{"updated":"2025-01-22T02:57:10.462752+00:00","metadata":{"_oai":{"id":"oai:ipsj.ixsq.nii.ac.jp:00060850","sets":["1:6:5736"]},"path":["5736"],"owner":"10","recid":"60850","title":["ソフトウェアテストの最新動向：2.テストプロセスとテストプロセス改善"],"pubdate":{"attribute_name":"公開日","attribute_value":"2008-02-15"},"_buckets":{"deposit":"5e49c4c6-8a7e-422e-88f3-df3a3fec4b7a"},"_deposit":{"id":"60850","pid":{"type":"depid","value":"60850","revision_id":0},"owners":[10],"status":"published","created_by":10},"item_title":"ソフトウェアテストの最新動向：2.テストプロセスとテストプロセス改善","author_link":["0","0"],"item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"ソフトウェアテストの最新動向：2.テストプロセスとテストプロセス改善"},{"subitem_title":"Hot Topics on Software Testing : Introduction to software test processes and test process improvement","subitem_title_language":"en"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"特集","subitem_subject_scheme":"Other"}]},"item_type_id":"1","publish_date":"2008-02-15","item_1_text_3":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"豆蔵"},{"subitem_text_value":"豆蔵"}]},"item_1_text_4":{"attribute_name":"著者所属(英)","attribute_value_mlt":[{"subitem_text_value":"Mamezou Co., Ltd.","subitem_text_language":"en"},{"subitem_text_value":"Mamezou Co., Ltd.","subitem_text_language":"en"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_publisher":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"情報処理学会","subitem_publisher_language":"ja"}]},"publish_status":"0","weko_shared_id":-1,"item_file_price":{"attribute_name":"Billing file","attribute_type":"file","attribute_value_mlt":[{"url":{"url":"https://ipsj.ixsq.nii.ac.jp/record/60850/files/IPSJ-MGN490204.pdf"},"date":[{"dateType":"Available","dateValue":"2010-02-15"}],"format":"application/pdf","billing":["billing_file"],"filename":"IPSJ-MGN490204.pdf","filesize":[{"value":"997.5 kB"}],"mimetype":"application/pdf","priceinfo":[{"tax":["include_tax"],"price":"660","billingrole":"5"},{"tax":["include_tax"],"price":"0","billingrole":"6"},{"tax":["include_tax"],"price":"0","billingrole":"44"}],"accessrole":"open_date","version_id":"7630d932-1cd9-41a9-9355-63927a2c9f48","displaytype":"detail","licensetype":"license_note","license_note":"Copyright (c) 2008 by the Information Processing Society of Japan"}]},"item_1_creator_5":{"attribute_name":"著者名","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"大西建児"},{"creatorName":"湯本, 剛"}],"nameIdentifiers":[{}]}]},"item_1_creator_6":{"attribute_name":"著者名(英)","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Kenji, ONISHI","creatorNameLang":"en"},{"creatorName":"Tsuyoshi, YUMOTO","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_1_source_id_9":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AN00116625","subitem_source_identifier_type":"NCID"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourceuri":"http://purl.org/coar/resource_type/c_6501","resourcetype":"article"}]},"item_1_description_7":{"attribute_name":"論文抄録","attribute_value_mlt":[{"subitem_description":"ソフトウェアの開発において，開発総工数のうちソフトウェアテストプロセスが占める割合が多いにも関わらず，産業界の多くの開発現場ではソフトウェアテストのプロセスが最適化されているとはまだまだ言い難い状況である．昨今のソフトウェア開発で求められている，できるだけ短い開発サイクルでソフトウェア品質を維持しつつ，開発コストとのバランスを取るようにするためには，ソフトウェア開発全体のプロセス改善とともに，テストのプロセス改善をも同時に進めることが不可欠である．本稿では基本的なテストプロセスの解説およびテストプロセス改善手法について紹介する．","subitem_description_type":"Other"}]},"item_1_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicPageEnd":"139","bibliographic_titles":[{"bibliographic_title":"情報処理"}],"bibliographicPageStart":"133","bibliographicIssueDates":{"bibliographicIssueDate":"2008-02-15","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"2","bibliographicVolumeNumber":"49"}]},"relation_version_is_last":true,"weko_creator_id":"10"},"created":"2025-01-18T23:23:11.555117+00:00","id":60850,"links":{}}