{"created":"2025-01-19T01:41:22.173660+00:00","updated":"2025-01-19T08:37:25.620347+00:00","metadata":{"_oai":{"id":"oai:ipsj.ixsq.nii.ac.jp:00238252","sets":["6164:6165:7651:11699"]},"path":["11699"],"owner":"44499","recid":"238252","title":["65nmバルクプロセスのリングオシレータを用いた経年劣化のストレス電圧依存性の実測評価"],"pubdate":{"attribute_name":"公開日","attribute_value":"2024-08-21"},"_buckets":{"deposit":"89e24831-6b1f-4b0f-9632-c8ca0ef0bf4c"},"_deposit":{"id":"238252","pid":{"type":"depid","value":"238252","revision_id":0},"owners":[44499],"status":"published","created_by":44499},"item_title":"65nmバルクプロセスのリングオシレータを用いた経年劣化のストレス電圧依存性の実測評価","author_link":["652351","652352","652356","652350","652358","652353","652359","652357","652355","652354"],"item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"65nmバルクプロセスのリングオシレータを用いた経年劣化のストレス電圧依存性の実測評価"},{"subitem_title":"Measurement of Bias Temperature Instability Dependence on Stress-voltage Using Ring Oscillators in a 65 nm Bulk Processes","subitem_title_language":"en"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"ポスター","subitem_subject_scheme":"Other"}]},"item_type_id":"18","publish_date":"2024-08-21","item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_18_text_3":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"京都工芸繊維大学電子システム工学専攻"},{"subitem_text_value":"京都工芸繊維大学電子システム工学専攻"},{"subitem_text_value":"京都工芸繊維大学電子システム工学専攻"},{"subitem_text_value":"富山県立大学"},{"subitem_text_value":"京都工芸繊維大学電子システム工学専攻"}]},"item_18_text_4":{"attribute_name":"著者所属(英)","attribute_value_mlt":[{"subitem_text_value":"Department of Electronics, Kyoto Institute of Technology","subitem_text_language":"en"},{"subitem_text_value":"Department of Electronics, Kyoto Institute of Technology","subitem_text_language":"en"},{"subitem_text_value":"Department of Electronics, Kyoto Institute of Technology","subitem_text_language":"en"},{"subitem_text_value":"Toyama Prefectural University","subitem_text_language":"en"},{"subitem_text_value":"Department of Electronics, Kyoto Institute of Technology","subitem_text_language":"en"}]},"item_publisher":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"情報処理学会","subitem_publisher_language":"ja"}]},"publish_status":"0","weko_shared_id":-1,"item_file_price":{"attribute_name":"Billing file","attribute_type":"file","attribute_value_mlt":[{"url":{"url":"https://ipsj.ixsq.nii.ac.jp/record/238252/files/IPSJ-DAS2024028.pdf","label":"IPSJ-DAS2024028.pdf"},"date":[{"dateType":"Available","dateValue":"2026-08-21"}],"format":"application/pdf","billing":["billing_file"],"filename":"IPSJ-DAS2024028.pdf","filesize":[{"value":"1.7 MB"}],"mimetype":"application/pdf","priceinfo":[{"tax":["include_tax"],"price":"660","billingrole":"5"},{"tax":["include_tax"],"price":"330","billingrole":"6"},{"tax":["include_tax"],"price":"0","billingrole":"10"},{"tax":["include_tax"],"price":"0","billingrole":"44"}],"accessrole":"open_date","version_id":"ec2e053a-c22d-4536-a7dd-cae47bc9292f","displaytype":"detail","licensetype":"license_note","license_note":"Copyright (c) 2024 by the Information Processing Society of Japan"}]},"item_18_creator_5":{"attribute_name":"著者名","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"仁科, 拓巳"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"木下, 友晴"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"菊田, 大輔"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"岸田, 亮"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"小林, 和淑"}],"nameIdentifiers":[{}]}]},"item_18_creator_6":{"attribute_name":"著者名(英)","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Takumi, Nishina","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Tomoharu, Kishita","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Daisuke, Kikuta","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Ryo, Kishida","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Kazutoshi, Kobayashi","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourceuri":"http://purl.org/coar/resource_type/c_5794","resourcetype":"conference paper"}]},"item_18_description_7":{"attribute_name":"論文抄録","attribute_value_mlt":[{"subitem_description":"集積回路の微細化によってトランジスタの経年劣化現象の 1 つである BTI (Bias Temperature Instability) が顕在化している．65nm バルクプロセスで試作した BTI 評価用リングオシレータ (RO) を用いて，BTI による長期間の経年劣化現象の実測評価を行った．評価回路は同一の回路によって NBTI 発生型，PBTI 発生型と MOSFET にストレスを与えない NO-STRESS 型を用いた．ストレス電圧を変更して測定することにより，BTI のストレス電圧依存性を評価した．実測結果から，ストレス電圧を上げたときの測定では従来の試験と同様に NBTI による劣化が支配的となったが，ストレス電圧を標準電圧まで下げた測定では従来の結果と異なり NBTI による劣化が小さくなり，PBTI による劣化が支配的となる結果が得られる場合があった．","subitem_description_type":"Other"}]},"item_18_description_8":{"attribute_name":"論文抄録(英)","attribute_value_mlt":[{"subitem_description":"Miniaturization of integrated circuits has led to transistor's aging degradation such as BTI (Bias Temperature Instability). We measured and evaluated long-term aging degradation with BTI using ring oscillators (RO) to measure BTI-induced degradations fabricated in a 65 nm bulk process. Using this circuits we can measure transistor's degradation caused by NBTI and PBTI. We measured stress-voltage dependence of BTI-induced degradations. As a result of the measurement, when stress-voltage rises, the degradation caused by NBTI became dominant, which is same results as for conventional measurements. On the other hand, when lowering stress-voltage to standard voltage, the degradation coused by NBTI became smaller, while the degradation caused by PBTI became dominant.","subitem_description_type":"Other"}]},"item_18_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicPageEnd":"183","bibliographic_titles":[{"bibliographic_title":"DAシンポジウム2024論文集"}],"bibliographicPageStart":"177","bibliographicIssueDates":{"bibliographicIssueDate":"2024-08-21","bibliographicIssueDateType":"Issued"},"bibliographicVolumeNumber":"2024"}]},"relation_version_is_last":true,"weko_creator_id":"44499"},"id":238252,"links":{}}