{"metadata":{"_oai":{"id":"oai:ipsj.ixsq.nii.ac.jp:00067539","sets":["581:582:5996"]},"path":["5996"],"owner":"11","recid":"67539","title":["修正確認テスト規模の低減を目的としたコードレビュー手法"],"pubdate":{"attribute_name":"公開日","attribute_value":"2009-12-15"},"_buckets":{"deposit":"159ecd2a-118c-41eb-9e60-c0d5c6ce710b"},"_deposit":{"id":"67539","pid":{"type":"depid","value":"67539","revision_id":0},"owners":[11],"status":"published","created_by":11},"item_title":"修正確認テスト規模の低減を目的としたコードレビュー手法","author_link":["0","0"],"item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"修正確認テスト規模の低減を目的としたコードレビュー手法"},{"subitem_title":"A Code Review Technique to Reduce Fix Assurance Test Size","subitem_title_language":"en"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"特集：ソフトウェア工学の変化と深化","subitem_subject_scheme":"Other"}]},"item_type_id":"2","publish_date":"2009-12-15","item_2_text_3":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"奈良先端科学技術大学院大学情報科学研究科"},{"subitem_text_value":"奈良先端科学技術大学院大学情報科学研究科"},{"subitem_text_value":"奈良工業高等専門学校情報工学科"},{"subitem_text_value":"奈良先端科学技術大学院大学情報科学研究科"},{"subitem_text_value":"奈良先端科学技術大学院大学情報科学研究科"}]},"item_2_text_4":{"attribute_name":"著者所属(英)","attribute_value_mlt":[{"subitem_text_value":"Graduate School of Information Science, Nara Institute of Science and Technology","subitem_text_language":"en"},{"subitem_text_value":"Graduate School of Information Science, Nara Institute of Science and Technology","subitem_text_language":"en"},{"subitem_text_value":"Department of Information Engineering, Nara National College of Technology","subitem_text_language":"en"},{"subitem_text_value":"Graduate School of Information Science, Nara Institute of Science and Technology","subitem_text_language":"en"},{"subitem_text_value":"Graduate School of Information Science, Nara Institute of Science and Technology","subitem_text_language":"en"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"publish_status":"0","weko_shared_id":-1,"item_file_price":{"attribute_name":"Billing file","attribute_type":"file","attribute_value_mlt":[{"url":{"url":"https://ipsj.ixsq.nii.ac.jp/record/67539/files/IPSJ-JNL5012032.pdf"},"date":[{"dateType":"Available","dateValue":"2011-12-15"}],"format":"application/pdf","billing":["billing_file"],"filename":"IPSJ-JNL5012032.pdf","filesize":[{"value":"435.2 kB"}],"mimetype":"application/pdf","priceinfo":[{"tax":["include_tax"],"price":"660","billingrole":"5"},{"tax":["include_tax"],"price":"330","billingrole":"6"},{"tax":["include_tax"],"price":"0","billingrole":"8"},{"tax":["include_tax"],"price":"0","billingrole":"44"}],"accessrole":"open_date","version_id":"41d6bca4-b156-449c-954d-1c2d60055eb6","displaytype":"detail","licensetype":"license_note","license_note":"Copyright (c) 2009 by the Information Processing Society of Japan"}]},"item_2_creator_5":{"attribute_name":"著者名","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"田村, 晃一"},{"creatorName":"亀井, 靖高"},{"creatorName":"上野秀剛"},{"creatorName":"森崎, 修司"},{"creatorName":"松本, 健一"}],"nameIdentifiers":[{}]}]},"item_2_creator_6":{"attribute_name":"著者名(英)","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Koichi, Tamura","creatorNameLang":"en"},{"creatorName":"Yasutaka, Kamei","creatorNameLang":"en"},{"creatorName":"Hidetake, Uwano","creatorNameLang":"en"},{"creatorName":"Shuji, Morisaki","creatorNameLang":"en"},{"creatorName":"Ken-ichi, Matsumoto","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_2_source_id_9":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AN00116647","subitem_source_identifier_type":"NCID"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourceuri":"http://purl.org/coar/resource_type/c_6501","resourcetype":"journal article"}]},"item_2_source_id_11":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1882-7764","subitem_source_identifier_type":"ISSN"}]},"item_2_description_7":{"attribute_name":"論文抄録","attribute_value_mlt":[{"subitem_description":"ソフトウェア開発におけるテスト工程での欠陥修正には，修正部分の確認，および修正による新たな欠陥の混入がないことを確認するテストの両方が必要となるケースが多い．本論文では，欠陥の修正にともなって必要となる修正部分の確認ならびに再テスト規模の低減を目的としたコードレビュー手法を提案する．提案手法では，テスト規模が想定できる情報をレビューアに与えることにより，潜在的に修正確認テスト規模が大きくなる欠陥を予想しながら優先的に検出する．商用開発の実務経験者6名を含む18名の被験者の間で，提案手法とTest Case Based Reading（TCBR），Ad-Hoc Reading（AHR）を比較したところ，TCBRと比較して平均2.1倍，AHRと比較して平均1.9倍の修正確認テスト規模の削減が確認できた．","subitem_description_type":"Other"}]},"item_2_description_8":{"attribute_name":"論文抄録(英)","attribute_value_mlt":[{"subitem_description":"In testing phases of software development projects, detected defects are fixed by modifying artifact including source code. Most of the detected defects require both test cases to confirm that the modification is correct and the modification does not cause new defects. In this paper, we propose a code reading technique in order to reduce size of such testing. The proposed method preferentially detects defects that potentially require larger size of testing by giving information that helps reviewer to estimate size of testing. In an evaluation experiment, the proposed technique reduces size of testing 2.1 times compared with test case based reading and 1.9 times compared with ad-hoc reading among 18 subjects including 6 commercial software developers.","subitem_description_type":"Other"}]},"item_2_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicPageEnd":"3083","bibliographic_titles":[{"bibliographic_title":"情報処理学会論文誌"}],"bibliographicPageStart":"3074","bibliographicIssueDates":{"bibliographicIssueDate":"2009-12-15","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"12","bibliographicVolumeNumber":"50"}]},"relation_version_is_last":true,"weko_creator_id":"11"},"id":67539,"updated":"2025-01-22T00:35:31.459705+00:00","links":{},"created":"2025-01-18T23:27:53.915059+00:00"}