{"id":237378,"updated":"2025-01-19T08:54:17.300864+00:00","links":{},"created":"2025-01-19T01:39:58.571247+00:00","metadata":{"_oai":{"id":"oai:ipsj.ixsq.nii.ac.jp:00237378","sets":["1164:1384:11463:11665"]},"path":["11665"],"owner":"44499","recid":"237378","title":["品質デジタルツインにおける非機能テストカタログの提案とその利用を支援するシステム"],"pubdate":{"attribute_name":"公開日","attribute_value":"2024-07-18"},"_buckets":{"deposit":"c138462c-360b-4e6d-bb63-8e823d17d076"},"_deposit":{"id":"237378","pid":{"type":"depid","value":"237378","revision_id":0},"owners":[44499],"status":"published","created_by":44499},"item_title":"品質デジタルツインにおける非機能テストカタログの提案とその利用を支援するシステム","author_link":["649890","649892","649889","649893","649882","649885","649883","649886","649891","649887","649884","649888"],"item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"品質デジタルツインにおける非機能テストカタログの提案とその利用を支援するシステム"},{"subitem_title":"Proposal of non-functional testing catalog and and a system to support the use of the catalog","subitem_title_language":"en"}]},"item_type_id":"4","publish_date":"2024-07-18","item_4_text_3":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"芝浦工業大学大学院理工学研究科電気電子情報工学専攻"},{"subitem_text_value":"芝浦工業大学大学院理工学研究科電気電子情報工学専攻"},{"subitem_text_value":"芝浦工業大学工学部情報工学科"},{"subitem_text_value":"芝浦工業大学工学部情報工学科"},{"subitem_text_value":"芝浦工業大学工学部情報工学科"},{"subitem_text_value":"サイバー大学IT総合学部"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_publisher":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"情報処理学会","subitem_publisher_language":"ja"}]},"publish_status":"0","weko_shared_id":-1,"item_file_price":{"attribute_name":"Billing file","attribute_type":"file","attribute_value_mlt":[{"url":{"url":"https://ipsj.ixsq.nii.ac.jp/record/237378/files/IPSJ-SE24217024.pdf","label":"IPSJ-SE24217024.pdf"},"date":[{"dateType":"Available","dateValue":"2026-07-18"}],"format":"application/pdf","billing":["billing_file"],"filename":"IPSJ-SE24217024.pdf","filesize":[{"value":"1.2 MB"}],"mimetype":"application/pdf","priceinfo":[{"tax":["include_tax"],"price":"660","billingrole":"5"},{"tax":["include_tax"],"price":"330","billingrole":"6"},{"tax":["include_tax"],"price":"0","billingrole":"12"},{"tax":["include_tax"],"price":"0","billingrole":"44"}],"accessrole":"open_date","version_id":"0194685d-ff1e-455f-81f7-2b2fe4e73ea2","displaytype":"detail","licensetype":"license_note","license_note":"Copyright (c) 2024 by the Information Processing Society of Japan"}]},"item_4_creator_5":{"attribute_name":"著者名","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"福田, 怜哉"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"バトトルガ, ツェレメグ"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"白井, 航太朗"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"島田, 靖大"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"中島, 毅"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"除村, 健俊"}],"nameIdentifiers":[{}]}]},"item_4_creator_6":{"attribute_name":"著者名(英)","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Reiya, Fukuta","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Battulga, Tselmeg","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Kotaro, Shirai","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Yasuhiro, Shimada","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Tsuyoshi, Nakajima","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Taketoshi, Yokemura","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_4_source_id_9":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AN10112981","subitem_source_identifier_type":"NCID"}]},"item_4_textarea_12":{"attribute_name":"Notice","attribute_value_mlt":[{"subitem_textarea_value":"SIG Technical Reports are nonrefereed and hence may later appear in any journals, conferences, symposia, etc."}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourceuri":"http://purl.org/coar/resource_type/c_18gh","resourcetype":"technical report"}]},"item_4_source_id_11":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"2188-8825","subitem_source_identifier_type":"ISSN"}]},"item_4_description_7":{"attribute_name":"論文抄録","attribute_value_mlt":[{"subitem_description":"品質要求の達成を確認する非機能テストは，現状として，品質要求との対応関係が曖昧であり，関係整理が必要である．本研究報告では，品質要求から最適な非機能テストの選択，非機能テストの結果から品質要求達成度の評価を可能とする非機能テストカタログと品質デジタルツインにおけるその利用を支援するシステムを提案する．","subitem_description_type":"Other"}]},"item_4_description_8":{"attribute_name":"論文抄録(英)","attribute_value_mlt":[{"subitem_description":"Non-functional testing verifies the achievement of quality requirements. However, the relationship between non-functional testing and quality requirements is currently ambiguous and requires clarification. This research report proposes a catalog that links non-functional testing with quality requirements and introduces a system to support its utilization. The catalog enables the selection of appropriate non-functional tests and facilitates evaluation according to SQuaRE standards.","subitem_description_type":"Other"}]},"item_4_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicPageEnd":"6","bibliographic_titles":[{"bibliographic_title":"研究報告ソフトウェア工学（SE）"}],"bibliographicPageStart":"1","bibliographicIssueDates":{"bibliographicIssueDate":"2024-07-18","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"24","bibliographicVolumeNumber":"2024-SE-217"}]},"relation_version_is_last":true,"weko_creator_id":"44499"}}