{"metadata":{"_oai":{"id":"oai:ipsj.ixsq.nii.ac.jp:00027106","sets":["1164:2036:2055:2056"]},"path":["2056"],"owner":"1","recid":"27106","title":["統計的遅延解析におけるモデルと精度に関する一考察"],"pubdate":{"attribute_name":"公開日","attribute_value":"2005-11-30"},"_buckets":{"deposit":"679d71a0-1bfc-4a08-bd83-f8f113982d92"},"_deposit":{"id":"27106","pid":{"type":"depid","value":"27106","revision_id":0},"owners":[1],"status":"published","created_by":1},"item_title":"統計的遅延解析におけるモデルと精度に関する一考察","author_link":["0","0"],"item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"統計的遅延解析におけるモデルと精度に関する一考察"},{"subitem_title":"A Study of the Model and the Accuracy of Statistical Timing Analysis","subitem_title_language":"en"}]},"item_type_id":"4","publish_date":"2005-11-30","item_4_text_3":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"富士通研究所"},{"subitem_text_value":"富士通研究所"},{"subitem_text_value":"富士通研究所"}]},"item_4_text_4":{"attribute_name":"著者所属(英)","attribute_value_mlt":[{"subitem_text_value":"FUJITSU LABORATORIES LTD.","subitem_text_language":"en"},{"subitem_text_value":"FUJITSU LABORATORIES LTD.","subitem_text_language":"en"},{"subitem_text_value":"FUJITSU LABORATORIES LTD.","subitem_text_language":"en"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_publisher":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"情報処理学会","subitem_publisher_language":"ja"}]},"publish_status":"0","weko_shared_id":-1,"item_file_price":{"attribute_name":"Billing file","attribute_type":"file","attribute_value_mlt":[{"url":{"url":"https://ipsj.ixsq.nii.ac.jp/record/27106/files/IPSJ-SLDM05122018.pdf"},"date":[{"dateType":"Available","dateValue":"2007-11-30"}],"format":"application/pdf","billing":["billing_file"],"filename":"IPSJ-SLDM05122018.pdf","filesize":[{"value":"982.3 kB"}],"mimetype":"application/pdf","priceinfo":[{"tax":["include_tax"],"price":"660","billingrole":"5"},{"tax":["include_tax"],"price":"330","billingrole":"6"},{"tax":["include_tax"],"price":"0","billingrole":"10"},{"tax":["include_tax"],"price":"0","billingrole":"44"}],"accessrole":"open_date","version_id":"f6301240-415c-4428-a153-3f183ffd4959","displaytype":"detail","licensetype":"license_note","license_note":"Copyright (c) 2005 by the Information Processing Society of Japan"}]},"item_4_creator_5":{"attribute_name":"著者名","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"新田, 泉"},{"creatorName":"本間, 克己"},{"creatorName":"渋谷, 利行"}],"nameIdentifiers":[{}]}]},"item_4_creator_6":{"attribute_name":"著者名(英)","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Izumi, NITTA","creatorNameLang":"en"},{"creatorName":"Katsumi, Homma","creatorNameLang":"en"},{"creatorName":"Toshiyuki, SHIBUYA","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_4_source_id_9":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA11451459","subitem_source_identifier_type":"NCID"}]},"item_4_textarea_12":{"attribute_name":"Notice","attribute_value_mlt":[{"subitem_textarea_value":"SIG Technical Reports are nonrefereed and hence may later appear in any journals, conferences, symposia, etc."}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourceuri":"http://purl.org/coar/resource_type/c_18gh","resourcetype":"technical report"}]},"item_4_description_7":{"attribute_name":"論文抄録","attribute_value_mlt":[{"subitem_description":"回路のタイミング性能が目標周波数を満たすかどうかは、クリティカルパスのスラック値によって判断される。我々は統計的遅延解析をASICのタイミングサインオフに適用するという観点から、スラック値の精度に着目し、スラック値を確率分布として計算することにより、スラック値を精度良く見積もる手法を提案する。また、ASICの実回路に適用し提案手法の具体的効果を報告する。","subitem_description_type":"Other"}]},"item_4_description_8":{"attribute_name":"論文抄録(英)","attribute_value_mlt":[{"subitem_description":"The criteria of timing performance of the circuit is detemined by the slack values of cridcal paths. When we apply the statisdcal timing analysis for the design of ASIC, the accuracy of slack value is important. This paper proposes a technique to calculate slack value as a probability distribution which estimates a -3 σ slack value more accurately. We also report the experimental results for ASIC data.","subitem_description_type":"Other"}]},"item_4_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicPageEnd":"108","bibliographic_titles":[{"bibliographic_title":"情報処理学会研究報告システムLSI設計技術（SLDM）"}],"bibliographicPageStart":"103","bibliographicIssueDates":{"bibliographicIssueDate":"2005-11-30","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"121(2005-SLDM-122)","bibliographicVolumeNumber":"2005"}]},"relation_version_is_last":true,"weko_creator_id":"1"},"id":27106,"updated":"2025-01-22T18:41:37.033001+00:00","links":{},"created":"2025-01-18T22:57:33.122612+00:00"}