{"metadata":{"_oai":{"id":"oai:ipsj.ixsq.nii.ac.jp:00237270","sets":["1164:3925:11477:11663"]},"path":["11663"],"owner":"44499","recid":"237270","title":["サイドチャネル情報を用いたマイクロコントローラの経年劣化判別手法の基礎検討"],"pubdate":{"attribute_name":"公開日","attribute_value":"2024-07-15"},"_buckets":{"deposit":"c6f397e8-ad95-47c6-8bbb-aa983278b20f"},"_deposit":{"id":"237270","pid":{"type":"depid","value":"237270","revision_id":0},"owners":[44499],"status":"published","created_by":44499},"item_title":"サイドチャネル情報を用いたマイクロコントローラの経年劣化判別手法の基礎検討","author_link":["649332","649329","649330","649331","649328","649327"],"item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"サイドチャネル情報を用いたマイクロコントローラの経年劣化判別手法の基礎検討"},{"subitem_title":"A Study on Detection Method of Aged Microcontrollers Using Side-Channel Information","subitem_title_language":"en"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"HWS","subitem_subject_scheme":"Other"}]},"item_type_id":"4","publish_date":"2024-07-15","item_4_text_3":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"東北大学電気通信研究所／大学院工学研究科"},{"subitem_text_value":"奈良先端科学技術大学院大学"},{"subitem_text_value":"東北大学電気通信研究所／大学院工学研究科"}]},"item_4_text_4":{"attribute_name":"著者所属(英)","attribute_value_mlt":[{"subitem_text_value":"Research Institute of Electrical Communication / Graduate School of Engineering, Tohoku University","subitem_text_language":"en"},{"subitem_text_value":"Nara Institute of Science and Technology","subitem_text_language":"en"},{"subitem_text_value":"Research Institute of Electrical Communication / Graduate School of Engineering, Tohoku University","subitem_text_language":"en"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_publisher":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"情報処理学会","subitem_publisher_language":"ja"}]},"publish_status":"0","weko_shared_id":-1,"item_file_price":{"attribute_name":"Billing file","attribute_type":"file","attribute_value_mlt":[{"url":{"url":"https://ipsj.ixsq.nii.ac.jp/record/237270/files/IPSJ-CSEC24106064.pdf","label":"IPSJ-CSEC24106064.pdf"},"format":"application/pdf","billing":["billing_file"],"filename":"IPSJ-CSEC24106064.pdf","filesize":[{"value":"3.3 MB"}],"mimetype":"application/pdf","priceinfo":[{"tax":["include_tax"],"price":"0","billingrole":"30"},{"tax":["include_tax"],"price":"0","billingrole":"44"}],"accessrole":"open_login","version_id":"7d70a813-52de-4e4d-a63a-cd2a00e2c025","displaytype":"detail","licensetype":"license_note","license_note":"Copyright (c) 2024 by the Institute of Electronics, Information and Communication Engineers This SIG report is only available to those in membership of the SIG."}]},"item_4_creator_5":{"attribute_name":"著者名","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"金子, 雄輝"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"林, 優一"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"本間, 尚文"}],"nameIdentifiers":[{}]}]},"item_4_creator_6":{"attribute_name":"著者名(英)","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Yuki, Kaneko","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Yuichi, Hayashi","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Naofumi, Homma","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_4_source_id_9":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA11235941","subitem_source_identifier_type":"NCID"}]},"item_4_textarea_12":{"attribute_name":"Notice","attribute_value_mlt":[{"subitem_textarea_value":"SIG Technical Reports are nonrefereed and hence may later appear in any journals, conferences, symposia, etc."}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourceuri":"http://purl.org/coar/resource_type/c_18gh","resourcetype":"technical report"}]},"item_4_source_id_11":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"2188-8655","subitem_source_identifier_type":"ISSN"}]},"item_4_description_7":{"attribute_name":"論文抄録","attribute_value_mlt":[{"subitem_description":"近年の半導体の需要増加およびその供給不足に伴い，マイクロコントローラをはじめとする集積回路 (IC: Integrated Circuit) の非正規中古品やフェイクチップが市場に出回り，電子機器の安全性や信頼性が脅かされている．本稿では，経年劣化したマイクロコントローラから生ずるサイドチャネル情報に着目し，非正規中古品を非侵襲に判別する手法を提案する．提案手法では，新品に比べて中古 IC のスイッチングスピードが MOSFET の閾値電圧の変化に依存して低下することに着目し，電圧変化や漏洩電磁波などのサイドチャネル情報に含まれる信号のスイッチングの影響を抽出・累積することで経年劣化を判別する．具体的には，ARM Cortex-M4 を用いた実験を通して，周波数領域上のサイドチャネル解析で利用される動作周波数周辺および低周波数帯の電圧波形から有効な周波数帯の情報を抽出・累積することで，未使用と劣化したマイクロコントローラを判別できる可能性があることを示す．","subitem_description_type":"Other"}]},"item_4_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicPageEnd":"6","bibliographic_titles":[{"bibliographic_title":"研究報告コンピュータセキュリティ（CSEC）"}],"bibliographicPageStart":"1","bibliographicIssueDates":{"bibliographicIssueDate":"2024-07-15","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"64","bibliographicVolumeNumber":"2024-CSEC-106"}]},"relation_version_is_last":true,"weko_creator_id":"44499"},"id":237270,"updated":"2025-01-19T08:56:16.624026+00:00","links":{},"created":"2025-01-19T01:39:48.393321+00:00"}