{"links":{},"metadata":{"_oai":{"id":"oai:ipsj.ixsq.nii.ac.jp:00240471","sets":["1164:2036:11466:11784"]},"path":["11784"],"owner":"44499","recid":"240471","title":["2入力と4入力の論理ゲートで構成されたリングオシレータを用いた経年劣化測定のための検討"],"pubdate":{"attribute_name":"公開日","attribute_value":"2024-10-31"},"_buckets":{"deposit":"0471b18f-19ab-44d5-8ed6-f05c6ea955dd"},"_deposit":{"id":"240471","pid":{"type":"depid","value":"240471","revision_id":0},"owners":[44499],"status":"published","created_by":44499},"item_title":"2入力と4入力の論理ゲートで構成されたリングオシレータを用いた経年劣化測定のための検討","author_link":["659729","659728"],"item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"2入力と4入力の論理ゲートで構成されたリングオシレータを用いた経年劣化測定のための検討"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"ポスター","subitem_subject_scheme":"Other"}]},"item_type_id":"4","publish_date":"2024-10-31","item_4_text_3":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"富山県立大学工学部電気電子工学科"},{"subitem_text_value":"富山県立大学工学部電気電子工学科"}]},"item_4_text_4":{"attribute_name":"著者所属(英)","attribute_value_mlt":[{"subitem_text_value":"Department of Electrical and Electronic Engineering, Faculty of Engineering, Toyama Prefectural University","subitem_text_language":"en"},{"subitem_text_value":"Department of Electrical and Electronic Engineering, Faculty of Engineering, Toyama Prefectural University","subitem_text_language":"en"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_publisher":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"情報処理学会","subitem_publisher_language":"ja"}]},"publish_status":"0","weko_shared_id":-1,"item_file_price":{"attribute_name":"Billing file","attribute_type":"file","attribute_value_mlt":[{"url":{"url":"https://ipsj.ixsq.nii.ac.jp/record/240471/files/IPSJ-SLDM24206004.pdf","label":"IPSJ-SLDM24206004.pdf"},"date":[{"dateType":"Available","dateValue":"2026-10-31"}],"format":"application/pdf","billing":["billing_file"],"filename":"IPSJ-SLDM24206004.pdf","filesize":[{"value":"923.4 kB"}],"mimetype":"application/pdf","priceinfo":[{"tax":["include_tax"],"price":"660","billingrole":"5"},{"tax":["include_tax"],"price":"330","billingrole":"6"},{"tax":["include_tax"],"price":"0","billingrole":"10"},{"tax":["include_tax"],"price":"0","billingrole":"44"}],"accessrole":"open_date","version_id":"d99a875f-61b8-4beb-8a61-85d7b83b3fca","displaytype":"detail","licensetype":"license_note","license_note":"Copyright (c) 2024 by the Information Processing Society of Japan"}]},"item_4_creator_5":{"attribute_name":"著者名","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"杉本, 太郎"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"岸田, 亮"}],"nameIdentifiers":[{}]}]},"item_4_source_id_9":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA11451459","subitem_source_identifier_type":"NCID"}]},"item_4_textarea_12":{"attribute_name":"Notice","attribute_value_mlt":[{"subitem_textarea_value":"SIG Technical Reports are nonrefereed and hence may later appear in any journals, conferences, symposia, etc."}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourceuri":"http://purl.org/coar/resource_type/c_18gh","resourcetype":"technical report"}]},"item_4_source_id_11":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"2188-8639","subitem_source_identifier_type":"ISSN"}]},"item_4_description_7":{"attribute_name":"論文抄録","attribute_value_mlt":[{"subitem_description":"MOSFET の信頼性における問題の 1 つであるバイアス温度不安定性 (Bias Temperature Instability，BTI) は，MOSFET のゲート酸化膜に電圧を印加することで，チャネルに誘起される電荷量が少なくなり，動作電流の減少やしきい値の劣化が起こる現象である．さらに BTI による劣化はストレスがないときには回復する．この現象を回路レベルで評価をするために，2 入力と 4 入力の論理ゲートを用いたリングオシレータの発振回数を測定し，発振周波数の劣化率を評価する．本回路を用いた測定により，PMOS と NMOS それぞれの BTI による劣化度合いとしきい値の変化を求めることができ，回路レベルでの評価ができる．現時点では測定用の回路基板作成が完了し，本測定に向けて制御信号記述などの準備を行っている．","subitem_description_type":"Other"}]},"item_4_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicPageEnd":"3","bibliographic_titles":[{"bibliographic_title":"研究報告システムとLSIの設計技術（SLDM）"}],"bibliographicPageStart":"1","bibliographicIssueDates":{"bibliographicIssueDate":"2024-10-31","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"4","bibliographicVolumeNumber":"2024-SLDM-206"}]},"relation_version_is_last":true,"weko_creator_id":"44499"},"created":"2025-01-19T01:44:40.771043+00:00","updated":"2025-01-19T07:58:11.682009+00:00","id":240471}