{"id":26741,"updated":"2025-01-22T18:52:13.429084+00:00","links":{},"created":"2025-01-18T22:57:16.818940+00:00","metadata":{"_oai":{"id":"oai:ipsj.ixsq.nii.ac.jp:00026741","sets":["1164:2036:2037:2038"]},"path":["2038"],"owner":"1","recid":"26741","title":["TEGチップを用いたオープン故障の解析"],"pubdate":{"attribute_name":"公開日","attribute_value":"2008-11-10"},"_buckets":{"deposit":"dfe75230-b4c1-4e05-b64c-8edf6b4eeb05"},"_deposit":{"id":"26741","pid":{"type":"depid","value":"26741","revision_id":0},"owners":[1],"status":"published","created_by":1},"item_title":"TEGチップを用いたオープン故障の解析","author_link":["0","0"],"item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"TEGチップを用いたオープン故障の解析"},{"subitem_title":"Analysis of Open Faults using TEG Chip","subitem_title_language":"en"}]},"item_type_id":"4","publish_date":"2008-11-10","item_4_text_3":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"明治大学大学院理工学研究科"},{"subitem_text_value":"明治大学大学院理工学研究科"},{"subitem_text_value":"明治大学情報コミュニケーション学部"},{"subitem_text_value":"徳島大学大学院ソシオテクノサイエンス研究部"},{"subitem_text_value":"徳島大学大学院ソシオテクノサイエンス研究部"},{"subitem_text_value":"愛媛大学大学院理工学研究科"},{"subitem_text_value":"愛媛大学大学院理工学研究科"},{"subitem_text_value":"愛媛大学大学院理工学研究科"}]},"item_4_text_4":{"attribute_name":"著者所属(英)","attribute_value_mlt":[{"subitem_text_value":"Graduate School of Science and Technology, Meiji University","subitem_text_language":"en"},{"subitem_text_value":"Graduate School of Science and Technology, Meiji University","subitem_text_language":"en"},{"subitem_text_value":"School of Information and Communication, Meiji University","subitem_text_language":"en"},{"subitem_text_value":"Institute of Technology and Science, the University of Tokushima","subitem_text_language":"en"},{"subitem_text_value":"Institute of Technology and Science, the University of Tokushima","subitem_text_language":"en"},{"subitem_text_value":"Graduate School of Science and Engineering, Ehime University","subitem_text_language":"en"},{"subitem_text_value":"Graduate School of Science and Engineering, Ehime University","subitem_text_language":"en"},{"subitem_text_value":"Graduate School of Science and Engineering, Ehime University","subitem_text_language":"en"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_publisher":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"情報処理学会","subitem_publisher_language":"ja"}]},"publish_status":"0","weko_shared_id":-1,"item_file_price":{"attribute_name":"Billing file","attribute_type":"file","attribute_value_mlt":[{"url":{"url":"https://ipsj.ixsq.nii.ac.jp/record/26741/files/IPSJ-SLDM08137004.pdf"},"date":[{"dateType":"Available","dateValue":"2010-11-10"}],"format":"application/pdf","billing":["billing_file"],"filename":"IPSJ-SLDM08137004.pdf","filesize":[{"value":"1.0 MB"}],"mimetype":"application/pdf","priceinfo":[{"tax":["include_tax"],"price":"660","billingrole":"5"},{"tax":["include_tax"],"price":"330","billingrole":"6"},{"tax":["include_tax"],"price":"0","billingrole":"10"},{"tax":["include_tax"],"price":"0","billingrole":"44"}],"accessrole":"open_date","version_id":"2cc0ea30-a1dc-4d53-ae14-5442af87ff39","displaytype":"detail","licensetype":"license_note","license_note":"Copyright (c) 2008 by the Information Processing Society of Japan"}]},"item_4_creator_5":{"attribute_name":"著者名","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"堤, 利幸"},{"creatorName":"刈谷, 泰由紀"},{"creatorName":"山崎, 浩二"},{"creatorName":"橋爪, 正樹"},{"creatorName":"四柳, 浩之"},{"creatorName":"高橋, 寛"},{"creatorName":"樋上, 喜信"},{"creatorName":"高松, 雄三"}],"nameIdentifiers":[{}]}]},"item_4_creator_6":{"attribute_name":"著者名(英)","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Toshiyuki, Tsutsumi","creatorNameLang":"en"},{"creatorName":"Yasuyuki, Kariya","creatorNameLang":"en"},{"creatorName":"Koji, Yamazaki","creatorNameLang":"en"},{"creatorName":"Masaki, Hashizume","creatorNameLang":"en"},{"creatorName":"Hiroyuki, Yotsuyanagi","creatorNameLang":"en"},{"creatorName":"Hiroshi, Takahashi","creatorNameLang":"en"},{"creatorName":"Yoshinobu, Higami","creatorNameLang":"en"},{"creatorName":"Yuzo, Takamatsu","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_4_source_id_9":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA11451459","subitem_source_identifier_type":"NCID"}]},"item_4_textarea_12":{"attribute_name":"Notice","attribute_value_mlt":[{"subitem_textarea_value":"SIG Technical Reports are nonrefereed and hence may later appear in any journals, conferences, symposia, etc."}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourceuri":"http://purl.org/coar/resource_type/c_18gh","resourcetype":"technical report"}]},"item_4_description_7":{"attribute_name":"論文抄録","attribute_value_mlt":[{"subitem_description":"半導体技術の高集積化が進み LSI の故障検出や故障診断が難しくなってきている．特に，オープン故障への対策は LSI の微細化に伴いますます重要となってきているが，オープン故障の実用的なモデル化はいまだなされていない．そこで，我々はオープン故障を組み込んだ TEG (Test Element Group ) チップを作製し，その測定データに基づいたオープン故障のモデル化に取り組んでいる．本研究では，TEG チップの測定データの解析を行い，実チップ中の近接する信号線がオープン故障の信号線に実際にどのような影響を及ぼしているかについて報告する．","subitem_description_type":"Other"}]},"item_4_description_8":{"attribute_name":"論文抄録(英)","attribute_value_mlt":[{"subitem_description":"The high integration of the semiconductor technology advances, and the fault detection and the failure diagnosis of LSI become difficult. Especially, a practicable modeling of an open fault has not been performed yet, though measures against the open fault become important more with advancement of LSI process technology. So, we have fabricated TEG (Test Element Group) chips into which open defects is intentionally built, and then we research on modeling the open fault based on the measurement data of the TEG chips. In this paper, the measurement data of the TEG chip is analyzed, and we report how influence a logical value of a faulty signal line with full open defect actually depend on those of the adjacent signal lines in the real chip.","subitem_description_type":"Other"}]},"item_4_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicPageEnd":"24","bibliographic_titles":[{"bibliographic_title":"情報処理学会研究報告システムLSI設計技術（SLDM）"}],"bibliographicPageStart":"19","bibliographicIssueDates":{"bibliographicIssueDate":"2008-11-10","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"111(2008-SLDM-137)","bibliographicVolumeNumber":"2008"}]},"relation_version_is_last":true,"weko_creator_id":"1"}}