{"metadata":{"_oai":{"id":"oai:ipsj.ixsq.nii.ac.jp:00028381","sets":["1164:2036:2155:2156"]},"path":["2156"],"owner":"1","recid":"28381","title":["組合せ回路におけるテスト生成の効率化手法"],"pubdate":{"attribute_name":"公開日","attribute_value":"1987-12-17"},"_buckets":{"deposit":"8382df48-9028-4131-a032-9ee48f23415b"},"_deposit":{"id":"28381","pid":{"type":"depid","value":"28381","revision_id":0},"owners":[1],"status":"published","created_by":1},"item_title":"組合せ回路におけるテスト生成の効率化手法","author_link":["0","0"],"item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"組合せ回路におけるテスト生成の効率化手法"},{"subitem_title":"AN EFFICIENT METHOD OF ATG FOR COMBINATIONAL CIRCUITS","subitem_title_language":"en"}]},"item_type_id":"4","publish_date":"1987-12-17","item_4_text_3":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"ソニー株式会社"}]},"item_4_text_4":{"attribute_name":"著者所属(英)","attribute_value_mlt":[{"subitem_text_value":"SONY Corporation","subitem_text_language":"en"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_publisher":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"情報処理学会","subitem_publisher_language":"ja"}]},"publish_status":"0","weko_shared_id":-1,"item_file_price":{"attribute_name":"Billing file","attribute_type":"file","attribute_value_mlt":[{"url":{"url":"https://ipsj.ixsq.nii.ac.jp/record/28381/files/IPSJ-SLDM87040013.pdf"},"date":[{"dateType":"Available","dateValue":"1989-12-17"}],"format":"application/pdf","billing":["billing_file"],"filename":"IPSJ-SLDM87040013.pdf","filesize":[{"value":"889.6 kB"}],"mimetype":"application/pdf","priceinfo":[{"tax":["include_tax"],"price":"660","billingrole":"5"},{"tax":["include_tax"],"price":"330","billingrole":"6"},{"tax":["include_tax"],"price":"0","billingrole":"10"},{"tax":["include_tax"],"price":"0","billingrole":"44"}],"accessrole":"open_date","version_id":"d3dc79a8-9be6-4cf9-af2e-f55232467990","displaytype":"detail","licensetype":"license_note","license_note":"Copyright (c) 1987 by the Information Processing Society of Japan"}]},"item_4_creator_5":{"attribute_name":"著者名","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"宮沢, 浩"}],"nameIdentifiers":[{}]}]},"item_4_creator_6":{"attribute_name":"著者名(英)","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Hiroshi, Miyazawa","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_4_source_id_9":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA11451459","subitem_source_identifier_type":"NCID"}]},"item_4_textarea_12":{"attribute_name":"Notice","attribute_value_mlt":[{"subitem_textarea_value":"SIG Technical Reports are nonrefereed and hence may later appear in any journals, conferences, symposia, etc."}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourceuri":"http://purl.org/coar/resource_type/c_18gh","resourcetype":"technical report"}]},"item_4_description_7":{"attribute_name":"論文抄録","attribute_value_mlt":[{"subitem_description":"近年、ATGシステムの構成要素である検査入力生成、故障シミュレーションに対して数多くの試みがなされてきているが、ATGシステム全体の処理効率が考慮されることは少なかった。本論文では、検査入力生成と故障シュミレーションを統合した新しい検査系列生成手法を提案する。ここで述べる検査系列生成手法では、不要な処理を極力排斥することによって処理効率の向上がはかられ、さらに生成されるテストパターン数の最小化も考慮される。また、その有効性を評価するために行った実験の結果についても併せて報告する。","subitem_description_type":"Other"}]},"item_4_description_8":{"attribute_name":"論文抄録(英)","attribute_value_mlt":[{"subitem_description":"In recent years, many approaches have been made for test pattern generation and fault simulation which are the components of ATG system. However, the efficiency of ATG system, as a whole, have not been considered so much. In this paper, a new ATG method, in which test pattern generation and fault simulation are combined, is presented. With this method, unneccessary processes are rejected and minimization of test pattern is considered. The efficiency is also presented with experimental results.","subitem_description_type":"Other"}]},"item_4_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicPageEnd":"90","bibliographic_titles":[{"bibliographic_title":"情報処理学会研究報告システムLSI設計技術（SLDM）"}],"bibliographicPageStart":"85","bibliographicIssueDates":{"bibliographicIssueDate":"1987-12-17","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"90(1987-SLDM-040)","bibliographicVolumeNumber":"1987"}]},"relation_version_is_last":true,"weko_creator_id":"1"},"id":28381,"updated":"2025-01-22T18:05:39.995200+00:00","links":{},"created":"2025-01-18T22:58:30.322574+00:00"}