{"created":"2025-01-18T23:22:33.601136+00:00","updated":"2025-01-22T03:23:21.702414+00:00","metadata":{"_oai":{"id":"oai:ipsj.ixsq.nii.ac.jp:00059877","sets":["5471:5510:5514"]},"path":["5514"],"owner":"1","recid":"59877","title":["On Diagnosabilities of Systems with Incomplete Test"],"pubdate":{"attribute_name":"公開日","attribute_value":"1985-03-31"},"_buckets":{"deposit":"751a4f4c-a840-4360-9bca-d48303545344"},"_deposit":{"id":"59877","pid":{"type":"depid","value":"59877","revision_id":0},"owners":[1],"status":"published","created_by":1},"item_title":"On Diagnosabilities of Systems with Incomplete Test","author_link":["0","0"],"item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"On Diagnosabilities of Systems with Incomplete Test"},{"subitem_title":"On Diagnosabilities of Systems with Incomplete Test","subitem_title_language":"en"}]},"item_type_id":"5","publish_date":"1985-03-31","item_5_text_3":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"Dept. of Computer Science  Faculty of Engineering  Tokyo Institute of Technology"},{"subitem_text_value":"Dept. of Computer Science  Faculty of Engineering  Tokyo Institute of Technology"}]},"item_5_text_4":{"attribute_name":"著者所属(英)","attribute_value_mlt":[{"subitem_text_value":"Dept. of Computer Science, Faculty of Engineering, Tokyo Institute of Technology","subitem_text_language":"en"},{"subitem_text_value":"Dept. of Computer Science, Faculty of Engineering, Tokyo Institute of Technology","subitem_text_language":"en"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"eng"}]},"item_publisher":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"情報処理学会","subitem_publisher_language":"ja"}]},"publish_status":"0","weko_shared_id":-1,"item_file_price":{"attribute_name":"Billing file","attribute_type":"file","attribute_value_mlt":[{"url":{"url":"https://ipsj.ixsq.nii.ac.jp/record/59877/files/IPSJ-JIP0801003.pdf"},"date":[{"dateType":"Available","dateValue":"1987-03-31"}],"format":"application/pdf","billing":["billing_file"],"filename":"IPSJ-JIP0801003.pdf","filesize":[{"value":"461.9 kB"}],"mimetype":"application/pdf","priceinfo":[{"tax":["include_tax"],"price":"0","billingrole":"5"},{"tax":["include_tax"],"price":"0","billingrole":"6"},{"tax":["include_tax"],"price":"0","billingrole":"44"}],"accessrole":"open_date","version_id":"ae0490fe-52d8-4a72-9d94-915f3edf52ae","displaytype":"detail","licensetype":"license_note","license_note":"Copyright (c) 1985 by the Information Processing Society of Japan"}]},"item_5_creator_5":{"attribute_name":"著者名","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Kiyoshi, Furuya"},{"creatorName":"Yoshihiro, Tohma"}],"nameIdentifiers":[{}]}]},"item_5_creator_6":{"attribute_name":"著者名(英)","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Kiyoshi, Furuya","creatorNameLang":"en"},{"creatorName":"Yoshihiro, Tohma","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_5_source_id_9":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA00700121","subitem_source_identifier_type":"NCID"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourceuri":"http://purl.org/coar/resource_type/c_6501","resourcetype":"journal article"}]},"item_5_source_id_11":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1882-6652","subitem_source_identifier_type":"ISSN"}]},"item_5_description_7":{"attribute_name":"論文抄録","attribute_value_mlt":[{"subitem_description":"Hakimi and Amin [2] gave necessary and sufficient conditions for identification of all faulty units in a system on the assumption that the tests are complete. We extend those theories to the case where even fault-free units may fail tests of faulty ones. We define a system to be (t r)-diagnosable if all faulty units can be identified from test outcomes  provided the number of faulty units and that of test failures do not exceed t and r respectively. Similarly  we define totally-・ﾍdiagnosability  where ・ﾀrepresents the summation of them. We first give the necessary and sufficient condition for a system  in which no two units test each other  to be totally-・ﾍdiagnosable. Then  we extend the analysis to general case  and give the condition for a system  on which no such restriction is placed  to be (t r)-diagnosable.","subitem_description_type":"Other"}]},"item_5_description_8":{"attribute_name":"論文抄録(英)","attribute_value_mlt":[{"subitem_description":"Hakimi and Amin [2] gave necessary and sufficient conditions for identification of all faulty units in a system on the assumption that the tests are complete. We extend those theories to the case where even fault-free units may fail tests of faulty ones. We define a system to be (t,r)-diagnosable if all faulty units can be identified from test outcomes, provided the number of faulty units and that of test failures do not exceed t and r respectively. Similarly, we define totally-・ﾍdiagnosability, where ・ﾀrepresents the summation of them. We first give the necessary and sufficient condition for a system, in which no two units test each other, to be totally-・ﾍdiagnosable. Then, we extend the analysis to general case, and give the condition for a system, on which no such restriction is placed, to be (t,r)-diagnosable.","subitem_description_type":"Other"}]},"item_5_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicPageEnd":"27","bibliographic_titles":[{"bibliographic_title":"Journal of Information Processing "}],"bibliographicPageStart":"24","bibliographicIssueDates":{"bibliographicIssueDate":"1985-03-31","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"1","bibliographicVolumeNumber":"8"}]},"relation_version_is_last":true,"weko_creator_id":"1"},"id":59877,"links":{}}