@techreport{oai:ipsj.ixsq.nii.ac.jp:00027243,
 author = {山本, 幸大 and 高橋, 寛 and 樋上, 喜信 and 高松, 雄三 and Yukihiro, Yamamoto and Hiroshi, Takahashi and Yoshinobu, Higami and Yuzo, Takamatsu},
 issue = {122(2004-SLDM-117)},
 month = {Dec},
 note = {半導体の微細化に伴って多重縮退故障に対する診断法の開発が望まれている．また，最近のBIST環境に適応可能な故障診断法の開発も望まれている．本稿では，BIST環境における不確かなテスト集合による多重縮退故障に対する故障診断法を提案する．提案する故障診断法の特徴は，１）検出テストによって検出できる故障数が異なることに着目し，検出故障数が少ないテストによって検出された故障を故障候補として推定すること，２）推定された故障候補から被検出テストでＮ回以上検出される故障を削除すること，および３）非検出テストおよび検出テストにおける故障候補の検出回数，および回路の構造的な情報に基づく評価に従って故障候補の順位付けを行うことである．最後に，提案手法をISCASベンチマーク回路に適用した評価実験結果を示す．, With the scaling of LSI feature size and increasing complexity of LSI, it is necessary to develop a method for diagnosing multiple stuck-at faults. Recently, the fault diagnosis under Built-In Self Test (BIST) environment is demanded because BIST is as effective in testing. However, the fault diagnosis under BIST environment is more diffibult because only limited information for making the test set for diagnosis is available in highly compacted signatures. There fore the detecting test set that is identified in BIST session includes un-detecting tests. In this paper, we propose a method for diagnosing multiple stuck-at faults under BIST environment. The fundamental features of the method are 1) to deduce candidate fault in recognizing that the number of detected faults are difference among tests in the ambigous detecting test, 2) to remove the candidate faults that are detected N times by un-detecting tests to reduce the number of candidate faults, and 3) to rank the candidate faults based on the information about detection times in the detecting tests and the un-detecting tests and the information about circuit structure. finally we evaluate the effectiveness of the proposed method by experiments conducted on the ISCAS benchmark circuits.},
 title = {不確かなテスト集合による多重縮退故障の診断},
 year = {2004}
}