{"links":{},"metadata":{"_oai":{"id":"oai:ipsj.ixsq.nii.ac.jp:00237362","sets":["1164:1384:11463:11665"]},"path":["11665"],"owner":"44499","recid":"237362","title":["スナップショットテストにおける欠陥検出力の実証的評価にむけて"],"pubdate":{"attribute_name":"公開日","attribute_value":"2024-07-18"},"_buckets":{"deposit":"90f556f5-bb16-400d-ad6a-f3d2f49f99e4"},"_deposit":{"id":"237362","pid":{"type":"depid","value":"237362","revision_id":0},"owners":[44499],"status":"published","created_by":44499},"item_title":"スナップショットテストにおける欠陥検出力の実証的評価にむけて","author_link":["649814","649811","649812","649813"],"item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"スナップショットテストにおける欠陥検出力の実証的評価にむけて"},{"subitem_title":"Towards An Empirical Evaluation of Defect Detection Capability in Snapshot Testing","subitem_title_language":"en"}]},"item_type_id":"4","publish_date":"2024-07-18","item_4_text_3":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"奈良先端科学技術大学院大学"},{"subitem_text_value":"奈良先端科学技術大学院大学"},{"subitem_text_value":"奈良先端科学技術大学院大学"},{"subitem_text_value":"奈良先端科学技術大学院大学"}]},"item_4_text_4":{"attribute_name":"著者所属(英)","attribute_value_mlt":[{"subitem_text_value":"NAIST","subitem_text_language":"en"},{"subitem_text_value":"NAIST","subitem_text_language":"en"},{"subitem_text_value":"NAIST","subitem_text_language":"en"},{"subitem_text_value":"NAIST","subitem_text_language":"en"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_publisher":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"情報処理学会","subitem_publisher_language":"ja"}]},"publish_status":"0","weko_shared_id":-1,"item_file_price":{"attribute_name":"Billing file","attribute_type":"file","attribute_value_mlt":[{"url":{"url":"https://ipsj.ixsq.nii.ac.jp/record/237362/files/IPSJ-SE24217008.pdf","label":"IPSJ-SE24217008.pdf"},"date":[{"dateType":"Available","dateValue":"2026-07-18"}],"format":"application/pdf","billing":["billing_file"],"filename":"IPSJ-SE24217008.pdf","filesize":[{"value":"1.2 MB"}],"mimetype":"application/pdf","priceinfo":[{"tax":["include_tax"],"price":"660","billingrole":"5"},{"tax":["include_tax"],"price":"330","billingrole":"6"},{"tax":["include_tax"],"price":"0","billingrole":"12"},{"tax":["include_tax"],"price":"0","billingrole":"44"}],"accessrole":"open_date","version_id":"e3caa546-7267-446c-b4f4-1bceaf2ce6c9","displaytype":"detail","licensetype":"license_note","license_note":"Copyright (c) 2024 by the Information Processing Society of Japan"}]},"item_4_creator_5":{"attribute_name":"著者名","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"藤田, 駿"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"馬渕, 航"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"柏, 祐太郎"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"飯田, 元"}],"nameIdentifiers":[{}]}]},"item_4_source_id_9":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AN10112981","subitem_source_identifier_type":"NCID"}]},"item_4_textarea_12":{"attribute_name":"Notice","attribute_value_mlt":[{"subitem_textarea_value":"SIG Technical Reports are nonrefereed and hence may later appear in any journals, conferences, symposia, etc."}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourceuri":"http://purl.org/coar/resource_type/c_18gh","resourcetype":"technical report"}]},"item_4_source_id_11":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"2188-8825","subitem_source_identifier_type":"ISSN"}]},"item_4_description_7":{"attribute_name":"論文抄録","attribute_value_mlt":[{"subitem_description":"ソフトウェアテストは品質保証において重要なプロセスである.近年ではフロントエンド開発における UI などでもテストコードが作成されているものの,テスト対象が複雑であることが多く,十分なテストを行うことは容易ではない.特に,複雑な対象のテストは,開発者の時間の多くを費やすため,実装が容易なスナップショットテストが利用され始めている.スナップショットテストはプログラム変更前後における動作の差分を検査し,想定外の変更などを検出することができる.しかしながら,スナップショットテストの欠陥検出の効果がどの程度かは明らかとなっていない.本研究では,GitHub 上の JavaScrpt プロジェクトのうち,テストフレームワーク JEST が提供するスナップショットテストを利用するプロジェクトを収集する.そして,テストの効果指標として広く用いられるカバレッジやミューテーションスコアが,スナップショットテストによってどの程度向上するかを調査する.","subitem_description_type":"Other"}]},"item_4_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicPageEnd":"8","bibliographic_titles":[{"bibliographic_title":"研究報告ソフトウェア工学(SE)"}],"bibliographicPageStart":"1","bibliographicIssueDates":{"bibliographicIssueDate":"2024-07-18","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"8","bibliographicVolumeNumber":"2024-SE-217"}]},"relation_version_is_last":true,"weko_creator_id":"44499"},"created":"2025-01-19T01:39:57.078212+00:00","updated":"2025-01-19T08:54:35.742902+00:00","id":237362}