{"id":96089,"updated":"2025-01-21T13:26:57.203948+00:00","links":{},"created":"2025-01-18T23:43:02.328088+00:00","metadata":{"_oai":{"id":"oai:ipsj.ixsq.nii.ac.jp:00096089","sets":["1164:2036:6976:7313"]},"path":["7313"],"owner":"11","recid":"96089","title":["信頼性と時間オーバーヘッド間のトレードオフを考慮した面積制約にもとづくRDRアーキテクチャ向けフォールトセキュア高位合成手法"],"pubdate":{"attribute_name":"公開日","attribute_value":"2013-11-20"},"_buckets":{"deposit":"ad377367-cecb-42f9-b33f-cab3e8e8f9d3"},"_deposit":{"id":"96089","pid":{"type":"depid","value":"96089","revision_id":0},"owners":[11],"status":"published","created_by":11},"item_title":"信頼性と時間オーバーヘッド間のトレードオフを考慮した面積制約にもとづくRDRアーキテクチャ向けフォールトセキュア高位合成手法","author_link":["0","0"],"item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"信頼性と時間オーバーヘッド間のトレードオフを考慮した面積制約にもとづくRDRアーキテクチャ向けフォールトセキュア高位合成手法"},{"subitem_title":"An Area Constraint-Based Fault-Secure HLS Algorithm for RDR Architectures Considering Trade-Off between Reliability and Time Overhead","subitem_title_language":"en"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"システム設計","subitem_subject_scheme":"Other"}]},"item_type_id":"4","publish_date":"2013-11-20","item_4_text_3":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"早稲田大学大学院基幹理工学研究科"},{"subitem_text_value":"早稲田大学大学院基幹理工学研究科"},{"subitem_text_value":"早稲田大学大学院基幹理工学研究科"}]},"item_4_text_4":{"attribute_name":"著者所属(英)","attribute_value_mlt":[{"subitem_text_value":"Grad. of Fundamental Science and Engineering, Waseda University","subitem_text_language":"en"},{"subitem_text_value":"Grad. of Fundamental Science and Engineering, Waseda University","subitem_text_language":"en"},{"subitem_text_value":"Grad. of Fundamental Science and Engineering, Waseda University","subitem_text_language":"en"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_publisher":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"情報処理学会","subitem_publisher_language":"ja"}]},"publish_status":"0","weko_shared_id":-1,"item_file_price":{"attribute_name":"Billing file","attribute_type":"file","attribute_value_mlt":[{"url":{"url":"https://ipsj.ixsq.nii.ac.jp/record/96089/files/IPSJ-SLDM13163024.pdf"},"date":[{"dateType":"Available","dateValue":"2100-01-01"}],"format":"application/pdf","billing":["billing_file"],"filename":"IPSJ-SLDM13163024.pdf","filesize":[{"value":"424.1 kB"}],"mimetype":"application/pdf","priceinfo":[{"tax":["include_tax"],"price":"0","billingrole":"10"},{"tax":["include_tax"],"price":"0","billingrole":"44"}],"accessrole":"open_date","version_id":"5870ea62-4502-4efb-a744-f17a6eaeb42b","displaytype":"detail","licensetype":"license_note","license_note":"Copyright (c) 2013 by the Institute of Electronics, Information and Communication Engineers\nThis SIG report is only available to those in membership of the SIG."}]},"item_4_creator_5":{"attribute_name":"著者名","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"川村, 一志"},{"creatorName":"柳澤, 政生"},{"creatorName":"戸川, 望"}],"nameIdentifiers":[{}]}]},"item_4_creator_6":{"attribute_name":"著者名(英)","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Kazushi, Kawamura","creatorNameLang":"en"},{"creatorName":"Masao, Yanagisawa","creatorNameLang":"en"},{"creatorName":"Nozomu, Togawa","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_4_source_id_9":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA11451459","subitem_source_identifier_type":"NCID"}]},"item_4_textarea_12":{"attribute_name":"Notice","attribute_value_mlt":[{"subitem_textarea_value":"SIG Technical Reports are nonrefereed and hence may later appear in any journals, conferences, symposia, etc."}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourceuri":"http://purl.org/coar/resource_type/c_18gh","resourcetype":"technical report"}]},"item_4_description_7":{"attribute_name":"論文抄録","attribute_value_mlt":[{"subitem_description":"半導体の微細化技術の進展に伴い，ソフトエラーに起因する信頼性の低下，及び配線遅延の相対的増大が問題となっている．信頼'性の低下を克服する手法のひとつに並行誤り検出を用いたフォールトセキュア設計手法があり，演算処理の部分的な二重化を考えることで信頼,性とオーバーヘッドのトレードオフを考慮した設計が可能となる．本稿では，小さいオーバーヘッドで大きな信頼性向上が得られるよう高位合成段階での適用を前提とし，設計手法を提案する．提案手法のポイントは三点あり，第一に RDR アーキテクチャを対象とすることで高位合成段階で配線遅延を考慮できるようにする．第二に面積制約を通常計算用に用意した RDR アーキテクチャとすることで面積オーバーヘッドなくフォールトセキュア設計を実現する．第三に与えられた時間制約のもとで信頼性の最大化を目指す．提案手法を計算機上に実装し，従来手法と比較した結果，時間及び面積オーバーヘッドなく最大 44％の信頼性向上を達成した．さらに，面積オーバーヘッドの増大を許容しなくとも 50％程度の時間オーバーヘッドを許容することで演算処理の完全な二重化が実現可能であることを示した．","subitem_description_type":"Other"}]},"item_4_description_8":{"attribute_name":"論文抄録(英)","attribute_value_mlt":[{"subitem_description":"With process technology scaling, decreasing reliability caused by soft errors as well as increasing the average interconnection delays are becoming serious issues. The fault-secure design technique which utilizes concurrent error detection is one of the approaches to overcome reliability degradation, and we can design systems based on trade-off between reliability and several kinds of overhead by giving a partial redundancy to operations. In this paper, we propose a partial redundant fault-secure high-level synthesis algorithm for RDR architectures. Our proposed algorithm receives a fixed area constraint and various time constrains as inputs, and aims at maximizing reliability under them. Experimental results demonstrate that our algorithm improves reliability by up to 44% with zero time and area overhead compared with the conventional approach. They also show that we can realize complete duplication of operations with zero area overhead and about 50% time overhead.","subitem_description_type":"Other"}]},"item_4_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicPageEnd":"6","bibliographic_titles":[{"bibliographic_title":"研究報告システムLSI設計技術（SLDM）"}],"bibliographicPageStart":"1","bibliographicIssueDates":{"bibliographicIssueDate":"2013-11-20","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"24","bibliographicVolumeNumber":"2013-SLDM-163"}]},"relation_version_is_last":true,"weko_creator_id":"11"}}