{"updated":"2025-01-20T06:33:48.263398+00:00","links":{},"metadata":{"_oai":{"id":"oai:ipsj.ixsq.nii.ac.jp:00059886","sets":["5471:5515:5516"]},"path":["5516"],"owner":"11","recid":"59886","title":["An Educational and Psychological Test Item Data Base System"],"pubdate":{"attribute_name":"公開日","attribute_value":"1985-02-05"},"_buckets":{"deposit":"82f779bc-d0e6-4e5a-947b-36ada2d437e4"},"_deposit":{"id":"59886","pid":{"type":"depid","value":"59886","revision_id":0},"owners":[11],"status":"published","created_by":11},"item_title":"An Educational and Psychological Test Item Data Base System","author_link":["361350","361348","361349","361351"],"item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"An Educational and Psychological Test Item Data Base System"},{"subitem_title":"An Educational and Psychological Test Item Data Base System","subitem_title_language":"en"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"（IPSJ Best Paper Award、論文賞受賞）","subitem_subject_scheme":"Other"}]},"item_type_id":"5","publish_date":"1985-02-05","item_5_text_3":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"C & C Systems Research Laboratories  NEC Corporation"},{"subitem_text_value":"C & C Systems Research Laboratories  NEC Corporation"}]},"item_5_text_4":{"attribute_name":"著者所属(英)","attribute_value_mlt":[{"subitem_text_value":"C & C Systems Research Laboratories, NEC Corporation","subitem_text_language":"en"},{"subitem_text_value":"C & C Systems Research Laboratories, NEC Corporation","subitem_text_language":"en"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_publisher":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"情報処理学会","subitem_publisher_language":"ja"}]},"publish_status":"0","weko_shared_id":-1,"item_file_price":{"attribute_name":"Billing file","attribute_type":"file","attribute_value_mlt":[{"url":{"url":"https://ipsj.ixsq.nii.ac.jp/record/59886/files/IPSJ-JIP0704006.pdf","label":"IPSJ-JIP0704006"},"date":[{"dateType":"Available","dateValue":"1987-02-05"}],"format":"application/pdf","billing":["billing_file"],"filename":"IPSJ-JIP0704006.pdf","filesize":[{"value":"692.6 kB"}],"mimetype":"application/pdf","priceinfo":[{"tax":["include_tax"],"price":"0","billingrole":"5"},{"tax":["include_tax"],"price":"0","billingrole":"6"},{"tax":["include_tax"],"price":"0","billingrole":"44"}],"accessrole":"open_date","version_id":"3255d387-0cfa-448a-8bee-6f253436e634","displaytype":"detail","licensetype":"license_note","license_note":"Copyright (c) 1985 by the Information Processing Society of Japan"}]},"item_5_creator_5":{"attribute_name":"著者名","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Masahiko, Kurata"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Takahiro, Sato"}],"nameIdentifiers":[{}]}]},"item_5_creator_6":{"attribute_name":"著者名(英)","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Masahiko, Kurata","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Takahiro, Sato","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_5_source_id_9":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA00700121","subitem_source_identifier_type":"NCID"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourceuri":"http://purl.org/coar/resource_type/c_6501","resourcetype":"journal article"}]},"item_5_source_id_11":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1882-6652","subitem_source_identifier_type":"ISSN"}]},"item_5_description_7":{"attribute_name":"論文抄録","attribute_value_mlt":[{"subitem_description":"This paper presents a computer-assisted test construction support system of educational and psychological test based on a test item data base. The test item data base consists of a large number of items coded by their characteristics and statistics. A test author can construct a high quality test by selecting items in the data base referring to their characteristics and statistics such as their content area within a curriculum  behavioral objectives and item statistics. This system provides several kinds of check sheets to investigate content validity  and also the predictions of test score distributions and a coefficient of reliability to investigate statistical reliability of a constructed test prior to test administration. If these check sheets or the result of predictions do not satisfy the test author's aim  he can update several items and reform the test.","subitem_description_type":"Other"}]},"item_5_description_8":{"attribute_name":"論文抄録(英)","attribute_value_mlt":[{"subitem_description":"This paper presents a computer-assisted test construction support system of educational and psychological test based on a test item data base. The test item data base consists of a large number of items coded by their characteristics and statistics. A test author can construct a high quality test by selecting items in the data base referring to their characteristics and statistics such as their content area within a curriculum, behavioral objectives and item statistics. This system provides several kinds of check sheets to investigate content validity, and also the predictions of test score distributions and a coefficient of reliability to investigate statistical reliability of a constructed test prior to test administration. If these check sheets or the result of predictions do not satisfy the test author's aim, he can update several items and reform the test.","subitem_description_type":"Other"}]},"item_5_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicPageEnd":"261","bibliographic_titles":[{"bibliographic_title":"Journal of Information Processing "}],"bibliographicPageStart":"254","bibliographicIssueDates":{"bibliographicIssueDate":"1985-02-05","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"4","bibliographicVolumeNumber":"7"}]},"relation_version_is_last":true,"weko_creator_id":"11"},"id":59886,"created":"2025-01-18T23:22:34.029407+00:00"}