{"updated":"2025-02-21T02:11:50.154036+00:00","metadata":{"_oai":{"id":"oai:ipsj.ixsq.nii.ac.jp:00240750","sets":["6164:6165:6462:11854"]},"path":["11854"],"owner":"11","recid":"240750","title":["ETSI TS 103 701に基づくLLMを用いたセキュリティテストの該非判定"],"pubdate":{"attribute_name":"PubDate","attribute_value":"2024-10-15"},"_buckets":{"deposit":"aa5fd545-4c95-4ee0-8b79-034e4a538361"},"_deposit":{"id":"240750","pid":{"type":"depid","value":"240750","revision_id":0},"owners":[11],"status":"published","created_by":11},"item_title":"ETSI TS 103 701に基づくLLMを用いたセキュリティテストの該非判定","author_link":["661042","661043","661044","661045","661046","661047","661048","661049","661050","661051","661052","661053"],"item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"ETSI TS 103 701に基づくLLMを用いたセキュリティテストの該非判定","subitem_title_language":"ja"},{"subitem_title":"Prioritizing Security Tests Using LLM Based on ETSI TS 103 701","subitem_title_language":"en"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"IoT デバイス，脆弱性検査，大規模言語モデル，RAG (Retrieval Augmented Generation)，ETSI TS 103 701","subitem_subject_scheme":"Other"}]},"item_type_id":"18","publish_date":"2024-10-15","item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_18_text_3":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"早稲田大学"},{"subitem_text_value":"株式会社KDDI総合研究所"},{"subitem_text_value":"株式会社KDDI総合研究所"},{"subitem_text_value":"株式会社KDDI総合研究所"},{"subitem_text_value":"早稲田大学"},{"subitem_text_value":"早稲田大学"}]},"item_18_text_4":{"attribute_name":"著者所属(英)","attribute_value_mlt":[{"subitem_text_value":"Waseda University","subitem_text_language":"en"},{"subitem_text_value":"KDDI Research, Inc.","subitem_text_language":"en"},{"subitem_text_value":"KDDI Research, Inc.","subitem_text_language":"en"},{"subitem_text_value":"KDDI Research, Inc.","subitem_text_language":"en"},{"subitem_text_value":"Waseda University","subitem_text_language":"en"},{"subitem_text_value":"Waseda University","subitem_text_language":"en"}]},"item_publisher":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"情報処理学会","subitem_publisher_language":"ja"}]},"publish_status":"0","weko_shared_id":-1,"item_file_price":{"attribute_name":"Billing file","attribute_type":"file","attribute_value_mlt":[{"url":{"url":"https://ipsj.ixsq.nii.ac.jp/record/240750/files/IPSJ-CSS2024004.pdf","label":"IPSJ-CSS2024004.pdf"},"date":[{"dateType":"Available","dateValue":"2026-10-15"}],"format":"application/pdf","billing":["billing_file"],"filename":"IPSJ-CSS2024004.pdf","filesize":[{"value":"528.7 kB"}],"mimetype":"application/pdf","priceinfo":[{"tax":["include_tax"],"price":"660","billingrole":"5"},{"tax":["include_tax"],"price":"330","billingrole":"6"},{"tax":["include_tax"],"price":"0","billingrole":"30"},{"tax":["include_tax"],"price":"0","billingrole":"46"},{"tax":["include_tax"],"price":"0","billingrole":"44"}],"accessrole":"open_date","version_id":"97ad3d09-183a-4cff-9f46-49cbdf489cd9","displaytype":"detail","licensetype":"license_note","license_note":"Copyright (c) 2024 by the Information Processing Society of Japan"}]},"item_18_creator_5":{"attribute_name":"著者名","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"池上, 裕香"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"長谷川, 健人"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"披田野, 清良"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"福島, 和英"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"橋本, 和夫"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"戸川, 望"}],"nameIdentifiers":[{}]}]},"item_18_creator_6":{"attribute_name":"著者名(英)","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Yuka, Ikegami","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Kento, Hasegawa","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Seira, Hidano","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Kazuhide, Fukushima","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Kazuo, Hashimoto","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Nozomu, Togawa","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourceuri":"http://purl.org/coar/resource_type/c_5794","resourcetype":"conference paper"}]},"item_18_description_7":{"attribute_name":"論文抄録","attribute_value_mlt":[{"subitem_description":"近年，IoTデバイスの脆弱性検査の自動化が期待されるが，多種多様なIoTデバイスにとって機械的に検査項目を設定することは難しい．我々は大規模言語モデル (LLM)を用いた検査項目の該非判定手法を提案しており， JPCERT/CCが公開しているIoTセキュリティチェックリストを通してその有効性を確認している．国際的に用いられるテスト仕様として，消費者向けIoTデバイスに適用されるセキュリティ規定が定められた欧州規格ETSI EN 303 645に基づいて作成されたETSI TS 103 701がある．本稿では，LLMを用いた検査項目の該非判定手法にETSI TS 103 701を適用し評価する．提案手法によりETSI TS 103 701における各テストグループの該非を判定した結果，提案手法はチェックリストとしてETSI TS 103 701を適用した場合でも検査対象デバイスの仕様に適したテストグループの該非を判定することを確認した．","subitem_description_type":"Other"}]},"item_18_description_8":{"attribute_name":"論文抄録(英)","attribute_value_mlt":[{"subitem_description":"In this paper, we apply ETSI TS 103 701 to a method for determining the suitability of vulnerability assessment items using LLMs. As a result, it is confirmed that we can successfully determine the suitability of each test group in ETSI TS 103 701.","subitem_description_type":"Other"}]},"item_18_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicPageEnd":"31","bibliographic_titles":[{"bibliographic_title":"コンピュータセキュリティシンポジウム2024論文集"}],"bibliographicPageStart":"24","bibliographicIssueDates":{"bibliographicIssueDate":"2024-10-15","bibliographicIssueDateType":"Issued"}}]},"relation_version_is_last":true,"weko_creator_id":"11"},"created":"2025-01-19T01:45:06.955331+00:00","id":240750,"links":{}}