{"created":"2025-01-19T01:28:07.132718+00:00","updated":"2025-01-19T11:38:55.213417+00:00","metadata":{"_oai":{"id":"oai:ipsj.ixsq.nii.ac.jp:00228990","sets":["1164:2822:11181:11358"]},"path":["11358"],"owner":"44499","recid":"228990","title":["電力のサンプリング間隔がAES回路のサイドチャネルリーク量に与える影響の評価"],"pubdate":{"attribute_name":"公開日","attribute_value":"2023-11-09"},"_buckets":{"deposit":"71658e70-546b-443a-9860-ddb6b8c71937"},"_deposit":{"id":"228990","pid":{"type":"depid","value":"228990","revision_id":0},"owners":[44499],"status":"published","created_by":44499},"item_title":"電力のサンプリング間隔がAES回路のサイドチャネルリーク量に与える影響の評価","author_link":["615035","615033","615032","615034"],"item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"電力のサンプリング間隔がAES回路のサイドチャネルリーク量に与える影響の評価"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"アーキテクチャ","subitem_subject_scheme":"Other"}]},"item_type_id":"4","publish_date":"2023-11-09","item_4_text_3":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"立命館大学大学院理工学研究科"},{"subitem_text_value":"大阪大学大学院情報科学研究科"},{"subitem_text_value":"富山県立大学大学院"},{"subitem_text_value":"立命館大学大学院理工学研究科"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_publisher":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"情報処理学会","subitem_publisher_language":"ja"}]},"publish_status":"0","weko_shared_id":-1,"item_file_price":{"attribute_name":"Billing file","attribute_type":"file","attribute_value_mlt":[{"url":{"url":"https://ipsj.ixsq.nii.ac.jp/record/228990/files/IPSJ-EMB23064002.pdf","label":"IPSJ-EMB23064002.pdf"},"date":[{"dateType":"Available","dateValue":"2025-11-09"}],"format":"application/pdf","billing":["billing_file"],"filename":"IPSJ-EMB23064002.pdf","filesize":[{"value":"575.9 kB"}],"mimetype":"application/pdf","priceinfo":[{"tax":["include_tax"],"price":"660","billingrole":"5"},{"tax":["include_tax"],"price":"330","billingrole":"6"},{"tax":["include_tax"],"price":"0","billingrole":"42"},{"tax":["include_tax"],"price":"0","billingrole":"44"}],"accessrole":"open_date","version_id":"7b54ed83-09ca-493b-8df6-cca4c503ef99","displaytype":"detail","licensetype":"license_note","license_note":"Copyright (c) 2023 by the Information Processing Society of Japan"}]},"item_4_creator_5":{"attribute_name":"著者名","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"三浦, 佑斗"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"西川, 広記"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"孔, 祥博"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"冨山, 宏之"}],"nameIdentifiers":[{}]}]},"item_4_source_id_9":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA12149313","subitem_source_identifier_type":"NCID"}]},"item_4_textarea_12":{"attribute_name":"Notice","attribute_value_mlt":[{"subitem_textarea_value":"SIG Technical Reports are nonrefereed and hence may later appear in any journals, conferences, symposia, etc."}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourceuri":"http://purl.org/coar/resource_type/c_18gh","resourcetype":"technical report"}]},"item_4_source_id_11":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"2188-868X","subitem_source_identifier_type":"ISSN"}]},"item_4_description_7":{"attribute_name":"論文抄録","attribute_value_mlt":[{"subitem_description":"近年 FPGA は多くの IoT デバイスに使用されており，安全性を確保するため暗号回路を搭載している．しかしサイドチャネル攻撃によって暗号鍵を盗まれるリスクに晒されている．本研究では，AES 回路における電力解析攻撃のシミュレーションによる実証実験を行い，サンプリング間隔とサイドチャネル情報のリーク量との相関性を調査する．リーク量の評価には T 検定を用い，4 つの指標から評価する．","subitem_description_type":"Other"}]},"item_4_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicPageEnd":"2","bibliographic_titles":[{"bibliographic_title":"研究報告組込みシステム（EMB）"}],"bibliographicPageStart":"1","bibliographicIssueDates":{"bibliographicIssueDate":"2023-11-09","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"2","bibliographicVolumeNumber":"2023-EMB-64"}]},"relation_version_is_last":true,"weko_creator_id":"44499"},"id":228990,"links":{}}