{"created":"2025-01-18T22:58:28.638294+00:00","metadata":{"_oai":{"id":"oai:ipsj.ixsq.nii.ac.jp:00028344","sets":["1164:2036:2148:2151"]},"path":["2151"],"owner":"1","recid":"28344","title":["可観測な環境でのテストパターン生成について"],"pubdate":{"attribute_name":"公開日","attribute_value":"1988-10-28"},"_buckets":{"deposit":"a48d99fd-335c-4153-8bc9-357f88112748"},"_deposit":{"id":"28344","pid":{"type":"depid","value":"28344","revision_id":0},"owners":[1],"status":"published","created_by":1},"item_title":"可観測な環境でのテストパターン生成について","author_link":["0","0"],"item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"可観測な環境でのテストパターン生成について"},{"subitem_title":"Test Pattern Generation Under Observable Circumstances","subitem_title_language":"en"}]},"item_type_id":"4","publish_date":"1988-10-28","item_4_text_3":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"広島大学大学院　工学研究科"},{"subitem_text_value":"広島大学大学院　工学研究科"},{"subitem_text_value":"広島大学大学院　工学研究科"},{"subitem_text_value":"広島大学大学院　工学研究科"}]},"item_4_text_4":{"attribute_name":"著者所属(英)","attribute_value_mlt":[{"subitem_text_value":"Hiroshima University","subitem_text_language":"en"},{"subitem_text_value":"Hiroshima University","subitem_text_language":"en"},{"subitem_text_value":"Hiroshima University","subitem_text_language":"en"},{"subitem_text_value":"Hiroshima University","subitem_text_language":"en"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_publisher":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"情報処理学会","subitem_publisher_language":"ja"}]},"publish_status":"0","weko_shared_id":-1,"item_file_price":{"attribute_name":"Billing file","attribute_type":"file","attribute_value_mlt":[{"url":{"url":"https://ipsj.ixsq.nii.ac.jp/record/28344/files/IPSJ-SLDM88044005.pdf"},"date":[{"dateType":"Available","dateValue":"1990-10-28"}],"format":"application/pdf","billing":["billing_file"],"filename":"IPSJ-SLDM88044005.pdf","filesize":[{"value":"1.1 MB"}],"mimetype":"application/pdf","priceinfo":[{"tax":["include_tax"],"price":"660","billingrole":"5"},{"tax":["include_tax"],"price":"330","billingrole":"6"},{"tax":["include_tax"],"price":"0","billingrole":"10"},{"tax":["include_tax"],"price":"0","billingrole":"44"}],"accessrole":"open_date","version_id":"115d23e2-2f84-42c4-8747-272decf666ac","displaytype":"detail","licensetype":"license_note","license_note":"Copyright (c) 1988 by the Information Processing Society of Japan"}]},"item_4_creator_5":{"attribute_name":"著者名","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"梶原, 誠司"},{"creatorName":"温暁青"},{"creatorName":"板崎徳禎"},{"creatorName":"樹下行三"}],"nameIdentifiers":[{}]}]},"item_4_creator_6":{"attribute_name":"著者名(英)","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Seiji, Kajihara","creatorNameLang":"en"},{"creatorName":"Wen, Xiaoqing","creatorNameLang":"en"},{"creatorName":"Noriyoshi, Itazaki","creatorNameLang":"en"},{"creatorName":"Kozo, Kinoshita","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_4_source_id_9":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA11451459","subitem_source_identifier_type":"NCID"}]},"item_4_textarea_12":{"attribute_name":"Notice","attribute_value_mlt":[{"subitem_textarea_value":"SIG Technical Reports are nonrefereed and hence may later appear in any journals, conferences, symposia, etc."}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourceuri":"http://purl.org/coar/resource_type/c_18gh","resourcetype":"technical report"}]},"item_4_description_7":{"attribute_name":"論文抄録","attribute_value_mlt":[{"subitem_description":"電子ビームテスターを用いる論理回路のテストでは回路内部の信号線を直接観測できるためテストパターンは故障の影響を外部出力へ伝搬させる必要はなく仮定する故障をその素子の出力線で検出する入力パターンを生成するだけでよいことになる。本研究ではこのような可観測性のよい環境においてより少ないパターン数で順序回路の縮退故障とスタック・オープン故障を検出するテストパターン生成手法について述べる。","subitem_description_type":"Other"}]},"item_4_description_8":{"attribute_name":"論文抄録(英)","attribute_value_mlt":[{"subitem_description":"In testing logic circuits using the electron beam tester, it is sufficient to generate test patterns which can detect faults at the output line of gates, not necessary to propagate the fault effect to primary outputs, because all output lines are assumed to be observable. In this paper, under such observable circumstances we will show a method for generating test patterns which can detect stuck-at faults and stuck-open faults in sequential circuits by smaller number of patterns.","subitem_description_type":"Other"}]},"item_4_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicPageEnd":"42","bibliographic_titles":[{"bibliographic_title":"情報処理学会研究報告システムLSI設計技術（SLDM）"}],"bibliographicPageStart":"35","bibliographicIssueDates":{"bibliographicIssueDate":"1988-10-28","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"78(1988-SLDM-044)","bibliographicVolumeNumber":"1988"}]},"relation_version_is_last":true,"weko_creator_id":"1"},"id":28344,"updated":"2025-01-22T18:06:26.968457+00:00","links":{}}