{"id":228902,"updated":"2025-01-19T11:40:40.537792+00:00","links":{},"created":"2025-01-19T01:28:02.089599+00:00","metadata":{"_oai":{"id":"oai:ipsj.ixsq.nii.ac.jp:00228902","sets":["1164:2036:11089:11372"]},"path":["11372"],"owner":"44499","recid":"228902","title":["裏面電圧故障注入を用いた差分故障解析による秘密鍵導出"],"pubdate":{"attribute_name":"公開日","attribute_value":"2023-11-10"},"_buckets":{"deposit":"3c94d5f6-035f-4580-b963-8b11f1d65d16"},"_deposit":{"id":"228902","pid":{"type":"depid","value":"228902","revision_id":0},"owners":[44499],"status":"published","created_by":44499},"item_title":"裏面電圧故障注入を用いた差分故障解析による秘密鍵導出","author_link":["614663","614653","614656","614660","614664","614657","614658","614654","614662","614661","614655","614659"],"item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"裏面電圧故障注入を用いた差分故障解析による秘密鍵導出"},{"subitem_title":"Derivation of secret keys by differential fault analysis using backside voltage fault injection","subitem_title_language":"en"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"ハードウェアセキュリティ・高周波","subitem_subject_scheme":"Other"}]},"item_type_id":"4","publish_date":"2023-11-10","item_4_text_3":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"神戸大学大学院科学技術イノベーション研究科"},{"subitem_text_value":"神戸大学大学院科学技術イノベーション研究科"},{"subitem_text_value":"神戸大学大学院科学技術イノベーション研究科"},{"subitem_text_value":"神戸大学大学院科学技術イノベーション研究科"},{"subitem_text_value":"神戸大学大学院科学技術イノベーション研究科"},{"subitem_text_value":"神戸大学大学院科学技術イノベーション研究科"}]},"item_4_text_4":{"attribute_name":"著者所属(英)","attribute_value_mlt":[{"subitem_text_value":"Graduate School of Science, Technology and Innovation, Kobe University","subitem_text_language":"en"},{"subitem_text_value":"Graduate School of Science, Technology and Innovation, Kobe University","subitem_text_language":"en"},{"subitem_text_value":"Graduate School of Science, Technology and Innovation, Kobe University","subitem_text_language":"en"},{"subitem_text_value":"Graduate School of Science, Technology and Innovation, Kobe University","subitem_text_language":"en"},{"subitem_text_value":"Graduate School of Science, Technology and Innovation, Kobe University","subitem_text_language":"en"},{"subitem_text_value":"Graduate School of Science, Technology and Innovation, Kobe University ","subitem_text_language":"en"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_publisher":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"情報処理学会","subitem_publisher_language":"ja"}]},"publish_status":"0","weko_shared_id":-1,"item_file_price":{"attribute_name":"Billing file","attribute_type":"file","attribute_value_mlt":[{"url":{"url":"https://ipsj.ixsq.nii.ac.jp/record/228902/files/IPSJ-SLDM23204035.pdf","label":"IPSJ-SLDM23204035.pdf"},"format":"application/pdf","billing":["billing_file"],"filename":"IPSJ-SLDM23204035.pdf","filesize":[{"value":"1.3 MB"}],"mimetype":"application/pdf","priceinfo":[{"tax":["include_tax"],"price":"0","billingrole":"10"},{"tax":["include_tax"],"price":"0","billingrole":"44"}],"accessrole":"open_login","version_id":"06202489-0f81-41ac-bd20-719092016d6e","displaytype":"detail","licensetype":"license_note","license_note":"Copyright (c) 2023 by the Institute of Electronics, Information and Communication Engineers This SIG report is only available to those in membership of the SIG."}]},"item_4_creator_5":{"attribute_name":"著者名","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"林, 佑亮"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"長谷川, 陸宇"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"弘原海, 拓也"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"門田, 和樹"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"三木, 拓司"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"永田, 真"}],"nameIdentifiers":[{}]}]},"item_4_creator_6":{"attribute_name":"著者名(英)","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Yusuke, Hayashi","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Rikuu, Hasegawa","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Takuya, Wadatsumi","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Kazuki, Monta","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Takuji, Miki","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Makoto, Nagata","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_4_source_id_9":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA11451459","subitem_source_identifier_type":"NCID"}]},"item_4_textarea_12":{"attribute_name":"Notice","attribute_value_mlt":[{"subitem_textarea_value":"SIG Technical Reports are nonrefereed and hence may later appear in any journals, conferences, symposia, etc."}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourceuri":"http://purl.org/coar/resource_type/c_18gh","resourcetype":"technical report"}]},"item_4_source_id_11":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"2188-8639","subitem_source_identifier_type":"ISSN"}]},"item_4_description_7":{"attribute_name":"論文抄録","attribute_value_mlt":[{"subitem_description":"暗号集積回路 (IC) チップに対する故障注入攻撃における故障注入手法として，これまで正確性のあるレーザーが代表的な手法としてあげられてきた．しかし，レーザーは攻撃コストの面で課題が存在する．そこで，レーザーと比較して攻撃コストの低い擾乱注入手法であるチップ裏面に対する電圧パルスに着目し，実際に暗号 IC チップに対して故障注入を行った．そして，故障注入によって得られた故障暗号文を用いて差分故障解析 (DFA) を行い秘密鍵の導出に成功した．","subitem_description_type":"Other"}]},"item_4_description_8":{"attribute_name":"論文抄録(英)","attribute_value_mlt":[{"subitem_description":"Lasers have been the leading method of fault injection in fault injection attacks on cryptographic integrated circuit (IC) chips. However, lasers present a challenge in terms of attack cost. Therefore, we focused on the voltage pulse to the backside of the chip, which is a disturbance injection method with lower attack cost compared to the laser, and actually performed fault injection on a cryptographic IC chip. Then, we performed differential fault analysis (DFA) using the fault ciphertext obtained by fault injection and succeeded in deriving the secret key. ","subitem_description_type":"Other"}]},"item_4_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicPageEnd":"4","bibliographic_titles":[{"bibliographic_title":"研究報告システムとLSIの設計技術（SLDM）"}],"bibliographicPageStart":"1","bibliographicIssueDates":{"bibliographicIssueDate":"2023-11-10","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"35","bibliographicVolumeNumber":"2023-SLDM-204"}]},"relation_version_is_last":true,"weko_creator_id":"44499"}}