{"updated":"2025-01-23T02:56:27.733945+00:00","links":{},"created":"2025-01-18T22:45:12.851209+00:00","metadata":{"_oai":{"id":"oai:ipsj.ixsq.nii.ac.jp:00010252","sets":["581:612:619"]},"path":["619"],"owner":"1","recid":"10252","title":["An Adaptive Decompressor for Test Application with Variable-Length Coding"],"pubdate":{"attribute_name":"公開日","attribute_value":"2006-06-15"},"_buckets":{"deposit":"08028ce8-9b5e-4251-93ed-91a60159c6fa"},"_deposit":{"id":"10252","pid":{"type":"depid","value":"10252","revision_id":0},"owners":[1],"status":"published","created_by":1},"item_title":"An Adaptive Decompressor for Test Application with Variable-Length Coding","author_link":["0","0"],"item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"An Adaptive Decompressor for Test Application with Variable-Length Coding"},{"subitem_title":"An Adaptive Decompressor for Test Application with Variable-Length Coding","subitem_title_language":"en"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"特集：システムＬＳＩ設計とその技術","subitem_subject_scheme":"Other"}]},"item_type_id":"2","publish_date":"2006-06-15","item_2_text_3":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"Faculty of Information Sciences  Hiroshima City University"},{"subitem_text_value":"Graduate School of Information Sciences  Hiroshima City University Presently with Koga Software Company"},{"subitem_text_value":"Graduate School of Information Sciences  Hiroshima City University Presently with Semiconductor Company  Matsushita Electric Industrial Co.  Ltd."},{"subitem_text_value":"Faculty of Information Sciences  Hiroshima City University"}]},"item_2_text_4":{"attribute_name":"著者所属(英)","attribute_value_mlt":[{"subitem_text_value":"Faculty of Information Sciences, Hiroshima City University","subitem_text_language":"en"},{"subitem_text_value":"Graduate School of Information Sciences, Hiroshima City University,Presently with Koga Software Company","subitem_text_language":"en"},{"subitem_text_value":"Graduate School of Information Sciences, Hiroshima City University,Presently with Semiconductor Company, Matsushita Electric Industrial Co., Ltd.","subitem_text_language":"en"},{"subitem_text_value":"Faculty of Information Sciences, Hiroshima City University","subitem_text_language":"en"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"publish_status":"0","weko_shared_id":-1,"item_file_price":{"attribute_name":"Billing file","attribute_type":"file","attribute_value_mlt":[{"url":{"url":"https://ipsj.ixsq.nii.ac.jp/record/10252/files/IPSJ-JNL4706006.pdf"},"date":[{"dateType":"Available","dateValue":"2008-06-15"}],"format":"application/pdf","billing":["billing_file"],"filename":"IPSJ-JNL4706006.pdf","filesize":[{"value":"373.1 kB"}],"mimetype":"application/pdf","priceinfo":[{"tax":["include_tax"],"price":"660","billingrole":"5"},{"tax":["include_tax"],"price":"330","billingrole":"6"},{"tax":["include_tax"],"price":"0","billingrole":"8"},{"tax":["include_tax"],"price":"0","billingrole":"44"}],"accessrole":"open_date","version_id":"00527a21-18f5-4d28-b4bb-c2fbd39770f5","displaytype":"detail","licensetype":"license_note","license_note":"Copyright (c) 2006 by the Information Processing Society of Japan"}]},"item_2_creator_5":{"attribute_name":"著者名","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Hideyuki, Ichihara"},{"creatorName":"Masakuni, Ochi"},{"creatorName":"Michihiro, Shintani"},{"creatorName":"Tomoo, Inoue"}],"nameIdentifiers":[{}]}]},"item_2_creator_6":{"attribute_name":"著者名(英)","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Hideyuki, Ichihara","creatorNameLang":"en"},{"creatorName":"Masakuni, Ochi","creatorNameLang":"en"},{"creatorName":"Michihiro, Shintani","creatorNameLang":"en"},{"creatorName":"Tomoo, Inoue","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_2_source_id_9":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AN00116647","subitem_source_identifier_type":"NCID"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourceuri":"http://purl.org/coar/resource_type/c_6501","resourcetype":"journal article"}]},"item_2_source_id_11":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1882-7764","subitem_source_identifier_type":"ISSN"}]},"item_2_description_7":{"attribute_name":"論文抄録","attribute_value_mlt":[{"subitem_description":"Test compression/decompression schemes using variable-length coding  e.g.  Huffman coding  efficiently reduce the test application time and the size of the storage on an LSI tester. In this paper  we propose a model of an adaptive decompressor for variable-length coding and discuss its property. By using a buffer  the decompressor can operate at any input and output speed without a synchronizing feedback mechanism between an ATE and the decompressor  i.e.  the proposed decompressor model can adapt to any test environment. Moreover  we propose a method for reducing the size of the buffer embedded in the decompressor. Since the buffer size depends on the order in which test vectors are input  reordering test vectors can reduce the buffer size. The proposed algorithm is based on fluctuations in buffered data for each test vector. Experimental results show a case in which the ordering algorithm reduced the size of the buffer by 97%.","subitem_description_type":"Other"}]},"item_2_description_8":{"attribute_name":"論文抄録(英)","attribute_value_mlt":[{"subitem_description":"Test compression/decompression schemes using variable-length coding, e.g., Huffman coding, efficiently reduce the test application time and the size of the storage on an LSI tester. In this paper, we propose a model of an adaptive decompressor for variable-length coding and discuss its property. By using a buffer, the decompressor can operate at any input and output speed without a synchronizing feedback mechanism between an ATE and the decompressor, i.e., the proposed decompressor model can adapt to any test environment. Moreover, we propose a method for reducing the size of the buffer embedded in the decompressor. Since the buffer size depends on the order in which test vectors are input, reordering test vectors can reduce the buffer size. The proposed algorithm is based on fluctuations in buffered data for each test vector. Experimental results show a case in which the ordering algorithm reduced the size of the buffer by 97%.","subitem_description_type":"Other"}]},"item_2_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicPageEnd":"1647","bibliographic_titles":[{"bibliographic_title":"情報処理学会論文誌"}],"bibliographicPageStart":"1639","bibliographicIssueDates":{"bibliographicIssueDate":"2006-06-15","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"6","bibliographicVolumeNumber":"47"}]},"relation_version_is_last":true,"item_2_alternative_title_2":{"attribute_name":"その他タイトル","attribute_value_mlt":[{"subitem_alternative_title":"テスト容易化設計"}]},"weko_creator_id":"1"},"id":10252}