{"created":"2025-01-18T22:57:47.110231+00:00","metadata":{"_oai":{"id":"oai:ipsj.ixsq.nii.ac.jp:00027421","sets":["1164:2036:2067:2069"]},"path":["2069"],"owner":"11","recid":"27421","title":["高リーク環境におけるSelf－Timed Cut－Off法を利用した統計的なリーク電流削減手法"],"pubdate":{"attribute_name":"公開日","attribute_value":"2003-10-23"},"_buckets":{"deposit":"1d1fe853-cca9-490d-82f0-b5e29dbb84da"},"_deposit":{"id":"27421","pid":{"type":"depid","value":"27421","revision_id":0},"owners":[11],"status":"published","created_by":11},"item_title":"高リーク環境におけるSelf－Timed Cut－Off法を利用した統計的なリーク電流削減手法","author_link":["456766","456757","456765","456760","456764","456759","456763","456758","456762","456761"],"item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"高リーク環境におけるSelf－Timed Cut－Off法を利用した統計的なリーク電流削減手法"},{"subitem_title":"Statistical Leakage Current Reduction by Self - Timed Cut - Off Scheme for High Leakage Environments","subitem_title_language":"en"}]},"item_type_id":"4","publish_date":"2003-10-23","item_4_text_3":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"東京大学生産技術研究所"},{"subitem_text_value":"東京大学生産技術研究所"},{"subitem_text_value":"東京大学生産技術研究所"},{"subitem_text_value":"東京大学生産技術研究所"},{"subitem_text_value":"東京大学生産技術研究所"}]},"item_4_text_4":{"attribute_name":"著者所属(英)","attribute_value_mlt":[{"subitem_text_value":"Institute of Industrial Science, University of Tokyo","subitem_text_language":"en"},{"subitem_text_value":"Institute of Industrial Science, University of Tokyo","subitem_text_language":"en"},{"subitem_text_value":"Institute of Industrial Science, University of Tokyo","subitem_text_language":"en"},{"subitem_text_value":"Institute of Industrial Science, University of Tokyo","subitem_text_language":"en"},{"subitem_text_value":"Institute of Industrial Science, University of Tokyo","subitem_text_language":"en"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_publisher":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"情報処理学会","subitem_publisher_language":"ja"}]},"publish_status":"0","weko_shared_id":-1,"item_file_price":{"attribute_name":"Billing file","attribute_type":"file","attribute_value_mlt":[{"url":{"url":"https://ipsj.ixsq.nii.ac.jp/record/27421/files/IPSJ-SLDM03111028.pdf","label":"IPSJ-SLDM03111028"},"date":[{"dateType":"Available","dateValue":"2005-10-23"}],"format":"application/pdf","billing":["billing_file"],"filename":"IPSJ-SLDM03111028.pdf","filesize":[{"value":"1.0 MB"}],"mimetype":"application/pdf","priceinfo":[{"tax":["include_tax"],"price":"660","billingrole":"5"},{"tax":["include_tax"],"price":"330","billingrole":"6"},{"tax":["include_tax"],"price":"0","billingrole":"10"},{"tax":["include_tax"],"price":"0","billingrole":"44"}],"accessrole":"open_date","version_id":"0cb153e8-e417-4d23-9409-4518a2a5a8f7","displaytype":"detail","licensetype":"license_note","license_note":"Copyright (c) 2003 by the Information Processing Society of Japan"}]},"item_4_creator_5":{"attribute_name":"著者名","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"許, 蛍雪"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"崔, 珍赫"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"宮崎, 隆行"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"川口, 博"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"桜井, 貴康"}],"nameIdentifiers":[{}]}]},"item_4_creator_6":{"attribute_name":"著者名(英)","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Yingxue, Xu","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Jin-Hyeok, Choi","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Takayuki, Miyazaki","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Hiroshi, Kawaguchi","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Takayasu, Sakurai","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_4_source_id_9":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA11451459","subitem_source_identifier_type":"NCID"}]},"item_4_textarea_12":{"attribute_name":"Notice","attribute_value_mlt":[{"subitem_textarea_value":"SIG Technical Reports are nonrefereed and hence may later appear in any journals, conferences, symposia, etc."}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourceuri":"http://purl.org/coar/resource_type/c_18gh","resourcetype":"technical report"}]},"item_4_description_7":{"attribute_name":"論文抄録","attribute_value_mlt":[{"subitem_description":"高リーク時代において、Self-Timed Cut-Off法に基づくブロックレベル活性化法は、待機時のみならず動作時においてもリーク電流を減らすことができ有効である。その基本動作は統計情報に基づいている。Self-Timed Cut-Offスイッチを使い、一定時間動いていないブロックをスリープモードに入れる。本提案の有効性を８ビットRISCマイクロプロセッサのVerilog HDLによるシミュレーションとともに、0.25umのSOIプロセスで試作された64ビットのcarry look-head加算器の測定を通して検証した。","subitem_description_type":"Other"}]},"item_4_description_8":{"attribute_name":"論文抄録(英)","attribute_value_mlt":[{"subitem_description":"This paper describes a statistical leakage current reduction scheme that can reduce leakage current even if the chip is in an active mode. The scheme utilizes a self-timed cut-off switch that outs a given block into a sleep mode if the block is not used for a certain number of cycles. The effectiveness of the proposed scheme is verified by an 8-bit RISC microprocessor using Verilog HDL, and demonstrated by a 64bit carry look-ahead adder fabricated with dual-Vth SOI technology.","subitem_description_type":"Other"}]},"item_4_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicPageEnd":"162","bibliographic_titles":[{"bibliographic_title":"情報処理学会研究報告システムLSI設計技術（SLDM）"}],"bibliographicPageStart":"157","bibliographicIssueDates":{"bibliographicIssueDate":"2003-10-23","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"105(2003-SLDM-111)","bibliographicVolumeNumber":"2003"}]},"relation_version_is_last":true,"weko_creator_id":"11"},"links":{},"id":27421,"updated":"2025-01-19T23:41:36.278025+00:00"}