{"updated":"2025-01-19T08:17:41.956535+00:00","metadata":{"_oai":{"id":"oai:ipsj.ixsq.nii.ac.jp:00239381","sets":["581:11492:11502"]},"path":["11502"],"owner":"44499","recid":"239381","title":["実行経路に基づく欠陥限局手法において例外処理を検査するテストが及ぼす影響の調査"],"pubdate":{"attribute_name":"公開日","attribute_value":"2024-09-15"},"_buckets":{"deposit":"5aa59754-2603-4ccf-bbc0-50a47a2fbf6b"},"_deposit":{"id":"239381","pid":{"type":"depid","value":"239381","revision_id":0},"owners":[44499],"status":"published","created_by":44499},"item_title":"実行経路に基づく欠陥限局手法において例外処理を検査するテストが及ぼす影響の調査","author_link":["656160","656157","656156","656154","656162","656164","656165","656159","656155","656161","656163","656158"],"item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"実行経路に基づく欠陥限局手法において例外処理を検査するテストが及ぼす影響の調査"},{"subitem_title":"Investigation on Impact of Exceptional Behavior Testing on Spectrum-Based Fault Localization","subitem_title_language":"en"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"[一般論文] Spectrum-Based Fault Localization，例外処理，ソフトウェアテスト，デバッグ","subitem_subject_scheme":"Other"}]},"item_type_id":"2","publish_date":"2024-09-15","item_2_text_3":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"大阪大学大学院情報科学研究科"},{"subitem_text_value":"大阪大学大学院情報科学研究科"},{"subitem_text_value":"大阪大学大学院情報科学研究科"},{"subitem_text_value":"大阪大学大学院情報科学研究科"},{"subitem_text_value":"日立製作所"},{"subitem_text_value":"日立製作所"}]},"item_2_text_4":{"attribute_name":"著者所属(英)","attribute_value_mlt":[{"subitem_text_value":"Graduate School of Information Science and Technology, Osaka University","subitem_text_language":"en"},{"subitem_text_value":"Graduate School of Information Science and Technology, Osaka University","subitem_text_language":"en"},{"subitem_text_value":"Graduate School of Information Science and Technology, Osaka University","subitem_text_language":"en"},{"subitem_text_value":"Graduate School of Information Science and Technology, Osaka University","subitem_text_language":"en"},{"subitem_text_value":"Hitachi, Ltd.","subitem_text_language":"en"},{"subitem_text_value":"Hitachi, Ltd.","subitem_text_language":"en"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"publish_status":"0","weko_shared_id":-1,"item_file_price":{"attribute_name":"Billing file","attribute_type":"file","attribute_value_mlt":[{"url":{"url":"https://ipsj.ixsq.nii.ac.jp/record/239381/files/IPSJ-JNL6509027.pdf","label":"IPSJ-JNL6509027.pdf"},"date":[{"dateType":"Available","dateValue":"2026-09-15"}],"format":"application/pdf","billing":["billing_file"],"filename":"IPSJ-JNL6509027.pdf","filesize":[{"value":"1.8 MB"}],"mimetype":"application/pdf","priceinfo":[{"tax":["include_tax"],"price":"660","billingrole":"5"},{"tax":["include_tax"],"price":"330","billingrole":"6"},{"tax":["include_tax"],"price":"0","billingrole":"8"},{"tax":["include_tax"],"price":"0","billingrole":"44"}],"accessrole":"open_date","version_id":"42b1bbe2-f76d-4acd-a92a-c081abc5970a","displaytype":"detail","licensetype":"license_note","license_note":"Copyright (c) 2024 by the Information Processing Society of Japan"}]},"item_2_creator_5":{"attribute_name":"著者名","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"吉岡, 遼"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"肥後, 芳樹"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"柗本, 真佑"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"楠本, 真二"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"伊藤, 信治"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"張潘, タンフエン"}],"nameIdentifiers":[{}]}]},"item_2_creator_6":{"attribute_name":"著者名(英)","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Haruka, Yoshioka","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Yoshiki, Higo","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Shinsuke, Matsumoto","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Shinji, Kusumoto","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Shinji, Ito","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Truong, Phan Thanh Huyen","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_2_source_id_9":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AN00116647","subitem_source_identifier_type":"NCID"}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourceuri":"http://purl.org/coar/resource_type/c_6501","resourcetype":"journal article"}]},"item_2_publisher_15":{"attribute_name":"公開者","attribute_value_mlt":[{"subitem_publisher":"情報処理学会","subitem_publisher_language":"ja"}]},"item_2_source_id_11":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"1882-7764","subitem_source_identifier_type":"ISSN"}]},"item_2_description_7":{"attribute_name":"論文抄録","attribute_value_mlt":[{"subitem_description":"ソフトウェア開発において，デバッグ作業は多大なコストを要する．計算機によるデバッグ作業の支援により，デバッグコストの削減が期待される．デバッグ作業を支援する技術の1つに，欠陥限局と呼ばれる技術がある．これまでに数多くの欠陥限局手法が提案されており，中でも実行経路に基づく欠陥限局手法（Spectrum-Based Fault Localization，SBFL）が注目を集める．SBFLは，欠陥を含むプログラムとそのテストケースの集合を与えると，欠陥箇所を推定し出力する．これまでの研究により，SBFLは与えるテストケースによって欠陥限局の正確さに差異が生じることが示唆されている．本研究では，例外処理を検査するテストケースに着目し，これらがSBFLの正確さに与える影響を調査する．例外処理は通常の制御フローと切り離されるため，例外処理を検査するテストケースと通常の制御フローを検査するテストケースでは実行経路が異なり，SBFLの正確さに大きな影響を与えると考えたためである．実際の開発過程で生じた欠陥とミューテーションツールで人工的に生成した欠陥を対象に調査し，失敗したテストケースがすべて例外処理を検査するテストケースの場合，SBFLの結果は信頼できる傾向にあることを確認した．","subitem_description_type":"Other"}]},"item_2_description_8":{"attribute_name":"論文抄録(英)","attribute_value_mlt":[{"subitem_description":"Debugging is a heavy task in software development. Computer-assisted debugging is expected to reduce these costs. Spectrum-Based Fault Localization (SBFL) is one of the most actively studied computer-assisted debugging techniques. SBFL aims to identify the location of faulty code elements based on the execution paths of test cases. Previous research reports that the accuracy of SBFL is affected by test types, such as flaky test cases. Our research focuses on exceptional behavior tests to reveal the impact of such tests on SBFL. Since separating exceptional handling from normal control flow enables developers to increase program robustness, we think the execution paths of exceptional behavior tests are different from the ones of normal control flow tests, which means that the differences significantly affect the accuracy of SBFL. In this study, we investigated the accuracy of SBFL on two types of faults: faults that occurred in the real software development process and artificially generated faults. As a result, our study reveals that SBFL tends to be more accurate when all failing test cases are exceptional behavior tests than when failing test cases include no exceptional behavior tests.","subitem_description_type":"Other"}]},"item_2_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicPageEnd":"1422","bibliographic_titles":[{"bibliographic_title":"情報処理学会論文誌"}],"bibliographicPageStart":"1411","bibliographicIssueDates":{"bibliographicIssueDate":"2024-09-15","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"9","bibliographicVolumeNumber":"65"}]},"relation_version_is_last":true,"item_2_identifier_registration":{"attribute_name":"ID登録","attribute_value_mlt":[{"subitem_identifier_reg_text":"10.20729/00239261","subitem_identifier_reg_type":"JaLC"}]},"weko_creator_id":"44499"},"created":"2025-01-19T01:42:59.812777+00:00","id":239381,"links":{}}