression/decompression schemes using variable-length coding e.g. Huffman coding efficiently reduce the test application time and the size of the storage on an LSI tester. In this paper we propose a model of an adaptive decompressor for variable-length coding and discuss its property. By using a buffer the decompressor can operate at any input and output speed without a synchronizing feedback mechanism between an ATE and the decompressor i.e. the proposed decompressor model can adapt to any test environment. Moreover we propose a method for reducing the size of the buffer embedded in the decompressor. Since the buffer size depends on the order in which test vectors are input reordering test vectors can reduce the buffer size. The proposed algorithm is based on fluctuations in buffered data for each test vector. Experimental results show a case in which the ordering algorithm reduced the size of the buffer by 97%.
• 論文抄録(英) / 内容記述タイプ: Other
• 論文抄録(英) / 内容記述: Test compression/decompression schemes using variable-length coding, e.g., Huffman coding, efficiently reduce the test application time and the size of the storage on an LSI tester. In this paper, we propose a model of an adaptive decompressor for variable-length coding and discuss its property. By using a buffer, the decompressor can operate at any input and output speed without a synchronizing feedback mechanism between an ATE and the decompressor, i.e., the proposed decompressor model can adapt to any test environment. Moreover, we propose a method for reducing the size of the buffer embedded in the decompressor. Since the buffer size depends on the order in which test vectors are input, reordering test vectors can reduce the buffer size. The proposed algorithm is based on fluctuations in buffered data for each test vector. Experimental results show a case in which the ordering algorithm reduced the size of the buffer by 97%.
• 書誌レコードID / 収録物識別子タイプ: NCID
• 書誌レコードID / 収録物識別子: AN00116647
• 書誌情報: 情報処理学会論文誌; 巻 47, 号 6, p. 1639-1647, 発行日 2006-06-15
• ISSN / 収録物識別子タイプ: ISSN
• ISSN / 収録物識別子: 1882-7764