{"metadata":{"_oai":{"id":"oai:ipsj.ixsq.nii.ac.jp:00026827","sets":["1164:2036:2037:2041"]},"path":["2041"],"owner":"1","recid":"26827","title":["少品種高信頼セルによる演算器の提案と評価"],"pubdate":{"attribute_name":"公開日","attribute_value":"2008-03-28"},"_buckets":{"deposit":"120e3609-7ed0-4180-a1d9-cc1b98fe95f1"},"_deposit":{"id":"26827","pid":{"type":"depid","value":"26827","revision_id":0},"owners":[1],"status":"published","created_by":1},"item_title":"少品種高信頼セルによる演算器の提案と評価","author_link":["0","0"],"item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"少品種高信頼セルによる演算器の提案と評価"},{"subitem_title":"A Functional Unit with Small Variety of Highly Reliable Cells and Its Evaluation","subitem_title_language":"en"}]},"item_type_id":"4","publish_date":"2008-03-28","item_4_text_3":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"奈良先端科学技術大学院大学"},{"subitem_text_value":"奈良先端科学技術大学院大学"},{"subitem_text_value":"奈良先端科学技術大学院大学"},{"subitem_text_value":"奈良先端科学技術大学院大学"},{"subitem_text_value":"奈良先端科学技術大学院大学"}]},"item_4_text_4":{"attribute_name":"著者所属(英)","attribute_value_mlt":[{"subitem_text_value":"Nara Institute of Science and Technology","subitem_text_language":"en"},{"subitem_text_value":"Nara Institute of Science and Technology","subitem_text_language":"en"},{"subitem_text_value":"Nara Institute of Science and Technology","subitem_text_language":"en"},{"subitem_text_value":"Nara Institute of Science and Technology","subitem_text_language":"en"},{"subitem_text_value":"Nara Institute of Science and Technology","subitem_text_language":"en"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_publisher":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"情報処理学会","subitem_publisher_language":"ja"}]},"publish_status":"0","weko_shared_id":-1,"item_file_price":{"attribute_name":"Billing file","attribute_type":"file","attribute_value_mlt":[{"url":{"url":"https://ipsj.ixsq.nii.ac.jp/record/26827/files/IPSJ-SLDM08134029.pdf"},"date":[{"dateType":"Available","dateValue":"2010-03-28"}],"format":"application/pdf","billing":["billing_file"],"filename":"IPSJ-SLDM08134029.pdf","filesize":[{"value":"579.5 kB"}],"mimetype":"application/pdf","priceinfo":[{"tax":["include_tax"],"price":"660","billingrole":"5"},{"tax":["include_tax"],"price":"330","billingrole":"6"},{"tax":["include_tax"],"price":"0","billingrole":"10"},{"tax":["include_tax"],"price":"0","billingrole":"44"}],"accessrole":"open_date","version_id":"073b75fb-efcb-475f-876a-8e157fec9ca3","displaytype":"detail","licensetype":"license_note","license_note":"Copyright (c) 2008 by the Information Processing Society of Japan"}]},"item_4_creator_5":{"attribute_name":"著者名","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"鈴木, 一範"},{"creatorName":"中田, 尚"},{"creatorName":"中西, 正樹"},{"creatorName":"山下, 茂"},{"creatorName":"中島, 康彦"}],"nameIdentifiers":[{}]}]},"item_4_creator_6":{"attribute_name":"著者名(英)","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Kazunori, Suzuki","creatorNameLang":"en"},{"creatorName":"Takashi, Nakada","creatorNameLang":"en"},{"creatorName":"Masaki, Nakanishi","creatorNameLang":"en"},{"creatorName":"Shigeru, Yamashita","creatorNameLang":"en"},{"creatorName":"Yasuhiko, Nakashima","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_4_source_id_9":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA11451459","subitem_source_identifier_type":"NCID"}]},"item_4_textarea_12":{"attribute_name":"Notice","attribute_value_mlt":[{"subitem_textarea_value":"SIG Technical Reports are nonrefereed and hence may later appear in any journals, conferences, symposia, etc."}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourceuri":"http://purl.org/coar/resource_type/c_18gh","resourcetype":"technical report"}]},"item_4_description_7":{"attribute_name":"論文抄録","attribute_value_mlt":[{"subitem_description":"近年のトランジスタ製造プロセスの微細化によって，トランジスタの故障率の増加が無視できない問題となっている．故障率の増加を抑える手法として，我々はトランジスタが規則的に配置されたセルを提案した．このセルはPMOSとNMOSを組み合わせたものを基本単位として構成されている．我々の提案したセルは，従来のセルに比べて壊れにくく，また故障を検出する機能を備えている．本論文ではこのセルで構成された演算器の提案および評価を行った．提案した演算器は，従来のセルで構成された演算器とトランジスタ数がほぼ同等でありながら，耐故障性に優れていることが分かった．　　","subitem_description_type":"Other"}]},"item_4_description_8":{"attribute_name":"論文抄録(英)","attribute_value_mlt":[{"subitem_description":"Recently, the shrinking process causes growth of error rate. We have proposed new standard cells in which transistors are arranged regularly in order to reduce errors. These cells are composed of pairs of PMOS and NMOS. The proposed cells are more robust against transistor faults and can also detect them. In this paper, we propose and evaluate a functional unit that is composed of the proposed cells. The number of transistors in our proposed functional unit is comparable that by traditional cells. Moreover our proposed functional unit has better fault tolerance.","subitem_description_type":"Other"}]},"item_4_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicPageEnd":"172","bibliographic_titles":[{"bibliographic_title":"情報処理学会研究報告システムLSI設計技術（SLDM）"}],"bibliographicPageStart":"167","bibliographicIssueDates":{"bibliographicIssueDate":"2008-03-28","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"32(2008-SLDM-134)","bibliographicVolumeNumber":"2008"}]},"relation_version_is_last":true,"weko_creator_id":"1"},"id":26827,"updated":"2025-01-22T18:50:56.487793+00:00","links":{},"created":"2025-01-18T22:57:20.612904+00:00"}