{"updated":"2025-01-21T15:53:01.721309+00:00","metadata":{"_oai":{"id":"oai:ipsj.ixsq.nii.ac.jp:00090666","sets":["1164:2822:7101:7102"]},"path":["7102"],"owner":"11","recid":"90666","title":["テスト視点からのレビューアの欠陥発見の容易性向上の試み"],"pubdate":{"attribute_name":"公開日","attribute_value":"2013-03-06"},"_buckets":{"deposit":"248f8167-3ff4-4f6c-834f-c09e4bb9c24f"},"_deposit":{"id":"90666","pid":{"type":"depid","value":"90666","revision_id":0},"owners":[11],"status":"published","created_by":11},"item_title":"テスト視点からのレビューアの欠陥発見の容易性向上の試み","author_link":["0","0"],"item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"テスト視点からのレビューアの欠陥発見の容易性向上の試み"},{"subitem_title":"Trial of the Easiness improvement for Reviewer Detecting Defect by Viewpoint of Test","subitem_title_language":"en"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"組込みソフトウェア開発","subitem_subject_scheme":"Other"}]},"item_type_id":"4","publish_date":"2013-03-06","item_4_text_3":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"日本電気通信システム(株)"},{"subitem_text_value":"日本電気通信システム(株)"},{"subitem_text_value":"日本電気通信システム(株)"}]},"item_4_text_4":{"attribute_name":"著者所属(英)","attribute_value_mlt":[{"subitem_text_value":"NEC Communication Systems, Ltd.","subitem_text_language":"en"},{"subitem_text_value":"NEC Communication Systems, Ltd.","subitem_text_language":"en"},{"subitem_text_value":"NEC Communication Systems, Ltd.","subitem_text_language":"en"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_publisher":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"情報処理学会","subitem_publisher_language":"ja"}]},"publish_status":"0","weko_shared_id":-1,"item_file_price":{"attribute_name":"Billing file","attribute_type":"file","attribute_value_mlt":[{"url":{"url":"https://ipsj.ixsq.nii.ac.jp/record/90666/files/IPSJ-EMB13028012.pdf"},"date":[{"dateType":"Available","dateValue":"2015-03-06"}],"format":"application/pdf","billing":["billing_file"],"filename":"IPSJ-EMB13028012.pdf","filesize":[{"value":"1.0 MB"}],"mimetype":"application/pdf","priceinfo":[{"tax":["include_tax"],"price":"660","billingrole":"5"},{"tax":["include_tax"],"price":"330","billingrole":"6"},{"tax":["include_tax"],"price":"0","billingrole":"42"},{"tax":["include_tax"],"price":"0","billingrole":"44"}],"accessrole":"open_date","version_id":"08c44b93-3096-4c03-afa9-23ef92370125","displaytype":"detail","licensetype":"license_note","license_note":"Copyright (c) 2013 by the Information Processing Society of Japan"}]},"item_4_creator_5":{"attribute_name":"著者名","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"羽田, 裕"},{"creatorName":"石山, 康介"},{"creatorName":"青木, 教之"}],"nameIdentifiers":[{}]}]},"item_4_creator_6":{"attribute_name":"著者名(英)","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Yutaka, Hada","creatorNameLang":"en"},{"creatorName":"Yasuyuki, Ishiyama","creatorNameLang":"en"},{"creatorName":"Noriyuki, Aoki","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_4_source_id_9":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA12149313","subitem_source_identifier_type":"NCID"}]},"item_4_textarea_12":{"attribute_name":"Notice","attribute_value_mlt":[{"subitem_textarea_value":"SIG Technical Reports are nonrefereed and hence may later appear in any journals, conferences, symposia, etc."}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourceuri":"http://purl.org/coar/resource_type/c_18gh","resourcetype":"technical report"}]},"item_4_description_7":{"attribute_name":"論文抄録","attribute_value_mlt":[{"subitem_description":"上流工程での設計レビューと下流工程におけるテストは，ソフトウェア開発にかかわる代表的な検知活動である．筆者らは，設計レビューの品質向上のため，暗黙知だったものを，テスト観点ツリーという形式知にして設計レビューに適用した．これによって従来であれば流出したであろう欠陥を設計レビューで検出することができた．また，幾つかの開発プロジェクトで繰り返し適用することで，開発チームメンバの教育効果が認められた．","subitem_description_type":"Other"}]},"item_4_description_8":{"attribute_name":"論文抄録(英)","attribute_value_mlt":[{"subitem_description":"Design Review in the upper process and Test in the lower process are typical detective activity about software development. To improve the quality of Design Review, we changed tacit knowledge into explicit knowledge as Test point of view tree. In this way, we detected undetectable defects before in Design Review. In addition, we used it for some projects repeatedly and confirmed the education effect on development team.","subitem_description_type":"Other"}]},"item_4_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicPageEnd":"6","bibliographic_titles":[{"bibliographic_title":"研究報告組込みシステム（EMB）"}],"bibliographicPageStart":"1","bibliographicIssueDates":{"bibliographicIssueDate":"2013-03-06","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"12","bibliographicVolumeNumber":"2013-EMB-28"}]},"relation_version_is_last":true,"weko_creator_id":"11"},"created":"2025-01-18T23:40:10.098531+00:00","id":90666,"links":{}}