{"created":"2025-01-19T01:41:21.794579+00:00","updated":"2025-01-19T08:37:31.546932+00:00","metadata":{"_oai":{"id":"oai:ipsj.ixsq.nii.ac.jp:00238248","sets":["6164:6165:7651:11699"]},"path":["11699"],"owner":"44499","recid":"238248","title":["改良型SEILA(ソフトエラー耐性ラッチ)のα線による耐性評価"],"pubdate":{"attribute_name":"公開日","attribute_value":"2024-08-21"},"_buckets":{"deposit":"b49ff657-680e-48bd-bcb5-4874c8a4213c"},"_deposit":{"id":"238248","pid":{"type":"depid","value":"238248","revision_id":0},"owners":[44499],"status":"published","created_by":44499},"item_title":"改良型SEILA(ソフトエラー耐性ラッチ)のα線による耐性評価","author_link":["652340","652336","652339","652337","652342","652334","652335","652341","652338","652333"],"item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"改良型SEILA(ソフトエラー耐性ラッチ)のα線による耐性評価"},{"subitem_title":"Improved SEILA (Soft Error Immune Latch) Tolerance evaluation by α radiation","subitem_title_language":"en"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"信頼性","subitem_subject_scheme":"Other"}]},"item_type_id":"18","publish_date":"2024-08-21","item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_18_text_3":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"京都工芸繊維大学電子システム工学専攻"},{"subitem_text_value":"京都工芸繊維大学電子システム工学専攻"},{"subitem_text_value":"京都工芸繊維大学電子システム工学専攻"},{"subitem_text_value":"岡山県立大学情報工学部情報通信工学科"},{"subitem_text_value":"京都工芸繊維大学電子システム工学専攻"}]},"item_18_text_4":{"attribute_name":"著者所属(英)","attribute_value_mlt":[{"subitem_text_value":"Department of Electronics, Kyoto Institute of Technology","subitem_text_language":"en"},{"subitem_text_value":"Department of Electronics, Kyoto Institute of Technology","subitem_text_language":"en"},{"subitem_text_value":"Department of Electronics, Kyoto Institute of Technology","subitem_text_language":"en"},{"subitem_text_value":"Department of Information and Communication Engineering, Okayama Prefectural University","subitem_text_language":"en"},{"subitem_text_value":"Department of Electronics, Kyoto Institute of Technology","subitem_text_language":"en"}]},"item_publisher":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"情報処理学会","subitem_publisher_language":"ja"}]},"publish_status":"0","weko_shared_id":-1,"item_file_price":{"attribute_name":"Billing file","attribute_type":"file","attribute_value_mlt":[{"url":{"url":"https://ipsj.ixsq.nii.ac.jp/record/238248/files/IPSJ-DAS2024024.pdf","label":"IPSJ-DAS2024024.pdf"},"date":[{"dateType":"Available","dateValue":"2026-08-21"}],"format":"application/pdf","billing":["billing_file"],"filename":"IPSJ-DAS2024024.pdf","filesize":[{"value":"4.5 MB"}],"mimetype":"application/pdf","priceinfo":[{"tax":["include_tax"],"price":"660","billingrole":"5"},{"tax":["include_tax"],"price":"330","billingrole":"6"},{"tax":["include_tax"],"price":"0","billingrole":"10"},{"tax":["include_tax"],"price":"0","billingrole":"44"}],"accessrole":"open_date","version_id":"68cb34f7-1ac6-4f00-a199-ac5b299da433","displaytype":"detail","licensetype":"license_note","license_note":"Copyright (c) 2024 by the Information Processing Society of Japan"}]},"item_18_creator_5":{"attribute_name":"著者名","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"吉田, 圭汰"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"杉崎, 春斗"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"中島, 隆一"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"古田, 潤"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"小林, 和淑"}],"nameIdentifiers":[{}]}]},"item_18_creator_6":{"attribute_name":"著者名(英)","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Keita, Yoshida","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Haruto, Sugisaki","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Ryuichi, Nakajima","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Jun, Furuta","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Kazutoshi, Kobayashi","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourceuri":"http://purl.org/coar/resource_type/c_5794","resourcetype":"conference paper"}]},"item_18_description_7":{"attribute_name":"論文抄録","attribute_value_mlt":[{"subitem_description":"集積回路の微細化に伴い，信頼性の低下が問題となっている．信頼性低下の一因としてソフトエラーが挙げられる．本研究では，先行研究で提案されているソフトエラー耐性ラッチのソフトエラー耐性評価を行う．その結果をもとに，改良型ラッチとそれを使用した 2 つのフリップフロップを提案する．提案したフリップフロップについてシミュレーションを用いた性能評価と，65nm バルクプロセスで設計したチップを用いたα線照射によるソフトエラー耐性評価を行った．評価結果より，改良型ラッチでは改良前で見られたエラーが 0 となった．提案 FF のエラー発生率は一般的な FF である TGFF と比べて 1/125，1/14732 まで減少し，耐性が向上していることを確認した．","subitem_description_type":"Other"}]},"item_18_description_8":{"attribute_name":"論文抄録(英)","attribute_value_mlt":[{"subitem_description":"With the miniaturization of integrated circuits, the reliability of integrated circuits has been declining. Soft errors are one of the causes of reliability degradation. In this study, we evaluate the soft-error tolerance of SEILA (Soft Error Immune Latch) in a previous research. Based on the results, we propose an improved latch and two flip-flops that use the improved latch. We evaluate the performance of the proposed flip-flops by circuit simulations and soft-error tolerant evaluation by irradiation of an α source using a chip designed in a 65 nm bulk process. The evaluation results show that the improved latch has no error, which was observed before the improvement. The error rates of the proposed FFs were reduced to 1/125 and 1/14732 compared to TGFF, which is a general FF, confirming the improved tolerance.","subitem_description_type":"Other"}]},"item_18_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicPageEnd":"161","bibliographic_titles":[{"bibliographic_title":"DAシンポジウム2024論文集"}],"bibliographicPageStart":"155","bibliographicIssueDates":{"bibliographicIssueDate":"2024-08-21","bibliographicIssueDateType":"Issued"},"bibliographicVolumeNumber":"2024"}]},"relation_version_is_last":true,"weko_creator_id":"44499"},"id":238248,"links":{}}