{"metadata":{"_oai":{"id":"oai:ipsj.ixsq.nii.ac.jp:00068979","sets":["1164:2036:5978:6080"]},"path":["6080"],"owner":"10","recid":"68979","title":["RTOSのテスト自動生成システムに関する一考察"],"pubdate":{"attribute_name":"公開日","attribute_value":"2010-03-19"},"_buckets":{"deposit":"3ae43363-7a4b-41cb-bce1-20bdcb715cc1"},"_deposit":{"id":"68979","pid":{"type":"depid","value":"68979","revision_id":0},"owners":[10],"status":"published","created_by":10},"item_title":"RTOSのテスト自動生成システムに関する一考察","author_link":["0","0"],"item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"RTOSのテスト自動生成システムに関する一考察"},{"subitem_title":"A Study about Automatic Gener ation Systems for RTOS Tests","subitem_title_language":"en"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"テスト技術","subitem_subject_scheme":"Other"}]},"item_type_id":"4","publish_date":"2010-03-19","item_4_text_3":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"富士ソフト株式会社"},{"subitem_text_value":"名古屋大学"},{"subitem_text_value":"名古屋大学"},{"subitem_text_value":"名古屋大学"},{"subitem_text_value":"名古屋大学"}]},"item_4_text_4":{"attribute_name":"著者所属(英)","attribute_value_mlt":[{"subitem_text_value":"FUJISOFT INCORPORATED","subitem_text_language":"en"},{"subitem_text_value":"Nagoya University","subitem_text_language":"en"},{"subitem_text_value":"Nagoya University","subitem_text_language":"en"},{"subitem_text_value":"Nagoya University","subitem_text_language":"en"},{"subitem_text_value":"Nagoya University","subitem_text_language":"en"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_publisher":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"情報処理学会","subitem_publisher_language":"ja"}]},"publish_status":"0","weko_shared_id":10,"item_file_price":{"attribute_name":"Billing file","attribute_type":"file","attribute_value_mlt":[{"url":{"url":"https://ipsj.ixsq.nii.ac.jp/record/68979/files/IPSJ-SLDM10144011.pdf","label":"IPSJ-SLDM10144011"},"date":[{"dateType":"Available","dateValue":"2012-03-19"}],"format":"application/pdf","billing":["billing_file"],"filename":"IPSJ-SLDM10144011.pdf","filesize":[{"value":"628.0 kB"}],"mimetype":"application/pdf","priceinfo":[{"tax":["include_tax"],"price":"660","billingrole":"5"},{"tax":["include_tax"],"price":"330","billingrole":"6"},{"tax":["include_tax"],"price":"0","billingrole":"10"},{"tax":["include_tax"],"price":"0","billingrole":"44"}],"accessrole":"open_date","version_id":"d03a5274-872c-4dca-9f74-59ff6d092da0","displaytype":"detail","licensetype":"license_note","license_note":"Copyright (c) 2010 by the Information Processing Society of Japan"}]},"item_4_creator_5":{"attribute_name":"著者名","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"鴫原, 一人"},{"creatorName":"森, 孝夫"},{"creatorName":"本田, 晋也"},{"creatorName":"山本, 雅基"},{"creatorName":"高田, 広章"}],"nameIdentifiers":[{}]}]},"item_4_creator_6":{"attribute_name":"著者名(英)","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Kazuto, Shigihara","creatorNameLang":"en"},{"creatorName":"Takao, Mori","creatorNameLang":"en"},{"creatorName":"Shinya, Honda","creatorNameLang":"en"},{"creatorName":"Masaki, Yamamoto","creatorNameLang":"en"},{"creatorName":"Hiroaki, Takada","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_4_source_id_9":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA11451459","subitem_source_identifier_type":"NCID"}]},"item_4_textarea_12":{"attribute_name":"Notice","attribute_value_mlt":[{"subitem_textarea_value":"SIG Technical Reports are nonrefereed and hence may later appear in any journals, conferences, symposia, etc."}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourceuri":"http://purl.org/coar/resource_type/c_18gh","resourcetype":"technical report"}]},"item_4_description_7":{"attribute_name":"論文抄録","attribute_value_mlt":[{"subitem_description":"RTOS は組込みシステムの根幹をなすソフトウェアであるので，高い品質が求められる．RTOS のテストスイートは，使用する企業やその用途によって求められる範囲が異なる．したがって，RTOS のテストスイートは，テストの範囲を固定化したパッケージで提供しても，利用者が限られる．本論文では，利用者の求める範囲に応じて RTOS のテストスイートを生成する手法を提案する．RTOS のテストは，テストケースに直接影響するタスクやシステムをはじめとして取りうる条件が多く存在するので，テストの範囲に幅が出てしまう．そこで，テストケースに直接影響する条件をルール化し，直接影響しない条件をテスト範囲として与えることにより，利用者の求める範囲のテストスイートを自動生成する．","subitem_description_type":"Other"}]},"item_4_description_8":{"attribute_name":"論文抄録(英)","attribute_value_mlt":[{"subitem_description":"As RTOS are the core of many embedded systems, they must be developed under high quality standards. Depending on the company or intended application, the scope of the test suite may differ. Test suites with a fixed scope are therefore limited to a few users. This paper proposes a method for generating RTOS test suites that can satisfy the demands of different users. RTOS test suites usually have many selectable parameters, apart from the test environment conditions. As a consequence, a variety of test cases appear. Our method generates automatically test suites to meet the demands of different users by defining rules for the test environment conditions and offering a variety of selectable parameters.","subitem_description_type":"Other"}]},"item_4_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicPageEnd":"8","bibliographic_titles":[{"bibliographic_title":"研究報告システムLSI設計技術（SLDM）"}],"bibliographicPageStart":"1","bibliographicIssueDates":{"bibliographicIssueDate":"2010-03-19","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"11","bibliographicVolumeNumber":"2010-SLDM-144"}]},"relation_version_is_last":true,"weko_creator_id":"10"},"id":68979,"updated":"2025-01-21T22:21:53.128954+00:00","links":{},"created":"2025-01-18T23:28:32.320948+00:00"}