{"links":{},"metadata":{"_oai":{"id":"oai:ipsj.ixsq.nii.ac.jp:00069331","sets":["1164:2036:5978:6097"]},"path":["6097"],"owner":"10","recid":"69331","title":["充足可能性判定に基づくシステムレベルデバッグ支援手法におけるバグモデルの導入による効率化"],"pubdate":{"attribute_name":"公開日","attribute_value":"2010-05-12"},"_buckets":{"deposit":"581683da-8785-4f91-9465-40b936adad6f"},"_deposit":{"id":"69331","pid":{"type":"depid","value":"69331","revision_id":0},"owners":[10],"status":"published","created_by":10},"item_title":"充足可能性判定に基づくシステムレベルデバッグ支援手法におけるバグモデルの導入による効率化","author_link":["0","0"],"item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"充足可能性判定に基づくシステムレベルデバッグ支援手法におけるバグモデルの導入による効率化"},{"subitem_title":"Improving the Efficiency of System-Level Debug Support based on Satisfiability Problem by Introduing Bug Models","subitem_title_language":"en"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"システム設計と最適化","subitem_subject_scheme":"Other"}]},"item_type_id":"4","publish_date":"2010-05-12","item_4_text_3":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"東京大学大学院工学系研究科電気系工学専攻"},{"subitem_text_value":"東京大学大学院工学系研究科電子工学専攻"},{"subitem_text_value":"東京大学大規模集積システム設計教育研究センター"},{"subitem_text_value":"東京大学大規模集積システム設計教育研究センター／科学技術振興機構戦略的創造研究推進事業"}]},"item_4_text_4":{"attribute_name":"著者所属(英)","attribute_value_mlt":[{"subitem_text_value":"Dept. of Electrical Engineering and Information Systems, The University of Tokyo","subitem_text_language":"en"},{"subitem_text_value":"Dept. of Electronics Engineering and Information Systems, The University of Tokyo","subitem_text_language":"en"},{"subitem_text_value":"VLSI Design and Education Center, The University of Tokyo","subitem_text_language":"en"},{"subitem_text_value":"VLSI Design and Education Center, The University of Tokyo / Core Research for Evolutional Science and Technology, Japan Science and Technology Agency","subitem_text_language":"en"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_publisher":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"情報処理学会","subitem_publisher_language":"ja"}]},"publish_status":"0","weko_shared_id":-1,"item_file_price":{"attribute_name":"Billing file","attribute_type":"file","attribute_value_mlt":[{"url":{"url":"https://ipsj.ixsq.nii.ac.jp/record/69331/files/IPSJ-SLDM10145010.pdf"},"date":[{"dateType":"Available","dateValue":"2012-05-12"}],"format":"application/pdf","billing":["billing_file"],"filename":"IPSJ-SLDM10145010.pdf","filesize":[{"value":"152.6 kB"}],"mimetype":"application/pdf","priceinfo":[{"tax":["include_tax"],"price":"660","billingrole":"5"},{"tax":["include_tax"],"price":"330","billingrole":"6"},{"tax":["include_tax"],"price":"0","billingrole":"10"},{"tax":["include_tax"],"price":"0","billingrole":"44"}],"accessrole":"open_date","version_id":"c5a33c2c-8023-4ff6-9824-eb02a82d0ec7","displaytype":"detail","licensetype":"license_note","license_note":"Copyright (c) 2010 by the Information Processing Society of Japan"}]},"item_4_creator_5":{"attribute_name":"著者名","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"原田, 裕基"},{"creatorName":"西原, 佑"},{"creatorName":"松本, 剛史"},{"creatorName":"藤田, 昌宏"}],"nameIdentifiers":[{}]}]},"item_4_creator_6":{"attribute_name":"著者名(英)","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Hiroki, Harada","creatorNameLang":"en"},{"creatorName":"Tasuku, Nishihara","creatorNameLang":"en"},{"creatorName":"Takeshi, Matsumoto","creatorNameLang":"en"},{"creatorName":"Masahiro, Fujita","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_4_source_id_9":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA11451459","subitem_source_identifier_type":"NCID"}]},"item_4_textarea_12":{"attribute_name":"Notice","attribute_value_mlt":[{"subitem_textarea_value":"SIG Technical Reports are nonrefereed and hence may later appear in any journals, conferences, symposia, etc."}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourceuri":"http://purl.org/coar/resource_type/c_18gh","resourcetype":"technical report"}]},"item_4_description_7":{"attribute_name":"論文抄録","attribute_value_mlt":[{"subitem_description":"現在デバッグの作業において，バグの位置を特定する作業に特に時間が費やされている．本研究では，システムレベル設計を対象とした，バグの位置を特定する手法を提案する．さらに，この手法を効率化するために本稿ではバグモデルを導入する．バグモデルは設計記述において起こり得る記述誤りを形式的に定義したものである．このバグモデルの導入により，バグの具体的な修正方法が明らかになり，よりデバッグに有用な情報を得る事が可能になる．実験結果により，本手法によってバグの位置を大幅に絞り込め，デバッグに有用な情報を得る事ができる事を示す．またケーススタディにより，バグモデルを複合的に利用することによって，ある程度複雑なバグに対してもデバッグ支援を行える事を示す．","subitem_description_type":"Other"}]},"item_4_description_8":{"attribute_name":"論文抄録(英)","attribute_value_mlt":[{"subitem_description":"If an errorneous behavior is detected by simulation of hardware designs, it is very difficult and time-consuming to identify and fix the bug. In this paper, we propose a method to identify the location of bugs by utilizing SAT solvers, for a given system-level design and a set of failing patterns that make the outputs of the design incorrect. Also, to get possible solutions to fix bugs, we introduce bug models into the SAT-based proposed method. In this method, bug models are introduced in the design under debugging, and the method tries to find which bug models can make the design outputs correct for a given failing patterns. Experimental results show that the proposed method can provide the possible locations of bugs and possible solutions to fix them. Also, we describe that the proposed method can provide the debug solutions for real bugs.","subitem_description_type":"Other"}]},"item_4_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicPageEnd":"6","bibliographic_titles":[{"bibliographic_title":"研究報告システムLSI設計技術（SLDM）"}],"bibliographicPageStart":"1","bibliographicIssueDates":{"bibliographicIssueDate":"2010-05-12","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"10","bibliographicVolumeNumber":"2010-SLDM-145"}]},"relation_version_is_last":true,"weko_creator_id":"10"},"created":"2025-01-18T23:28:48.414776+00:00","updated":"2025-01-22T00:00:12.238614+00:00","id":69331}