{"created":"2025-01-19T01:28:01.859890+00:00","updated":"2025-01-19T11:40:44.831585+00:00","metadata":{"_oai":{"id":"oai:ipsj.ixsq.nii.ac.jp:00228898","sets":["1164:2036:11089:11372"]},"path":["11372"],"owner":"44499","recid":"228898","title":["切り捨てビットを考慮する近似乗算器用BIST回路の面積削減について"],"pubdate":{"attribute_name":"公開日","attribute_value":"2023-11-10"},"_buckets":{"deposit":"23edcfa1-ef5b-4752-a74c-b0e1d3067cd3"},"_deposit":{"id":"228898","pid":{"type":"depid","value":"228898","revision_id":0},"owners":[44499],"status":"published","created_by":44499},"item_title":"切り捨てビットを考慮する近似乗算器用BIST回路の面積削減について","author_link":["614617","614621","614618","614619","614616","614622","614620","614615"],"item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"切り捨てビットを考慮する近似乗算器用BIST回路の面積削減について"},{"subitem_title":"On Reducing Area Overhead of BIST for Approximate Multiplier Considering Truncated Bits","subitem_title_language":"en"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"高信頼LSI設計と評価","subitem_subject_scheme":"Other"}]},"item_type_id":"4","publish_date":"2023-11-10","item_4_text_3":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"徳島大学大学院創成科学研究科電気電子システムコース"},{"subitem_text_value":"徳島大学大学院創成科学研究科電気電子システムコース"},{"subitem_text_value":"徳島大学大学院社会産業理工学研究部"},{"subitem_text_value":"徳島大学大学院社会産業理工学研究部"}]},"item_4_text_4":{"attribute_name":"著者所属(英)","attribute_value_mlt":[{"subitem_text_value":"Graduate School of Advanced Technology and Science, Tokushima University","subitem_text_language":"en"},{"subitem_text_value":"Graduate School of Advanced Technology and Science, Tokushima University","subitem_text_language":"en"},{"subitem_text_value":"Graduate School of Technology, Industrial and Social Sciences, Tokushima University","subitem_text_language":"en"},{"subitem_text_value":"Graduate School of Technology, Industrial and Social Sciences, Tokushima University","subitem_text_language":"en"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_publisher":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"情報処理学会","subitem_publisher_language":"ja"}]},"publish_status":"0","weko_shared_id":-1,"item_file_price":{"attribute_name":"Billing file","attribute_type":"file","attribute_value_mlt":[{"url":{"url":"https://ipsj.ixsq.nii.ac.jp/record/228898/files/IPSJ-SLDM23204031.pdf","label":"IPSJ-SLDM23204031.pdf"},"format":"application/pdf","billing":["billing_file"],"filename":"IPSJ-SLDM23204031.pdf","filesize":[{"value":"1.1 MB"}],"mimetype":"application/pdf","priceinfo":[{"tax":["include_tax"],"price":"0","billingrole":"10"},{"tax":["include_tax"],"price":"0","billingrole":"44"}],"accessrole":"open_login","version_id":"62b77a4f-ec89-4f26-99a9-9cc98d22408b","displaytype":"detail","licensetype":"license_note","license_note":"Copyright (c) 2023 by the Institute of Electronics, Information and Communication Engineers This SIG report is only available to those in membership of the SIG."}]},"item_4_creator_5":{"attribute_name":"著者名","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"赤松, 大地"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"東海, 翔午"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"四柳, 浩之"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"橋爪, 正樹"}],"nameIdentifiers":[{}]}]},"item_4_creator_6":{"attribute_name":"著者名(英)","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Daichi, Akamatsu","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Shogo, Tokai","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Hiroyuki, Yotsuyanagi","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Masaki, Hashizume","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_4_source_id_9":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA11451459","subitem_source_identifier_type":"NCID"}]},"item_4_textarea_12":{"attribute_name":"Notice","attribute_value_mlt":[{"subitem_textarea_value":"SIG Technical Reports are nonrefereed and hence may later appear in any journals, conferences, symposia, etc."}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourceuri":"http://purl.org/coar/resource_type/c_18gh","resourcetype":"technical report"}]},"item_4_source_id_11":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"2188-8639","subitem_source_identifier_type":"ISSN"}]},"item_4_description_7":{"attribute_name":"論文抄録","attribute_value_mlt":[{"subitem_description":"近年，演算誤差を許容できるアプリケーションにおいて消費電力や回路面積を抑えるために近似演算が注目されている．乗算器に対する近似手法として，乗数と被乗数の桁数に基づいて下位ビットを切り捨てる手法が提案されている．本研究では近似乗算器用のテスト容易化設計として，切り捨て対象ビットを考慮し，組込み自己テスト (BIST) で用いるテストパターン生成回路 (PRPG) を小さくする手法を提案する．提案回路ではテストパターンを切り捨て条件に応じて均等に生成することで，PRPG の面積オーバーヘッドを最大 42% 削減するとともに故障検出率も向上されることを確認した．","subitem_description_type":"Other"}]},"item_4_description_8":{"attribute_name":"論文抄録(英)","attribute_value_mlt":[{"subitem_description":"Recently, approximate computing has attracted attention as a method to reduce power and area for error-tolerant applications with an acceptable loss of accuracy. As an approximation method for multipliers, truncation of lower bits based on the number of significant digits of the multiplier and the multiplicand has been proposed. In this study, we propose a method to reduce the size of the test pattern generation circuit (PRPG) used in built-in self-test (BIST) by considering the bits to be truncated as a testability design for approximate multipliers. Since our method provides test patterns evenly for each truncation condition using a smaller PRPG, we confirmed that the proposed method can reduce the area overhead of PRPG by up to approximately 42% and also achieve higher test coverage.","subitem_description_type":"Other"}]},"item_4_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicPageEnd":"6","bibliographic_titles":[{"bibliographic_title":"研究報告システムとLSIの設計技術（SLDM）"}],"bibliographicPageStart":"1","bibliographicIssueDates":{"bibliographicIssueDate":"2023-11-10","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"31","bibliographicVolumeNumber":"2023-SLDM-204"}]},"relation_version_is_last":true,"weko_creator_id":"44499"},"id":228898,"links":{}}