{"id":228900,"updated":"2025-01-19T11:40:42.653683+00:00","links":{},"created":"2025-01-19T01:28:01.974253+00:00","metadata":{"_oai":{"id":"oai:ipsj.ixsq.nii.ac.jp:00228900","sets":["1164:2036:11089:11372"]},"path":["11372"],"owner":"44499","recid":"228900","title":["レイアウト起因LSI欠陥検出における欠陥モデルとデータ拡張の検討"],"pubdate":{"attribute_name":"公開日","attribute_value":"2023-11-10"},"_buckets":{"deposit":"da1b6f40-8543-4116-98bd-df5fff9b7d8c"},"_deposit":{"id":"228900","pid":{"type":"depid","value":"228900","revision_id":0},"owners":[44499],"status":"published","created_by":44499},"item_title":"レイアウト起因LSI欠陥検出における欠陥モデルとデータ拡張の検討","author_link":["614639","614642","614640","614641"],"item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"レイアウト起因LSI欠陥検出における欠陥モデルとデータ拡張の検討"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"高信頼LSI設計と評価","subitem_subject_scheme":"Other"}]},"item_type_id":"4","publish_date":"2023-11-10","item_4_text_3":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"東京都立大学大学院システムデザイン研究科"},{"subitem_text_value":"東京都立大学大学院システムデザイン研究科"},{"subitem_text_value":"日本大学生産工学部"},{"subitem_text_value":"東京都立大学システムデザイン学部"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_publisher":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"情報処理学会","subitem_publisher_language":"ja"}]},"publish_status":"0","weko_shared_id":-1,"item_file_price":{"attribute_name":"Billing file","attribute_type":"file","attribute_value_mlt":[{"url":{"url":"https://ipsj.ixsq.nii.ac.jp/record/228900/files/IPSJ-SLDM23204033.pdf","label":"IPSJ-SLDM23204033.pdf"},"format":"application/pdf","billing":["billing_file"],"filename":"IPSJ-SLDM23204033.pdf","filesize":[{"value":"2.4 MB"}],"mimetype":"application/pdf","priceinfo":[{"tax":["include_tax"],"price":"0","billingrole":"10"},{"tax":["include_tax"],"price":"0","billingrole":"44"}],"accessrole":"open_login","version_id":"2e9e9967-c5ff-4b9b-bb69-5b8d13fa3907","displaytype":"detail","licensetype":"license_note","license_note":"Copyright (c) 2023 by the Institute of Electronics, Information and Communication Engineers This SIG report is only available to those in membership of the SIG."}]},"item_4_creator_5":{"attribute_name":"著者名","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"杉岡, 拓海"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"永村, 美一"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"新井, 雅之"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"福本, 聡"}],"nameIdentifiers":[{}]}]},"item_4_source_id_9":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA11451459","subitem_source_identifier_type":"NCID"}]},"item_4_textarea_12":{"attribute_name":"Notice","attribute_value_mlt":[{"subitem_textarea_value":"SIG Technical Reports are nonrefereed and hence may later appear in any journals, conferences, symposia, etc."}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourceuri":"http://purl.org/coar/resource_type/c_18gh","resourcetype":"technical report"}]},"item_4_source_id_11":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"2188-8639","subitem_source_identifier_type":"ISSN"}]},"item_4_description_7":{"attribute_name":"論文抄録","attribute_value_mlt":[{"subitem_description":"半導体集積回路において，欠陥の原因を特定することはその信頼性を確保するうえで重要である．回路レイアウトに起因する欠陥に対して，畳込みニューラルネットワーク(CNN) を使用しレイアウトごとの危険性を判定する手法が提案されている．CNN の学習に際しては膨大な量のデータが必要となるが，開発初期段階においてはデータ量が少ないため，データ拡張手法についていくつかの研究が行われている．本研究では，レイアウト起因欠陥モデル画像を対象として，極少数の欠陥モデル画像から FSGAN を用いて CNN 学習データの拡張を行う手法について検討した．新たな欠陥画像モデルとして，特定のスタンダードセルに見立てたものをドットパターンではなく特定の M2 層と M3 層のそれぞれの一部分とし，この二つの配置の仕方により欠陥の有無を区別することとした．新たなモデルで評価を行ったところ，元の欠陥画像 20 枚をもとに FSGAN によって拡張したデータで学習させた CNN において，分類精度 86％ が得られた．","subitem_description_type":"Other"}]},"item_4_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicPageEnd":"5","bibliographic_titles":[{"bibliographic_title":"研究報告システムとLSIの設計技術（SLDM）"}],"bibliographicPageStart":"1","bibliographicIssueDates":{"bibliographicIssueDate":"2023-11-10","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"33","bibliographicVolumeNumber":"2023-SLDM-204"}]},"relation_version_is_last":true,"weko_creator_id":"44499"}}