{"id":91651,"created":"2025-01-18T23:40:51.652629+00:00","metadata":{"_oai":{"id":"oai:ipsj.ixsq.nii.ac.jp:00091651","sets":["1164:1579:7041:7150"]},"path":["7150"],"owner":"11","recid":"91651","title":["SIMD命令セットを用いた浮動小数点演算における精度低下検出"],"pubdate":{"attribute_name":"公開日","attribute_value":"2013-04-18"},"_buckets":{"deposit":"ee3afdd2-0643-4782-ba9d-b5cda86f1ed9"},"_deposit":{"id":"91651","pid":{"type":"depid","value":"91651","revision_id":0},"owners":[11],"status":"published","created_by":11},"item_title":"SIMD命令セットを用いた浮動小数点演算における精度低下検出","author_link":["0"],"item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"SIMD命令セットを用いた浮動小数点演算における精度低下検出"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"アーキテクチャ設計および評価","subitem_subject_scheme":"Other"}]},"item_type_id":"4","publish_date":"2013-04-18","item_4_text_3":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"広島市立大学"},{"subitem_text_value":"Fujitsu Laboratories of America, Inc."},{"subitem_text_value":"Fujitsu Laboratories of America, Inc."},{"subitem_text_value":"広島市立大学"}]},"item_4_text_4":{"attribute_name":"著者所属(英)","attribute_value_mlt":[{"subitem_text_value":"Hiroshima City University","subitem_text_language":"en"},{"subitem_text_value":"Fujitsu Laboratories of America, Inc.","subitem_text_language":"en"},{"subitem_text_value":"Fujitsu Laboratories of America, Inc.","subitem_text_language":"en"},{"subitem_text_value":"Hiroshima City University","subitem_text_language":"en"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_publisher":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"情報処理学会","subitem_publisher_language":"ja"}]},"publish_status":"0","weko_shared_id":-1,"item_file_price":{"attribute_name":"Billing file","attribute_type":"file","attribute_value_mlt":[{"url":{"url":"https://ipsj.ixsq.nii.ac.jp/record/91651/files/IPSJ-ARC13205014.pdf"},"date":[{"dateType":"Available","dateValue":"2015-04-18"}],"format":"application/pdf","billing":["billing_file"],"filename":"IPSJ-ARC13205014.pdf","filesize":[{"value":"675.0 kB"}],"mimetype":"application/pdf","priceinfo":[{"tax":["include_tax"],"price":"660","billingrole":"5"},{"tax":["include_tax"],"price":"330","billingrole":"6"},{"tax":["include_tax"],"price":"0","billingrole":"16"},{"tax":["include_tax"],"price":"0","billingrole":"44"}],"accessrole":"open_date","version_id":"af6eb834-884d-43c5-abf0-6ae71e30dfcd","displaytype":"detail","licensetype":"license_note","license_note":"Copyright (c) 2013 by the Information Processing Society of Japan"}]},"item_4_creator_5":{"attribute_name":"著者名","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"安仁屋宗石"},{"creatorName":"吉田浩章"},{"creatorName":"伴野充"},{"creatorName":"北村俊明"}],"nameIdentifiers":[{}]}]},"item_4_source_id_9":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AN10096105","subitem_source_identifier_type":"NCID"}]},"item_4_textarea_12":{"attribute_name":"Notice","attribute_value_mlt":[{"subitem_textarea_value":"SIG Technical Reports are nonrefereed and hence may later appear in any journals, conferences, symposia, etc."}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourceuri":"http://purl.org/coar/resource_type/c_18gh","resourcetype":"technical report"}]},"item_4_description_7":{"attribute_name":"論文抄録","attribute_value_mlt":[{"subitem_description":"計算機の数値計算に用いられる浮動小数点演算では，桁落ち，情報落ち，丸めの影響により精度低下を引き起こす場合がある．現在，数値計算の浮動小数点演算規格として広く用いられる IEEE754 は，桁落ち，情報落ちに対する例外の定義が無いため，演算結果の信頼性保証が不十分である．そこで本研究は，効率の良い精度低下検出を行うために，SIMD 命令セットを用いた精度低下検出手法を提案し，ソースコードを書き換えずに精度低下検出を行うシステムを，コンパイラインフラストラクチャである LLVM を用いて，精度低下検出コードをコンパイル時に組み込むことで実現した．その結果，SIMD 命令セットを用いた精度低下検出手法では，関連研究と比較して，精度低下検出を 24 倍高速化した．","subitem_description_type":"Other"}]},"item_4_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicPageEnd":"7","bibliographic_titles":[{"bibliographic_title":"研究報告計算機アーキテクチャ（ARC）"}],"bibliographicPageStart":"1","bibliographicIssueDates":{"bibliographicIssueDate":"2013-04-18","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"14","bibliographicVolumeNumber":"2013-ARC-205"}]},"relation_version_is_last":true,"weko_creator_id":"11"},"updated":"2025-01-21T15:23:35.712344+00:00","links":{}}