{"id":27232,"updated":"2025-01-22T18:36:56.781422+00:00","links":{},"created":"2025-01-18T22:57:38.721473+00:00","metadata":{"_oai":{"id":"oai:ipsj.ixsq.nii.ac.jp:00027232","sets":["1164:2036:2061:2062"]},"path":["2062"],"owner":"1","recid":"27232","title":["［招待講演]半導体試験・測定システム　－平成15年度特許出願技術動向調査－"],"pubdate":{"attribute_name":"公開日","attribute_value":"2004-12-01"},"_buckets":{"deposit":"caa677f4-9ed2-4a53-8871-5a87313cce83"},"_deposit":{"id":"27232","pid":{"type":"depid","value":"27232","revision_id":0},"owners":[1],"status":"published","created_by":1},"item_title":"［招待講演]半導体試験・測定システム　－平成15年度特許出願技術動向調査－","author_link":[],"item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"［招待講演]半導体試験・測定システム　－平成15年度特許出願技術動向調査－"},{"subitem_title":"Semiconductor testing system -survey on technological trends of patent applications (fiscal year 2003)-","subitem_title_language":"en"}]},"item_type_id":"4","publish_date":"2004-12-01","item_4_text_3":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"特許庁　特許審査第三部　電子素材加工"}]},"item_4_text_4":{"attribute_name":"著者所属(英)","attribute_value_mlt":[{"subitem_text_value":"Japan Patent Office Electrical Components Processing Div., Third Patent Examination Dept.","subitem_text_language":"en"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_publisher":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"情報処理学会","subitem_publisher_language":"ja"}]},"publish_status":"0","weko_shared_id":-1,"item_file_price":{"attribute_name":"Billing file","attribute_type":"file","attribute_value_mlt":[{"url":{"url":"https://ipsj.ixsq.nii.ac.jp/record/27232/files/IPSJ-SLDM04117010.pdf"},"date":[{"dateType":"Available","dateValue":"2006-12-01"}],"format":"application/pdf","billing":["billing_file"],"filename":"IPSJ-SLDM04117010.pdf","filesize":[{"value":"759.5 kB"}],"mimetype":"application/pdf","priceinfo":[{"tax":["include_tax"],"price":"660","billingrole":"5"},{"tax":["include_tax"],"price":"330","billingrole":"6"},{"tax":["include_tax"],"price":"0","billingrole":"10"},{"tax":["include_tax"],"price":"0","billingrole":"44"}],"accessrole":"open_date","version_id":"b0d8d7ca-904e-4aae-a279-5f685c48b7ca","displaytype":"detail","licensetype":"license_note","license_note":"Copyright (c) 2004 by the Information Processing Society of Japan"}]},"item_4_source_id_9":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA11451459","subitem_source_identifier_type":"NCID"}]},"item_4_textarea_12":{"attribute_name":"Notice","attribute_value_mlt":[{"subitem_textarea_value":"SIG Technical Reports are nonrefereed and hence may later appear in any journals, conferences, symposia, etc."}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourceuri":"http://purl.org/coar/resource_type/c_18gh","resourcetype":"technical report"}]},"item_4_description_7":{"attribute_name":"論文抄録","attribute_value_mlt":[{"subitem_description":"価格競争力を支える半導体試験・測定システムを中心とした技術開発戦略や産業財産戦略をグローバルな視点から検討することの重要性はきわめて高い。半導体試験・測定システムに関し、特許情報を中心に、市場動向、技術開発動向、国際競争力、将来展望について、調査分析を実施した。その調査結果について報告を行う。","subitem_description_type":"Other"}]},"item_4_description_8":{"attribute_name":"論文抄録(英)","attribute_value_mlt":[{"subitem_description":"It is very important to consider both strategies, R&D and intellectual property from the global viewpoint, relating to semiconductor testing system which leads price competitiveness. We mainly investigated pated database and analyzed trends in markets, technological development and international competitiveness, and forecasts in the field of semiconductor testing system. We will report the investigation result.","subitem_description_type":"Other"}]},"item_4_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicPageEnd":"60","bibliographic_titles":[{"bibliographic_title":"情報処理学会研究報告システムLSI設計技術（SLDM）"}],"bibliographicPageStart":"55","bibliographicIssueDates":{"bibliographicIssueDate":"2004-12-01","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"122(2004-SLDM-117)","bibliographicVolumeNumber":"2004"}]},"relation_version_is_last":true,"weko_creator_id":"1"}}