{"updated":"2025-01-22T00:58:33.702976+00:00","metadata":{"_oai":{"id":"oai:ipsj.ixsq.nii.ac.jp:00066597","sets":["1164:1384:5667:5910"]},"path":["5910"],"owner":"10","recid":"66597","title":["派生開発におけるミューテーションテスト手法のシステムテストへの応用"],"pubdate":{"attribute_name":"公開日","attribute_value":"2009-10-29"},"_buckets":{"deposit":"7f3bafa6-4d14-4d42-95be-3955d2b8f295"},"_deposit":{"id":"66597","pid":{"type":"depid","value":"66597","revision_id":0},"owners":[10],"status":"published","created_by":10},"item_title":"派生開発におけるミューテーションテスト手法のシステムテストへの応用","author_link":["0","0"],"item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"派生開発におけるミューテーションテスト手法のシステムテストへの応用"},{"subitem_title":"Application of mutation testing to system test for derivative development","subitem_title_language":"en"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"テスト","subitem_subject_scheme":"Other"}]},"item_type_id":"4","publish_date":"2009-10-29","item_4_text_3":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"（株）東芝研究開発センターシステム技術ラボラトリー"},{"subitem_text_value":"（株）東芝研究開発センターシステム技術ラボラトリー"},{"subitem_text_value":"（株）東芝研究開発センターシステム技術ラボラトリー"},{"subitem_text_value":"（株）東芝研究開発センターシステム技術ラボラトリー"}]},"item_4_text_4":{"attribute_name":"著者所属(英)","attribute_value_mlt":[{"subitem_text_value":"System Engineering Laboratory, Corporate Research & Development Center, Toshiba Corp.","subitem_text_language":"en"},{"subitem_text_value":"System Engineering Laboratory, Corporate Research & Development Center, Toshiba Corp.","subitem_text_language":"en"},{"subitem_text_value":"System Engineering Laboratory, Corporate Research & Development Center, Toshiba Corp.","subitem_text_language":"en"},{"subitem_text_value":"System Engineering Laboratory, Corporate Research & Development Center, Toshiba Corp.","subitem_text_language":"en"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_publisher":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"情報処理学会","subitem_publisher_language":"ja"}]},"publish_status":"0","weko_shared_id":-1,"item_file_price":{"attribute_name":"Billing file","attribute_type":"file","attribute_value_mlt":[{"url":{"url":"https://ipsj.ixsq.nii.ac.jp/record/66597/files/IPSJ-SE09166018.pdf"},"date":[{"dateType":"Available","dateValue":"2011-10-29"}],"format":"application/pdf","billing":["billing_file"],"filename":"IPSJ-SE09166018.pdf","filesize":[{"value":"331.2 kB"}],"mimetype":"application/pdf","priceinfo":[{"tax":["include_tax"],"price":"660","billingrole":"5"},{"tax":["include_tax"],"price":"330","billingrole":"6"},{"tax":["include_tax"],"price":"0","billingrole":"12"},{"tax":["include_tax"],"price":"0","billingrole":"44"}],"accessrole":"open_date","version_id":"30cbca7f-166a-4161-b3ce-20097bf0165f","displaytype":"detail","licensetype":"license_note","license_note":"Copyright (c) 2009 by the Information Processing Society of Japan"}]},"item_4_creator_5":{"attribute_name":"著者名","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"丸地, 康平"},{"creatorName":"今井, 健男"},{"creatorName":"太田, 暁率"},{"creatorName":"片岡, 欣夫"}],"nameIdentifiers":[{}]}]},"item_4_creator_6":{"attribute_name":"著者名(英)","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Kohei, Maruchi","creatorNameLang":"en"},{"creatorName":"Takeo, Imai","creatorNameLang":"en"},{"creatorName":"Akinori, Ohta","creatorNameLang":"en"},{"creatorName":"Yoshio, Kataoka","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_4_source_id_9":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AN10112981","subitem_source_identifier_type":"NCID"}]},"item_4_textarea_12":{"attribute_name":"Notice","attribute_value_mlt":[{"subitem_textarea_value":"SIG Technical Reports are nonrefereed and hence may later appear in any journals, conferences, symposia, etc."}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourceuri":"http://purl.org/coar/resource_type/c_18gh","resourcetype":"technical report"}]},"item_4_description_7":{"attribute_name":"論文抄録","attribute_value_mlt":[{"subitem_description":"派生開発では，既存のテスト資産を活用しテストケースを作成する．ゆえに，テスト工程の質を保証するには，テスト資産のテストケースの不足や冗長を見つけるテストケース評価技術が重要となる．ミューテーションテストはテスト評価技術であり，テスト削減に有効であることが知られる．しかし，時間コストを要する技術であり，システムテストへの適用は困難である．本稿では，派生開発のシステムテストに対し，ミューテーションテストの適用方法を提案する．適用実験により，提案方法がミューテーションテスト自体に要する時間の削減や，テストケース不足の発見に有用であることを示す．","subitem_description_type":"Other"}]},"item_4_description_8":{"attribute_name":"論文抄録(英)","attribute_value_mlt":[{"subitem_description":"In derivative development, test assets of previous versions are reused. Therefore, test case evaluation techniques that find the lack or redundancy of test cases in the test assets are required for quality assurance of test process. Mutation based testing is one of the test case evaluation technique and is known effective as test reduction. But mutation based testing takes too much time to be applied to system test.<br>This paper proposes a method for applying mutation based testing for system test for derivative development. Our experiment showed this method was effective for reducing time required to mutation based testing itself and finding lack of test cases.","subitem_description_type":"Other"}]},"item_4_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicPageEnd":"8","bibliographic_titles":[{"bibliographic_title":"研究報告ソフトウェア工学（SE）"}],"bibliographicPageStart":"1","bibliographicIssueDates":{"bibliographicIssueDate":"2009-10-29","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"18","bibliographicVolumeNumber":"2009-SE-166"}]},"relation_version_is_last":true,"weko_creator_id":"10"},"created":"2025-01-18T23:27:19.395391+00:00","id":66597,"links":{}}