{"metadata":{"_oai":{"id":"oai:ipsj.ixsq.nii.ac.jp:00234886","sets":["1164:5352:11553:11625"]},"path":["11625"],"owner":"44499","recid":"234886","title":["X線光電子分光スペクトルにおける共通ピーク構造のベイズ推定"],"pubdate":{"attribute_name":"公開日","attribute_value":"2024-06-13"},"_buckets":{"deposit":"c45465c1-2547-431d-9ba8-779df2c9b2d3"},"_deposit":{"id":"234886","pid":{"type":"depid","value":"234886","revision_id":0},"owners":[44499],"status":"published","created_by":44499},"item_title":"X線光電子分光スペクトルにおける共通ピーク構造のベイズ推定","author_link":["640900","640901","640905","640902","640904","640903"],"item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"X線光電子分光スペクトルにおける共通ピーク構造のベイズ推定"},{"subitem_title":"Bayesian estimation of common peak structure in X-ray photoelectron spectroscopy spectra","subitem_title_language":"en"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"数理モデル化と問題解決2","subitem_subject_scheme":"Other"}]},"item_type_id":"4","publish_date":"2024-06-13","item_4_text_3":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"電気通信大学大学院情報理工学研究科"},{"subitem_text_value":"物質・材料研究機構"},{"subitem_text_value":"物質・材料研究機構"},{"subitem_text_value":"物質・材料研究機構"},{"subitem_text_value":"物質・材料研究機構"},{"subitem_text_value":"電気通信大学大学院情報理工学研究科"}]},"item_4_text_4":{"attribute_name":"著者所属(英)","attribute_value_mlt":[{"subitem_text_value":"The University of Electro-Communications","subitem_text_language":"en"},{"subitem_text_value":"National Institute for Materials Science","subitem_text_language":"en"},{"subitem_text_value":"National Institute for Materials Science","subitem_text_language":"en"},{"subitem_text_value":"National Institute for Materials Science","subitem_text_language":"en"},{"subitem_text_value":"National Institute for Materials Science","subitem_text_language":"en"},{"subitem_text_value":"The University of Electro-Communications","subitem_text_language":"en"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_publisher":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"情報処理学会","subitem_publisher_language":"ja"}]},"publish_status":"0","weko_shared_id":-1,"item_file_price":{"attribute_name":"Billing file","attribute_type":"file","attribute_value_mlt":[{"url":{"url":"https://ipsj.ixsq.nii.ac.jp/record/234886/files/IPSJ-BIO24078059.pdf","label":"IPSJ-BIO24078059.pdf"},"date":[{"dateType":"Available","dateValue":"2026-06-13"}],"format":"application/pdf","billing":["billing_file"],"filename":"IPSJ-BIO24078059.pdf","filesize":[{"value":"1.7 MB"}],"mimetype":"application/pdf","priceinfo":[{"tax":["include_tax"],"price":"660","billingrole":"5"},{"tax":["include_tax"],"price":"330","billingrole":"6"},{"tax":["include_tax"],"price":"0","billingrole":"41"},{"tax":["include_tax"],"price":"0","billingrole":"44"}],"accessrole":"open_date","version_id":"21218d5a-abd2-4195-9427-00a24ac35132","displaytype":"detail","licensetype":"license_note","license_note":"Copyright (c) 2024 by the Information Processing Society of Japan"}]},"item_4_creator_5":{"attribute_name":"著者名","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"丸山, 颯斗"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"村上, 諒"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"篠塚, 寛志"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"永田, 賢二"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"吉川, 英樹"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"庄野, 逸"}],"nameIdentifiers":[{}]}]},"item_4_source_id_9":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA12055912","subitem_source_identifier_type":"NCID"}]},"item_4_textarea_12":{"attribute_name":"Notice","attribute_value_mlt":[{"subitem_textarea_value":"SIG Technical Reports are nonrefereed and hence may later appear in any journals, conferences, symposia, etc."}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourceuri":"http://purl.org/coar/resource_type/c_18gh","resourcetype":"technical report"}]},"item_4_source_id_11":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"2188-8590","subitem_source_identifier_type":"ISSN"}]},"item_4_description_7":{"attribute_name":"論文抄録","attribute_value_mlt":[{"subitem_description":"X 線光電子分光法 (X-ray Photoelectron Spectroscopy:XPS) は，物質表面に X 線を照射し，得られる光電子から材料の組成や電子状態を知る計測手法である．計測スペクトルは物質固有の多数のピークの重ね合わせになるため，これを分解することで解析を行う．一方で，これらの計測スペクトルは計測の装置条件に依存して若干ゆらぐため，データの装置由来のゆらぎに対応する解析手法が必要となる．そこで，本研究では計測スペクトルは試料固有の共通するピーク構造に装置条件ごとに異なる摂動が加わるという枠組みでベイズ推定を行った．ベイズ推定によってパラメータを推定することで推定結果の不確実性を評価できるようになった．実験では模擬データを用いた推定を行い，推定結果について評価を行った．","subitem_description_type":"Other"}]},"item_4_description_8":{"attribute_name":"論文抄録(英)","attribute_value_mlt":[{"subitem_description":"X-ray Photoelectron Spectroscopy (XPS) is a measurement technique for determining material compositions and electronic states from photoelectrons spectra obtained by X-ray exposing on the surface of a material. Since the measurement spectrum is a superposition of material-specific peaks, it is analyzed by decomposing the spectra. On the other hand, since these measurement spectra are different in each measurement device settings, an analysis method is required to cope with the fluctuation of the data. Therefore, we performed Bayesian estimation in the framework that measurement spectrum are observed with each different perturbations added to common peak structure unique to sample. Bayesian estimation of the parameters allowed us to evaluate the uncertainty of the estimation results. In the experiment, the estimation was performed using simulated data, and we evaluated estimation results.","subitem_description_type":"Other"}]},"item_4_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicPageEnd":"6","bibliographic_titles":[{"bibliographic_title":"研究報告バイオ情報学（BIO）"}],"bibliographicPageStart":"1","bibliographicIssueDates":{"bibliographicIssueDate":"2024-06-13","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"59","bibliographicVolumeNumber":"2024-BIO-78"}]},"relation_version_is_last":true,"weko_creator_id":"44499"},"id":234886,"updated":"2025-01-19T09:40:51.743348+00:00","links":{},"created":"2025-01-19T01:36:45.899561+00:00"}