{"created":"2025-01-18T23:37:27.361616+00:00","metadata":{"_oai":{"id":"oai:ipsj.ixsq.nii.ac.jp:00086007","sets":["6164:6165:6561:6893"]},"path":["6893"],"owner":"11","recid":"86007","title":["組込みシステムにおける並列型状態遷移図に基づく安全分析手法"],"pubdate":{"attribute_name":"公開日","attribute_value":"2012-10-10"},"_buckets":{"deposit":"c2d61ce1-4b9e-43a0-a66d-cd992a8b1ed8"},"_deposit":{"id":"86007","pid":{"type":"depid","value":"86007","revision_id":0},"owners":[11],"status":"published","created_by":11},"item_title":"組込みシステムにおける並列型状態遷移図に基づく安全分析手法","author_link":["0","0"],"item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"組込みシステムにおける並列型状態遷移図に基づく安全分析手法"},{"subitem_title":"Safety analysis method based on parallel state transition diagram for embedded systems","subitem_title_language":"en"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"信頼性・ディペンダビリティ","subitem_subject_scheme":"Other"}]},"item_type_id":"18","publish_date":"2012-10-10","item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_18_text_3":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"名古屋大学大学院情報科学研究科"},{"subitem_text_value":"名古屋大学大学院情報科学研究科"},{"subitem_text_value":"名古屋大学大学院情報科学研究科"}]},"item_18_text_4":{"attribute_name":"著者所属(英)","attribute_value_mlt":[{"subitem_text_value":"Graduate School of Information Science, Nagoya University","subitem_text_language":"en"},{"subitem_text_value":"Graduate School of Information Science, Nagoya University","subitem_text_language":"en"},{"subitem_text_value":"Graduate School of Information Science, Nagoya University","subitem_text_language":"en"}]},"item_publisher":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"情報処理学会","subitem_publisher_language":"ja"}]},"publish_status":"0","weko_shared_id":-1,"item_file_price":{"attribute_name":"Billing file","attribute_type":"file","attribute_value_mlt":[{"url":{"url":"https://ipsj.ixsq.nii.ac.jp/record/86007/files/IPSJ-ESS2012010.pdf"},"date":[{"dateType":"Available","dateValue":"2014-10-10"}],"format":"application/pdf","billing":["billing_file"],"filename":"IPSJ-ESS2012010.pdf","filesize":[{"value":"757.5 kB"}],"mimetype":"application/pdf","priceinfo":[{"tax":["include_tax"],"price":"660","billingrole":"5"},{"tax":["include_tax"],"price":"330","billingrole":"6"},{"tax":["include_tax"],"price":"330","billingrole":"42"},{"tax":["include_tax"],"price":"0","billingrole":"44"}],"accessrole":"open_date","version_id":"53a761b4-53f7-4584-a60f-0cf949698d95","displaytype":"detail","licensetype":"license_note","license_note":"Copyright (c) 2012 by the Information Processing Society of Japan"}]},"item_18_creator_5":{"attribute_name":"著者名","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"金, 周慧"},{"creatorName":"松原, 豊"},{"creatorName":"高田, 広章"}],"nameIdentifiers":[{}]}]},"item_18_creator_6":{"attribute_name":"著者名(英)","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Zoohaye, Kim","creatorNameLang":"en"},{"creatorName":"Yutaka, Matsubara","creatorNameLang":"en"},{"creatorName":"Hiroaki, Takada","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourceuri":"http://purl.org/coar/resource_type/c_5794","resourcetype":"conference paper"}]},"item_18_description_7":{"attribute_name":"論文抄録","attribute_value_mlt":[{"subitem_description":"組込みシステムにおける故障の影響を，より網羅的に分析するため，我々は，状態遷移図を対象とした安全分析手法を提案している．本論文では，直交する複数の状態遷移図 （並列型状態遷移図） で表現されるシステムを対象とした安全分析手法 SAPSTD （Safety Analysis method based on Parallel State Transition Diagrams） を提案する．提案手法を用いることで，直交する状態遷移図のうち，一部の状態遷移図における逸脱を分析すれば，他の状態遷移図の状態に関係なく故障の深刻度が定まる場合に，分析数を減らすことができる．小規模な組込みシステムを対象に提案手法を適用し，提案手法の有効性を明らかにする．","subitem_description_type":"Other"}]},"item_18_description_8":{"attribute_name":"論文抄録(英)","attribute_value_mlt":[{"subitem_description":"In order to analyze effects of failures exhaustively in safety critical embedded systems, we have studied safety analysis methods based on state transition diagrams. However, guide-words and an analytical sheet used in these methods are not suitable for analyzing parallel state transition diagrams, which represent the behavior of a system whose functions work in parallel. In the case that the severity of a deviation on a state transition diagram can be determined regardless of the other state transition diagrams, the total number of deviations to be analyzed would be reduced by using the proposed method. To clarify the effectiveness of the proposed method, we applied a conventional method and SAPSTD for analysis of specifications of a sample embedded system and compared the results of them.","subitem_description_type":"Other"}]},"item_18_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicPageEnd":"62","bibliographic_titles":[{"bibliographic_title":"組込みシステムシンポジウム2012論文集"}],"bibliographicPageStart":"57","bibliographicIssueDates":{"bibliographicIssueDate":"2012-10-10","bibliographicIssueDateType":"Issued"},"bibliographicVolumeNumber":"2012"}]},"relation_version_is_last":true,"weko_creator_id":"11"},"id":86007,"updated":"2025-01-21T17:53:10.895213+00:00","links":{}}