{"updated":"2025-01-22T18:40:42.897184+00:00","metadata":{"_oai":{"id":"oai:ipsj.ixsq.nii.ac.jp:00027143","sets":["1164:2036:2055:2057"]},"path":["2057"],"owner":"1","recid":"27143","title":["電流基板制御方式による基板ノイズ低減及びランダムばらつき抑制効果"],"pubdate":{"attribute_name":"公開日","attribute_value":"2005-10-21"},"_buckets":{"deposit":"80001c2f-7b17-435a-9758-41fbff01ca0b"},"_deposit":{"id":"27143","pid":{"type":"depid","value":"27143","revision_id":0},"owners":[1],"status":"published","created_by":1},"item_title":"電流基板制御方式による基板ノイズ低減及びランダムばらつき抑制効果","author_link":["0","0"],"item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"電流基板制御方式による基板ノイズ低減及びランダムばらつき抑制効果"},{"subitem_title":"substrate-Noise and Random-Fluctuations Reduction with Self-Adjusted Forward Body Bias","subitem_title_language":"en"}]},"item_type_id":"4","publish_date":"2005-10-21","item_4_text_3":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"（株）半導体理工学研究センター（STARC）設計技術開発部　低電力技術開発室"},{"subitem_text_value":"（株）半導体理工学研究センター（STARC）設計技術開発部　低電力技術開発室"},{"subitem_text_value":"（株）半導体理工学研究センター（STARC）設計技術開発部　低電力技術開発室"},{"subitem_text_value":"（株）半導体理工学研究センター（STARC）設計技術開発部　低電力技術開発室"},{"subitem_text_value":"神戸大学　工学部　情報知能工学科"},{"subitem_text_value":"神戸大学　工学部　情報知能工学科"},{"subitem_text_value":"神戸大学　工学部　情報知能工学科"}]},"item_4_text_4":{"attribute_name":"著者所属(英)","attribute_value_mlt":[{"subitem_text_value":"Semiconductor Technology Academic Research Center (STARC) ","subitem_text_language":"en"},{"subitem_text_value":"Semiconductor Technology Academic Research Center (STARC) ","subitem_text_language":"en"},{"subitem_text_value":"Semiconductor Technology Academic Research Center (STARC) ","subitem_text_language":"en"},{"subitem_text_value":"Semiconductor Technology Academic Research Center (STARC) ","subitem_text_language":"en"},{"subitem_text_value":"Kobe University","subitem_text_language":"en"},{"subitem_text_value":"Kobe University","subitem_text_language":"en"},{"subitem_text_value":"Kobe University","subitem_text_language":"en"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_publisher":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"情報処理学会","subitem_publisher_language":"ja"}]},"publish_status":"0","weko_shared_id":-1,"item_file_price":{"attribute_name":"Billing file","attribute_type":"file","attribute_value_mlt":[{"url":{"url":"https://ipsj.ixsq.nii.ac.jp/record/27143/files/IPSJ-SLDM05121021.pdf"},"date":[{"dateType":"Available","dateValue":"2007-10-21"}],"format":"application/pdf","billing":["billing_file"],"filename":"IPSJ-SLDM05121021.pdf","filesize":[{"value":"980.2 kB"}],"mimetype":"application/pdf","priceinfo":[{"tax":["include_tax"],"price":"660","billingrole":"5"},{"tax":["include_tax"],"price":"330","billingrole":"6"},{"tax":["include_tax"],"price":"0","billingrole":"10"},{"tax":["include_tax"],"price":"0","billingrole":"44"}],"accessrole":"open_date","version_id":"3296e6c8-1cae-4528-949c-07f3abba77eb","displaytype":"detail","licensetype":"license_note","license_note":"Copyright (c) 2005 by the Information Processing Society of Japan"}]},"item_4_creator_5":{"attribute_name":"著者名","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"小松, 義英"},{"creatorName":"石橋, 孝一郎"},{"creatorName":"塚田敏郎"},{"creatorName":"山本雅晴"},{"creatorName":"島崎, 健二"},{"creatorName":"深澤, 光弥"},{"creatorName":"永田, 真"}],"nameIdentifiers":[{}]}]},"item_4_creator_6":{"attribute_name":"著者名(英)","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Yoshihide, Komatsu","creatorNameLang":"en"},{"creatorName":"Koichiro, Ishibashi","creatorNameLang":"en"},{"creatorName":"Masaharu, Yamamoto","creatorNameLang":"en"},{"creatorName":"Toshiro, Tsukada","creatorNameLang":"en"},{"creatorName":"Kenji, Shimazaki","creatorNameLang":"en"},{"creatorName":"Mitsuya, Fukamwa","creatorNameLang":"en"},{"creatorName":"Makoto, Nagata","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_4_source_id_9":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA11451459","subitem_source_identifier_type":"NCID"}]},"item_4_textarea_12":{"attribute_name":"Notice","attribute_value_mlt":[{"subitem_textarea_value":"SIG Technical Reports are nonrefereed and hence may later appear in any journals, conferences, symposia, etc."}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourceuri":"http://purl.org/coar/resource_type/c_18gh","resourcetype":"technical report"}]},"item_4_description_7":{"attribute_name":"論文抄録","attribute_value_mlt":[{"subitem_description":"セルフアジャスト順方向基板制御方式（SA－FBB）を用いた際の基板ノイズ低減効果、及びランダムばらつき低減効果について報告する。効果を測定、確認するために2つのテストチップを用意した。1つ目のチップには様々な周波数のノイズ源とそのノイズを検出するためのオンチップオシロスコープが搭載していて、基板制御時のノイズ低減効果が測定できる。130nmCMOS、3－wellプロセスを用いた。2つ目のチップには10M個のトランジスタを搭載し、基板制御を行った際のランダムぱらつきの傾向の測定ができる。SA－FBBを用いると基板ノイズ（Wellノイズ）は最大70.2％低減効果があり、ランダムばらつきб(Ids)は最大57.9％程度低減効果がある。","subitem_description_type":"Other"}]},"item_4_description_8":{"attribute_name":"論文抄録(英)","attribute_value_mlt":[{"subitem_description":"We propose a method of reducing substrate noise and random fluctuations utilizing a self-adjusted forward body bias (SA-FBB) circuit. To achieve this, we designed a test chip that contained an on-chip oscilloscope for detecting dynamic noise from various frequency noise sources, and another test chip that contained 10-M transistors for measuring random fluctuation tendencies. Under SA-FBB conditions, it reduced noise by 69.8% and reduced random fluctuations б(Ids) by 57.9%.","subitem_description_type":"Other"}]},"item_4_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicPageEnd":"130","bibliographic_titles":[{"bibliographic_title":"情報処理学会研究報告システムLSI設計技術（SLDM）"}],"bibliographicPageStart":"125","bibliographicIssueDates":{"bibliographicIssueDate":"2005-10-21","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"102(2005-SLDM-121)","bibliographicVolumeNumber":"2005"}]},"relation_version_is_last":true,"weko_creator_id":"1"},"created":"2025-01-18T22:57:34.770389+00:00","id":27143,"links":{}}