{"created":"2025-01-19T01:28:01.166710+00:00","updated":"2025-01-19T11:40:59.760293+00:00","metadata":{"_oai":{"id":"oai:ipsj.ixsq.nii.ac.jp:00228886","sets":["1164:2036:11089:11372"]},"path":["11372"],"owner":"44499","recid":"228886","title":["Hyperdimensional Computing 向けFeFET CiMの設計とエラー耐性"],"pubdate":{"attribute_name":"公開日","attribute_value":"2023-11-10"},"_buckets":{"deposit":"e22aaebd-e964-4941-a198-0c5b4bef5afa"},"_deposit":{"id":"228886","pid":{"type":"depid","value":"228886","revision_id":0},"owners":[44499],"status":"published","created_by":44499},"item_title":"Hyperdimensional Computing 向けFeFET CiMの設計とエラー耐性","author_link":["614530","614535","614538","614532","614534","614539","614531","614533","614536","614540","614537","614529"],"item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"Hyperdimensional Computing 向けFeFET CiMの設計とエラー耐性"},{"subitem_title":"Design and Error-tolerance of FeFET-based CiM for Hyperdimensional Computing","subitem_title_language":"en"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"CiM ","subitem_subject_scheme":"Other"}]},"item_type_id":"4","publish_date":"2023-11-10","item_4_text_3":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"東京大学大学院工学系研究科電気系工学専攻"},{"subitem_text_value":"東京大学大学院工学系研究科電気系工学専攻"},{"subitem_text_value":"東京大学大学院工学系研究科電気系工学専攻東京大学大学院工学系研究科電気系工学専攻"},{"subitem_text_value":"東京大学大学院工学系研究科電気系工学専攻"},{"subitem_text_value":"東京大学大学院工学系研究科電気系工学専攻"}]},"item_4_text_4":{"attribute_name":"著者所属(英)","attribute_value_mlt":[{"subitem_text_value":"Dept. of Electrical Engineering and Information Systems, Graduate School of Engineering, The University of Tokyo","subitem_text_language":"en"},{"subitem_text_value":"Dept. of Electrical Engineering and Information Systems, Graduate School of Engineering, The University of Tokyo","subitem_text_language":"en"},{"subitem_text_value":"Dept. of Electrical Engineering and Information Systems, Graduate School of Engineering, The University of Tokyo","subitem_text_language":"en"},{"subitem_text_value":"Dept. of Electrical Engineering and Information Systems, Graduate School of Engineering, The University of Tokyo","subitem_text_language":"en"},{"subitem_text_value":"Dept. of Electrical Engineering and Information Systems, Graduate School of Engineering, The University of Tokyo","subitem_text_language":"en"},{"subitem_text_value":"Dept. of Electrical Engineering and Information Systems, Graduate School of Engineering, The University of Tokyo","subitem_text_language":"en"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_publisher":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"情報処理学会","subitem_publisher_language":"ja"}]},"publish_status":"0","weko_shared_id":-1,"item_file_price":{"attribute_name":"Billing file","attribute_type":"file","attribute_value_mlt":[{"url":{"url":"https://ipsj.ixsq.nii.ac.jp/record/228886/files/IPSJ-SLDM23204019.pdf","label":"IPSJ-SLDM23204019.pdf"},"format":"application/pdf","billing":["billing_file"],"filename":"IPSJ-SLDM23204019.pdf","filesize":[{"value":"1.5 MB"}],"mimetype":"application/pdf","priceinfo":[{"tax":["include_tax"],"price":"0","billingrole":"10"},{"tax":["include_tax"],"price":"0","billingrole":"44"}],"accessrole":"open_login","version_id":"dc4f896f-2a8b-4647-91cd-0ed7f8a7ef4f","displaytype":"detail","licensetype":"license_note","license_note":"Copyright (c) 2023 by the Institute of Electronics, Information and Communication Engineers This SIG report is only available to those in membership of the SIG."}]},"item_4_creator_5":{"attribute_name":"著者名","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"松井, 千尋"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"小林, 英太郎"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"三澤, 奈央子"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"トープラサートポン, カシディット"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"高木, 信一"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"竹内, 健"}],"nameIdentifiers":[{}]}]},"item_4_creator_6":{"attribute_name":"著者名(英)","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Chihiro, Matsui","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Eitaro, Kobayashi","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Naoko, Misawa","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Kasidit, Toprasertpong","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Shinichi, Takagi","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Ken, Takeuchi","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_4_source_id_9":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA11451459","subitem_source_identifier_type":"NCID"}]},"item_4_textarea_12":{"attribute_name":"Notice","attribute_value_mlt":[{"subitem_textarea_value":"SIG Technical Reports are nonrefereed and hence may later appear in any journals, conferences, symposia, etc."}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourceuri":"http://purl.org/coar/resource_type/c_18gh","resourcetype":"technical report"}]},"item_4_source_id_11":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"2188-8639","subitem_source_identifier_type":"ISSN"}]},"item_4_description_7":{"attribute_name":"論文抄録","attribute_value_mlt":[{"subitem_description":"電圧センス型の FeFET Computation-in-Memory (CiM)を用いた，Hyperdimensional Computing (HDC) の学習および推論の高速な超並列演算を提案する．さらに，10,000 次元の hypervector を保存する FeFET セルに読み出しやデータ保持によって生じるエラーに対する演算結果のエラー耐性を示す．","subitem_description_type":"Other"}]},"item_4_description_8":{"attribute_name":"論文抄録(英)","attribute_value_mlt":[{"subitem_description":"A high-speed massively parallel operation for learning and inference in Hyperdimensional Computing (HDC) using voltage-sensing FeFET Computation-in-Memory (CiM) is proposed. Furthermore, this paper shows the error tolerance of the calculation results against errors caused by read-disturb and data-retention in FeFET cells that store 10,000-dimensional hypervectors.","subitem_description_type":"Other"}]},"item_4_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicPageEnd":"2","bibliographic_titles":[{"bibliographic_title":"研究報告システムとLSIの設計技術（SLDM）"}],"bibliographicPageStart":"1","bibliographicIssueDates":{"bibliographicIssueDate":"2023-11-10","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"19","bibliographicVolumeNumber":"2023-SLDM-204"}]},"relation_version_is_last":true,"weko_creator_id":"44499"},"id":228886,"links":{}}