{"metadata":{"_oai":{"id":"oai:ipsj.ixsq.nii.ac.jp:00240520","sets":["1164:2036:11466:11785"]},"path":["11785"],"owner":"44499","recid":"240520","title":["2スピン同時フリップの並列試行により高効率な解探索を行うアニーリングプロセッサ"],"pubdate":{"attribute_name":"公開日","attribute_value":"2024-11-05"},"_buckets":{"deposit":"fb14bc84-24d9-40d6-a833-ffd8f3128101"},"_deposit":{"id":"240520","pid":{"type":"depid","value":"240520","revision_id":0},"owners":[44499],"status":"published","created_by":44499},"item_title":"2スピン同時フリップの並列試行により高効率な解探索を行うアニーリングプロセッサ","author_link":["659976","659973","659971","659977","659974","659975","659972"],"item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"2スピン同時フリップの並列試行により高効率な解探索を行うアニーリングプロセッサ"}]},"item_type_id":"4","publish_date":"2024-11-05","item_4_text_3":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"東京科学大学"},{"subitem_text_value":"東京科学大学"},{"subitem_text_value":"東京科学大学"},{"subitem_text_value":"東京科学大学"},{"subitem_text_value":"東京科学大学"},{"subitem_text_value":"東京科学大学"},{"subitem_text_value":"東京科学大学"}]},"item_4_text_4":{"attribute_name":"著者所属(英)","attribute_value_mlt":[{"subitem_text_value":"Institute 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倍程度高速に得られることを確認した.","subitem_description_type":"Other"}]},"item_4_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicPageEnd":"6","bibliographic_titles":[{"bibliographic_title":"研究報告システムとLSIの設計技術(SLDM)"}],"bibliographicPageStart":"1","bibliographicIssueDates":{"bibliographicIssueDate":"2024-11-05","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"38","bibliographicVolumeNumber":"2024-SLDM-207"}]},"relation_version_is_last":true,"weko_creator_id":"44499"},"id":240520,"updated":"2025-01-19T07:57:14.626636+00:00","links":{},"created":"2025-01-19T01:44:45.389748+00:00"}