{"created":"2025-01-18T23:32:41.586367+00:00","updated":"2025-01-21T21:07:52.824998+00:00","metadata":{"_oai":{"id":"oai:ipsj.ixsq.nii.ac.jp:00075632","sets":["1164:2036:6262:6494"]},"path":["6494"],"owner":"10","recid":"75632","title":["混合正規分布による重点的サンプリングの高次元ばらつき解析への適用"],"pubdate":{"attribute_name":"公開日","attribute_value":"2011-03-11"},"_buckets":{"deposit":"5ab76def-20a0-4a02-ac3a-07f85c9b7858"},"_deposit":{"id":"75632","pid":{"type":"depid","value":"75632","revision_id":0},"owners":[10],"status":"published","created_by":10},"item_title":"混合正規分布による重点的サンプリングの高次元ばらつき解析への適用","author_link":["0","0"],"item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"混合正規分布による重点的サンプリングの高次元ばらつき解析への適用"},{"subitem_title":"Application of Importance Sampling using Contaminated Normal Distribution to Multidimensional Variation Analysis","subitem_title_language":"en"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"シミュレーション技術","subitem_subject_scheme":"Other"}]},"item_type_id":"4","publish_date":"2011-03-11","item_4_text_3":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"東京工業大学統合研究院／日本学術振興会特別研究員"},{"subitem_text_value":"東京工業大学統合研究院"},{"subitem_text_value":"京都大学大学院情報学研究科／日本学術振興会特別研究員"},{"subitem_text_value":"東京工業大学統合研究院"},{"subitem_text_value":"京都大学大学院情報学研究科"}]},"item_4_text_4":{"attribute_name":"著者所属(英)","attribute_value_mlt":[{"subitem_text_value":"Integrated Research Institute, Tokyo Institute of Technology / DC Research Fellow of the Japan Society for the Promotion of Science","subitem_text_language":"en"},{"subitem_text_value":"Integrated Research Institute, Tokyo Institute of Technology","subitem_text_language":"en"},{"subitem_text_value":"Graduate School of Informatics Kyoto University / PD Research Fellow of the Japan Society for the Promotion of Science","subitem_text_language":"en"},{"subitem_text_value":"Integrated Research Institute, Tokyo Institute of Technology","subitem_text_language":"en"},{"subitem_text_value":"Graduate School of Informatics Kyoto University","subitem_text_language":"en"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_publisher":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"情報処理学会","subitem_publisher_language":"ja"}]},"publish_status":"0","weko_shared_id":-1,"item_file_price":{"attribute_name":"Billing file","attribute_type":"file","attribute_value_mlt":[{"url":{"url":"https://ipsj.ixsq.nii.ac.jp/record/75632/files/IPSJ-SLDM11149025.pdf"},"date":[{"dateType":"Available","dateValue":"2013-03-11"}],"format":"application/pdf","billing":["billing_file"],"filename":"IPSJ-SLDM11149025.pdf","filesize":[{"value":"640.0 kB"}],"mimetype":"application/pdf","priceinfo":[{"tax":["include_tax"],"price":"660","billingrole":"5"},{"tax":["include_tax"],"price":"330","billingrole":"6"},{"tax":["include_tax"],"price":"0","billingrole":"10"},{"tax":["include_tax"],"price":"0","billingrole":"44"}],"accessrole":"open_date","version_id":"0d721acd-cc0c-478a-b5fc-17e50f68a070","displaytype":"detail","licensetype":"license_note","license_note":"Copyright (c) 2011 by the Information Processing Society of Japan"}]},"item_4_creator_5":{"attribute_name":"著者名","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"萩原, 汐"},{"creatorName":"伊達, 貴徳"},{"creatorName":"上薗, 巧"},{"creatorName":"益, 一哉"},{"creatorName":"佐藤, 高史"}],"nameIdentifiers":[{}]}]},"item_4_creator_6":{"attribute_name":"著者名(英)","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Shiho, Hagiwara","creatorNameLang":"en"},{"creatorName":"Takanori, Date","creatorNameLang":"en"},{"creatorName":"Takumi, Uezono","creatorNameLang":"en"},{"creatorName":"Kazuya, Masu","creatorNameLang":"en"},{"creatorName":"Takashi, Sato","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_4_source_id_9":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA11451459","subitem_source_identifier_type":"NCID"}]},"item_4_textarea_12":{"attribute_name":"Notice","attribute_value_mlt":[{"subitem_textarea_value":"SIG Technical Reports are nonrefereed and hence may later appear in any journals, conferences, symposia, etc."}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourceuri":"http://purl.org/coar/resource_type/c_18gh","resourcetype":"technical report"}]},"item_4_description_7":{"attribute_name":"論文抄録","attribute_value_mlt":[{"subitem_description":"微細化に伴う製造ばらつきの相対的増大による歩留まり低下を防止するため，設計時に歩留まりを見積もる手法が必要とされている．見積もり手法の 1 つに MonteCarlo 法があるが，生起確率の低い事象に対して収束が遅いという課題がある．この収束を速める方法として重点的サンプリングがあるが，サンプリングに用いる確率密度関数 g(x) を適切に選択しないと効果が得られない．そこで本稿では，g(x) として混合正規分布を使う場合に，g(x) を決定する手法を提案する．提案手法ではクラスタリングにより g(x) を構成する正規分布の数を決め，二分法により不良領域境界を探索し，各々の正規分布の平均値を決める．提案手法により求めた確率密度分布 g(x) は良品/不良品領域の境界付近で多くのサンプルを得ることができるので，効率的に不良率を見積ることができる．また，6-24 次元における SRAM セルの不良率を提案手法により算定し，従来の Monte Carlo 法と比較し計算時間を 2 桁から 5 桁削減できることを確認した．","subitem_description_type":"Other"}]},"item_4_description_8":{"attribute_name":"論文抄録(英)","attribute_value_mlt":[{"subitem_description":"Process variation by miniaturization has been inducing yield degradation. Design-time yield estimation is required. Monte Carlo method, which is one of the effective yield estimation methods, has a problem that its convergence becomes slower when analyzing a low probability event. Although importance sampling can overcome this problem, it is valid only when the alternative probability density function, g(x), is appropriate. This paper proposes a procedure to determine appropriate g(x) when g(x) is a mixture gaussian distribution. In the proposed procedure, clustering result determines the number of normal distributions constructing g(x) and mean of each gaussian is determined through bisection method. g(x) determined by the proposed procedure can sample near the boundary of failure region and this accelerates yield estimation by importance sampling. SRAM yield estimations of 6 to 24 dimensions are also conducted as examples. The number of Monte Carlo trials has been reduced by 2-5 orders compared to a crude Monte Carlo simulation.","subitem_description_type":"Other"}]},"item_4_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicPageEnd":"6","bibliographic_titles":[{"bibliographic_title":"研究報告システムLSI設計技術（SLDM）"}],"bibliographicPageStart":"1","bibliographicIssueDates":{"bibliographicIssueDate":"2011-03-11","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"25","bibliographicVolumeNumber":"2011-SLDM-149"}]},"relation_version_is_last":true,"weko_creator_id":"10"},"id":75632,"links":{}}