{"metadata":{"_oai":{"id":"oai:ipsj.ixsq.nii.ac.jp:00096105","sets":["1164:2036:6976:7313"]},"path":["7313"],"owner":"11","recid":"96105","title":["データマイニング手法によるバーンインテスト結果予測の検討"],"pubdate":{"attribute_name":"公開日","attribute_value":"2013-11-20"},"_buckets":{"deposit":"304efa02-d139-417f-984c-36ce0576da32"},"_deposit":{"id":"96105","pid":{"type":"depid","value":"96105","revision_id":0},"owners":[11],"status":"published","created_by":11},"item_title":"データマイニング手法によるバーンインテスト結果予測の検討","author_link":["0","0"],"item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"データマイニング手法によるバーンインテスト結果予測の検討"},{"subitem_title":"A Study of Burn-In Test Prediction by Data Mining","subitem_title_language":"en"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"テスト","subitem_subject_scheme":"Other"}]},"item_type_id":"4","publish_date":"2013-11-20","item_4_text_3":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"九州工業大学／独立行政法人科学技術振興機構CREST"},{"subitem_text_value":"九州工業大学／独立行政法人科学技術振興機構CREST"},{"subitem_text_value":"九州工業大学／独立行政法人科学技術振興機構CREST"},{"subitem_text_value":"ルネサスエレクトロニクス"}]},"item_4_text_4":{"attribute_name":"著者所属(英)","attribute_value_mlt":[{"subitem_text_value":"Kyushu Institute of Technology / Japan Science and Technology Agency, CREST","subitem_text_language":"en"},{"subitem_text_value":"Kyushu Institute of Technology / Japan Science and Technology Agency, CREST","subitem_text_language":"en"},{"subitem_text_value":"Kyushu Institute of Technology / Japan Science and Technology Agency, CREST","subitem_text_language":"en"},{"subitem_text_value":"Renesas Electronics Corporation","subitem_text_language":"en"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_publisher":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"情報処理学会","subitem_publisher_language":"ja"}]},"publish_status":"0","weko_shared_id":-1,"item_file_price":{"attribute_name":"Billing file","attribute_type":"file","attribute_value_mlt":[{"url":{"url":"https://ipsj.ixsq.nii.ac.jp/record/96105/files/IPSJ-SLDM13163040.pdf"},"date":[{"dateType":"Available","dateValue":"2100-01-01"}],"format":"application/pdf","billing":["billing_file"],"filename":"IPSJ-SLDM13163040.pdf","filesize":[{"value":"462.4 kB"}],"mimetype":"application/pdf","priceinfo":[{"tax":["include_tax"],"price":"0","billingrole":"10"},{"tax":["include_tax"],"price":"0","billingrole":"44"}],"accessrole":"open_date","version_id":"324f0571-1f6a-449c-8cc6-e793b594e4aa","displaytype":"detail","licensetype":"license_note","license_note":"Copyright (c) 2013 by the Institute of Electronics, Information and Communication Engineers\nThis SIG report is only available to those in membership of the SIG."}]},"item_4_creator_5":{"attribute_name":"著者名","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"野々山, 聡"},{"creatorName":"佐藤, 康夫"},{"creatorName":"梶原, 誠司"},{"creatorName":"中村, 芳行"}],"nameIdentifiers":[{}]}]},"item_4_creator_6":{"attribute_name":"著者名(英)","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Satoshi, Nonoyama","creatorNameLang":"en"},{"creatorName":"Yasuo, Sato","creatorNameLang":"en"},{"creatorName":"Seiji, Kajihara","creatorNameLang":"en"},{"creatorName":"Yoshiyuki, Nakamura","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_4_source_id_9":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA11451459","subitem_source_identifier_type":"NCID"}]},"item_4_textarea_12":{"attribute_name":"Notice","attribute_value_mlt":[{"subitem_textarea_value":"SIG Technical Reports are nonrefereed and hence may later appear in any journals, conferences, symposia, etc."}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourceuri":"http://purl.org/coar/resource_type/c_18gh","resourcetype":"technical report"}]},"item_4_description_7":{"attribute_name":"論文抄録","attribute_value_mlt":[{"subitem_description":"LSI の微細化と複雑化に伴い，製造テストのコスト削減が LSI の開発における切実な課題となってきている．本論文では，テストコスト低減のため，データマイニングの技術を用いてバーンインテストの結果をそれ以前のテスト結果データから予測する手法を検討する．バーンインテストは LSI 生産テストの中で特に高コストなため，テスト実施前にその結果を予測できれば，バーンインテストの省略によるテストコストの削減が期待される．また，データマイニングを用いた統計的な解析により，バーンインテストでは十分検出されない劣化等を予測することによるテスト品質の向上，および，予測結果をウェーハプロセスにフィードバックして製造改善することによる製造品質の向上も期待できる．","subitem_description_type":"Other"}]},"item_4_description_8":{"attribute_name":"論文抄録(英)","attribute_value_mlt":[{"subitem_description":"With the miniaturization and increased complexity of LSIs, the reduction of manufacturing test cost is becoming a crucial issue in LSI development. This paper describes a method to predict the outcome of a burn-in test from wafer test results for reducing test cost by a data mining technique. If the outcome of a burn-in test, whose cost is particularly high in LSI production tests, is predicted correctly, the cost of burn-in test will be reduced a lot. In addition, the outcome from the statistical analysis of the data mining technique will be able to improve test quality predicting aging-induced degradation, which cannot be detected by burn-in test, and will also improve the production quality by feeding back to wafer processes.","subitem_description_type":"Other"}]},"item_4_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicPageEnd":"6","bibliographic_titles":[{"bibliographic_title":"研究報告システムLSI設計技術（SLDM）"}],"bibliographicPageStart":"1","bibliographicIssueDates":{"bibliographicIssueDate":"2013-11-20","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"40","bibliographicVolumeNumber":"2013-SLDM-163"}]},"relation_version_is_last":true,"weko_creator_id":"11"},"updated":"2025-01-21T13:27:24.960719+00:00","created":"2025-01-18T23:43:03.126965+00:00","links":{},"id":96105}