{"updated":"2025-01-22T18:05:13.583370+00:00","metadata":{"_oai":{"id":"oai:ipsj.ixsq.nii.ac.jp:00028394","sets":["1164:2036:2155:2157"]},"path":["2157"],"owner":"1","recid":"28394","title":["VLSIテストデータ自動処理システムの開発"],"pubdate":{"attribute_name":"公開日","attribute_value":"1987-10-15"},"_buckets":{"deposit":"f1aaac56-6605-42dd-b7c4-d017c6ccf02f"},"_deposit":{"id":"28394","pid":{"type":"depid","value":"28394","revision_id":0},"owners":[1],"status":"published","created_by":1},"item_title":"VLSIテストデータ自動処理システムの開発","author_link":["0","0"],"item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"VLSIテストデータ自動処理システムの開発"},{"subitem_title":"A Test Data Generation System For VLSI (in Japanese)","subitem_title_language":"en"}]},"item_type_id":"4","publish_date":"1987-10-15","item_4_text_3":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"（株）東芝　超LSI研究所"},{"subitem_text_value":"（株）東芝　超LSI研究所"}]},"item_4_text_4":{"attribute_name":"著者所属(英)","attribute_value_mlt":[{"subitem_text_value":"VLSI Research Center, TOSHIBA Corporation","subitem_text_language":"en"},{"subitem_text_value":"VLSI Research Center, TOSHIBA Corporation","subitem_text_language":"en"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_publisher":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"情報処理学会","subitem_publisher_language":"ja"}]},"publish_status":"0","weko_shared_id":-1,"item_file_price":{"attribute_name":"Billing file","attribute_type":"file","attribute_value_mlt":[{"url":{"url":"https://ipsj.ixsq.nii.ac.jp/record/28394/files/IPSJ-SLDM87039004.pdf"},"date":[{"dateType":"Available","dateValue":"1989-10-15"}],"format":"application/pdf","billing":["billing_file"],"filename":"IPSJ-SLDM87039004.pdf","filesize":[{"value":"728.5 kB"}],"mimetype":"application/pdf","priceinfo":[{"tax":["include_tax"],"price":"660","billingrole":"5"},{"tax":["include_tax"],"price":"330","billingrole":"6"},{"tax":["include_tax"],"price":"0","billingrole":"10"},{"tax":["include_tax"],"price":"0","billingrole":"44"}],"accessrole":"open_date","version_id":"d32d292e-e4db-4989-add7-ce0ab14a77be","displaytype":"detail","licensetype":"license_note","license_note":"Copyright (c) 1987 by the Information Processing Society of Japan"}]},"item_4_creator_5":{"attribute_name":"著者名","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"立石, 昭光"},{"creatorName":"新田, 進"}],"nameIdentifiers":[{}]}]},"item_4_creator_6":{"attribute_name":"著者名(英)","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Akimitsu, Tateishi","creatorNameLang":"en"},{"creatorName":"Susumu, Nitta","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_4_source_id_9":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA11451459","subitem_source_identifier_type":"NCID"}]},"item_4_textarea_12":{"attribute_name":"Notice","attribute_value_mlt":[{"subitem_textarea_value":"SIG Technical Reports are nonrefereed and hence may later appear in any journals, conferences, symposia, etc."}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourceuri":"http://purl.org/coar/resource_type/c_18gh","resourcetype":"technical report"}]},"item_4_description_7":{"attribute_name":"論文抄録","attribute_value_mlt":[{"subitem_description":"本報告は、東芝標準テストデータインターフェース言語(TSTL2 : Toshiba Standard Test data interface Language)・テストデータベース・TSTL2コンパイラ、TSTL2逆コンパイラ、論理シミュレータ／機能シミュレータインターフェース、テスタインターフェース等VLSIテストデータ自動処理システムの開発について述べたものである。本システムではテストデータベース(TIF:Test data Interface File)を中心に構築し、東芝標準テストデータインターフェース言語によって、論理シミュレーション／機能シミュレーションやテスタ用のデータ作成、テスタの制約事項に対するエラーチェック等を自動的に行うことが可能となり、テストデータの移植性が向上し、LSIテスタのテストプログラムの開発期間が短縮された。","subitem_description_type":"Other"}]},"item_4_description_8":{"attribute_name":"論文抄録(英)","attribute_value_mlt":[{"subitem_description":"This paper describes a test data generation system for VLSI. This system consists of Toshiba Standard Test data interface language (TSTL2), TSTL2 complier, TSTL2 reverse-compiler, a logic/function simulator interface, a tester interface and Test data Interface File (TIF) at the core. The same test description in TSTL2 may be compiled to run against logic/function simulations and testers. It has proved do be an effective tool for cutting testing time.","subitem_description_type":"Other"}]},"item_4_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicPageEnd":"7","bibliographic_titles":[{"bibliographic_title":"情報処理学会研究報告システムLSI設計技術（SLDM）"}],"bibliographicPageStart":"1","bibliographicIssueDates":{"bibliographicIssueDate":"1987-10-15","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"74(1987-SLDM-039)","bibliographicVolumeNumber":"1987"}]},"relation_version_is_last":true,"weko_creator_id":"1"},"created":"2025-01-18T22:58:30.907927+00:00","id":28394,"links":{}}