{"updated":"2025-01-19T09:37:23.549820+00:00","links":{},"metadata":{"_oai":{"id":"oai:ipsj.ixsq.nii.ac.jp:00235055","sets":["1164:10193:11470:11670"]},"path":["11670"],"owner":"44499","recid":"235055","title":["カーパラメトリック発振器の結合系における量子アニーリングの断熱性の測定法"],"pubdate":{"attribute_name":"公開日","attribute_value":"2024-06-20"},"_buckets":{"deposit":"023e95af-74af-4c70-8d76-229a434f65b9"},"_deposit":{"id":"235055","pid":{"type":"depid","value":"235055","revision_id":0},"owners":[44499],"status":"published","created_by":44499},"item_title":"カーパラメトリック発振器の結合系における量子アニーリングの断熱性の測定法","author_link":["641740","641739","641743","641742","641744","641741"],"item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"カーパラメトリック発振器の結合系における量子アニーリングの断熱性の測定法"}]},"item_type_id":"4","publish_date":"2024-06-20","item_4_text_3":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"Department of Electrical, Electronic, and Communication Engineering, Faculty of Science and Engineering, Chuo University"},{"subitem_text_value":"Research Center for Emerging Computing Technologies, National Institute of Advanced Industrial Science and Technology (AIST)"},{"subitem_text_value":"Department of Electrical, Electronic, and Communication Engineering, Faculty of Science and Engineering, Chuo University"}]},"item_4_text_4":{"attribute_name":"著者所属(英)","attribute_value_mlt":[{"subitem_text_value":"Department of Electrical, Electronic, and Communication Engineering, Faculty of Science and Engineering, Chuo University","subitem_text_language":"en"},{"subitem_text_value":"Research Center for Emerging Computing Technologies, National Institute of Advanced Industrial Science and Technology (AIST)","subitem_text_language":"en"},{"subitem_text_value":"Department of Electrical, Electronic, and Communication Engineering, Faculty of Science and Engineering, Chuo University","subitem_text_language":"en"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_publisher":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"情報処理学会","subitem_publisher_language":"ja"}]},"publish_status":"0","weko_shared_id":-1,"item_file_price":{"attribute_name":"Billing file","attribute_type":"file","attribute_value_mlt":[{"url":{"url":"https://ipsj.ixsq.nii.ac.jp/record/235055/files/IPSJ-QS24012008.pdf","label":"IPSJ-QS24012008.pdf"},"date":[{"dateType":"Available","dateValue":"2026-06-20"}],"format":"application/pdf","billing":["billing_file"],"filename":"IPSJ-QS24012008.pdf","filesize":[{"value":"2.2 MB"}],"mimetype":"application/pdf","priceinfo":[{"tax":["include_tax"],"price":"660","billingrole":"5"},{"tax":["include_tax"],"price":"330","billingrole":"6"},{"tax":["include_tax"],"price":"0","billingrole":"53"},{"tax":["include_tax"],"price":"0","billingrole":"44"}],"accessrole":"open_date","version_id":"d8bab0e7-e49f-4649-bfbc-f3b9160cc929","displaytype":"detail","licensetype":"license_note","license_note":"Copyright (c) 2024 by the Information Processing Society of Japan"}]},"item_4_creator_5":{"attribute_name":"著者名","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Harunobu, Hiratsuska"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Yuichiro, Mori"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Yuichiro, Matsuzaki"}],"nameIdentifiers":[{}]}]},"item_4_creator_6":{"attribute_name":"著者名(英)","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Harunobu, Hiratsuska","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Yuichiro, Mori","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Yuichiro, Matsuzaki","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_4_source_id_9":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA12894105","subitem_source_identifier_type":"NCID"}]},"item_4_textarea_12":{"attribute_name":"Notice","attribute_value_mlt":[{"subitem_textarea_value":"SIG Technical Reports are nonrefereed and hence may later appear in any journals, conferences, symposia, etc."}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourceuri":"http://purl.org/coar/resource_type/c_18gh","resourcetype":"technical report"}]},"item_4_source_id_11":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"2435-6492","subitem_source_identifier_type":"ISSN"}]},"item_4_description_7":{"attribute_name":"論文抄録","attribute_value_mlt":[{"subitem_description":"量子アニーリングは,断熱的に時間発展させることで,プロブレムハミルトニアンの基底状態を求める手法である.近年,分光測定の手法を適用することで,断熱条件を満たしているかどうかを実験的に計測する手法が提案された.しかし,この手法では,量子アニーリング中に相互作用強度を時間的に振動させる必要があり,その点が実験実証を困難にしていた.本講演では,カー非線形性を有するパラメトリック発振器(KPO)を用いて量子アニーリングを行う際に,断熱条件を満たしているかどうかを実験的に判定する手法を提案する.本提案では,従来手法と異なり,断熱条件を満たしているかを判定する際に,相互作用を時間的に振動させる必要がないことが大きな利点である.数値計算によりその性能を評価したので,その結果を紹介する.","subitem_description_type":"Other"}]},"item_4_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicPageEnd":"7","bibliographic_titles":[{"bibliographic_title":"研究報告量子ソフトウェア(QS)"}],"bibliographicPageStart":"1","bibliographicIssueDates":{"bibliographicIssueDate":"2024-06-20","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"8","bibliographicVolumeNumber":"2024-QS-12"}]},"relation_version_is_last":true,"weko_creator_id":"44499"},"id":235055,"created":"2025-01-19T01:37:02.602854+00:00"}