{"updated":"2025-01-21T15:58:42.454905+00:00","metadata":{"_oai":{"id":"oai:ipsj.ixsq.nii.ac.jp:00090484","sets":["1164:1384:7092:7093"]},"path":["7093"],"owner":"11","recid":"90484","title":["シーケンス制御プログラムのテストに適した新しいカバレッジ基準の提案"],"pubdate":{"attribute_name":"公開日","attribute_value":"2013-03-04"},"_buckets":{"deposit":"ff14b455-e597-493f-a5eb-b844e23af856"},"_deposit":{"id":"90484","pid":{"type":"depid","value":"90484","revision_id":0},"owners":[11],"status":"published","created_by":11},"item_title":"シーケンス制御プログラムのテストに適した新しいカバレッジ基準の提案","author_link":["0","0"],"item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"シーケンス制御プログラムのテストに適した新しいカバレッジ基準の提案"},{"subitem_title":"MTC: A New Test Coverage Criterion for Sequence Control Programs","subitem_title_language":"en"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"テスト","subitem_subject_scheme":"Other"}]},"item_type_id":"4","publish_date":"2013-03-04","item_4_text_3":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"(株)東芝研究開発センターシステム技術ラボラトリー"},{"subitem_text_value":"(株)東芝研究開発センターシステム技術ラボラトリー"},{"subitem_text_value":"(株)東芝研究開発センターシステム技術ラボラトリー"}]},"item_4_text_4":{"attribute_name":"著者所属(英)","attribute_value_mlt":[{"subitem_text_value":"Toshiba Corporation Corporate Research & Development Center","subitem_text_language":"en"},{"subitem_text_value":"Toshiba Corporation Corporate Research & Development Center","subitem_text_language":"en"},{"subitem_text_value":"Toshiba Corporation Corporate Research & Development Center","subitem_text_language":"en"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_publisher":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"情報処理学会","subitem_publisher_language":"ja"}]},"publish_status":"0","weko_shared_id":-1,"item_file_price":{"attribute_name":"Billing file","attribute_type":"file","attribute_value_mlt":[{"url":{"url":"https://ipsj.ixsq.nii.ac.jp/record/90484/files/IPSJ-SE13179017.pdf"},"date":[{"dateType":"Available","dateValue":"2015-03-04"}],"format":"application/pdf","billing":["billing_file"],"filename":"IPSJ-SE13179017.pdf","filesize":[{"value":"600.3 kB"}],"mimetype":"application/pdf","priceinfo":[{"tax":["include_tax"],"price":"660","billingrole":"5"},{"tax":["include_tax"],"price":"330","billingrole":"6"},{"tax":["include_tax"],"price":"0","billingrole":"12"},{"tax":["include_tax"],"price":"0","billingrole":"44"}],"accessrole":"open_date","version_id":"e4d33409-21bb-4997-a34e-78fd263a4faa","displaytype":"detail","licensetype":"license_note","license_note":"Copyright (c) 2013 by the Information Processing Society of Japan"}]},"item_4_creator_5":{"attribute_name":"著者名","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"丸地, 康平"},{"creatorName":"酒井, 政裕"},{"creatorName":"進, 博正"}],"nameIdentifiers":[{}]}]},"item_4_creator_6":{"attribute_name":"著者名(英)","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Kohei, Maruchi","creatorNameLang":"en"},{"creatorName":"Masahiro, Sakai","creatorNameLang":"en"},{"creatorName":"Hiromasa, Shin","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_4_source_id_9":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AN10112981","subitem_source_identifier_type":"NCID"}]},"item_4_textarea_12":{"attribute_name":"Notice","attribute_value_mlt":[{"subitem_textarea_value":"SIG Technical Reports are nonrefereed and hence may later appear in any journals, conferences, symposia, etc."}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourceuri":"http://purl.org/coar/resource_type/c_18gh","resourcetype":"technical report"}]},"item_4_description_7":{"attribute_name":"論文抄録","attribute_value_mlt":[{"subitem_description":"本論文では，シーケンス制御プラグラミング言語に適した新しいカバレッジ基準 MTC を提案する．MTC は，必要となるテストケース数を抑えつつ，効果的なテストを実現するためのカバレッジ基準であり，論理回路におけるトグル網羅とソフトウェアにおける MC/DC 網羅の両性質を併せ持つことを特徴とする．ミューテーションテストによる評価実験により，MTC の有効性を確認した．","subitem_description_type":"Other"}]},"item_4_description_8":{"attribute_name":"論文抄録(英)","attribute_value_mlt":[{"subitem_description":"In this paper, we propose new coverage criterion called MTC, which is suited to testing for sequence control programs. MTC combines two popular coverage criteria, namely toggle coverage commonly used for digital circuits, and modified condition/decision coverage (MC/DC) commonly used for safety-critical software, to achieve effective testing while keeping the number of necessary test cases relatively small. We have evaluated the effectiveness of MTC by using mutation testing method.","subitem_description_type":"Other"}]},"item_4_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicPageEnd":"8","bibliographic_titles":[{"bibliographic_title":"研究報告ソフトウェア工学（SE）"}],"bibliographicPageStart":"1","bibliographicIssueDates":{"bibliographicIssueDate":"2013-03-04","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"17","bibliographicVolumeNumber":"2013-SE-179"}]},"relation_version_is_last":true,"weko_creator_id":"11"},"created":"2025-01-18T23:40:03.385043+00:00","id":90484,"links":{}}