{"links":{},"metadata":{"_oai":{"id":"oai:ipsj.ixsq.nii.ac.jp:00228871","sets":["1164:2036:11089:11372"]},"path":["11372"],"owner":"44499","recid":"228871","title":["アルファ線と重イオンによるソフトエラー率の周波数依存性の測定"],"pubdate":{"attribute_name":"公開日","attribute_value":"2023-11-10"},"_buckets":{"deposit":"f001cfa6-2714-4ea7-9d11-f5aaa90c486b"},"_deposit":{"id":"228871","pid":{"type":"depid","value":"228871","revision_id":0},"owners":[44499],"status":"published","created_by":44499},"item_title":"アルファ線と重イオンによるソフトエラー率の周波数依存性の測定","author_link":["614425","614428","614426","614431","614432","614429","614427","614430","614434","614433"],"item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"アルファ線と重イオンによるソフトエラー率の周波数依存性の測定"},{"subitem_title":"Frequency Dependence of Soft Error Rates Induced by Alpha-Particle and Heavy Ion","subitem_title_language":"en"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"信頼性 ","subitem_subject_scheme":"Other"}]},"item_type_id":"4","publish_date":"2023-11-10","item_4_text_3":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"京都工芸繊維大学"},{"subitem_text_value":"京都工芸繊維大学"},{"subitem_text_value":"京都工芸繊維大学"},{"subitem_text_value":"京都工芸繊維大学"},{"subitem_text_value":"京都工芸繊維大学"}]},"item_4_text_4":{"attribute_name":"著者所属(英)","attribute_value_mlt":[{"subitem_text_value":"Kyoto Institute of Technology","subitem_text_language":"en"},{"subitem_text_value":"Kyoto Institute of Technology","subitem_text_language":"en"},{"subitem_text_value":"Kyoto Institute of Technology","subitem_text_language":"en"},{"subitem_text_value":"Kyoto Institute of Technology","subitem_text_language":"en"},{"subitem_text_value":"Kyoto Institute of Technology","subitem_text_language":"en"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_publisher":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"情報処理学会","subitem_publisher_language":"ja"}]},"publish_status":"0","weko_shared_id":-1,"item_file_price":{"attribute_name":"Billing file","attribute_type":"file","attribute_value_mlt":[{"url":{"url":"https://ipsj.ixsq.nii.ac.jp/record/228871/files/IPSJ-SLDM23204004.pdf","label":"IPSJ-SLDM23204004.pdf"},"format":"application/pdf","billing":["billing_file"],"filename":"IPSJ-SLDM23204004.pdf","filesize":[{"value":"1.5 MB"}],"mimetype":"application/pdf","priceinfo":[{"tax":["include_tax"],"price":"0","billingrole":"10"},{"tax":["include_tax"],"price":"0","billingrole":"44"}],"accessrole":"open_login","version_id":"aa84edd4-f7a5-41c8-92b2-56ac3ab1c203","displaytype":"detail","licensetype":"license_note","license_note":"Copyright (c) 2023 by the Institute of Electronics, Information and Communication Engineers This SIG report is only available to those in membership of the SIG."}]},"item_4_creator_5":{"attribute_name":"著者名","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"杉崎, 春斗"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"中島, 隆一"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"杉谷, 昇太郎"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"古田, 潤"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"小林, 和淑"}],"nameIdentifiers":[{}]}]},"item_4_creator_6":{"attribute_name":"著者名(英)","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Haruto, Sugisaki","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Ryuichi, Nakajima","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Shotaro, Sugitani","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Jun, Furuta","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Kazutoshi, Kobayashi","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_4_source_id_9":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AA11451459","subitem_source_identifier_type":"NCID"}]},"item_4_textarea_12":{"attribute_name":"Notice","attribute_value_mlt":[{"subitem_textarea_value":"SIG Technical Reports are nonrefereed and hence may later appear in any journals, conferences, symposia, etc."}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourceuri":"http://purl.org/coar/resource_type/c_18gh","resourcetype":"technical report"}]},"item_4_source_id_11":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"2188-8639","subitem_source_identifier_type":"ISSN"}]},"item_4_description_7":{"attribute_name":"論文抄録","attribute_value_mlt":[{"subitem_description":"スキャン型 FF とインバータを組み合わせた回路を用いて，ソフトエラー率の動作周波数依存性を評価した．回路にクロックを入力したまま ???? 線や重イオンを照射することにより，クロックを動作させたままのソフトエラー率の測定を行う．???? 線照射時では，インバータが原因のソフトエラーはほとんど発生しなかった．FF が原因のソフトエラーは，動作周波数が向上するにつれて減少することがわかった．Ar 照射時では，動作周波数を上げても全体のソフトエラー率はあまり変化しなかった．これは，???? 線照射時と異なり，インバータが原因のソフトエラーの増加量が，FF が原因のソフトエラーの減少量とほぼ等しくなったからである．","subitem_description_type":"Other"}]},"item_4_description_8":{"attribute_name":"論文抄録(英)","attribute_value_mlt":[{"subitem_description":"We conducted a study on the frequency dependence analysis of soft error rates using the measurement circuit composed of scan FFs and inverters. By irradiating the circuit with alpha particles while the clock was running, the soft error rates were measured. During alpha-particle irradiation, soft errors caused by inverters were almost zero. Soft errors caused by FFs decreases as the operating frequency increases. On the other hand, during Ar irradiation, the overall soft error rate. This is because, unlike alpha-particle irradiation, the increase in soft errors caused by inverters was roughly equal to the decrease in soft errors caused by FFs.","subitem_description_type":"Other"}]},"item_4_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicPageEnd":"6","bibliographic_titles":[{"bibliographic_title":"研究報告システムとLSIの設計技術（SLDM）"}],"bibliographicPageStart":"1","bibliographicIssueDates":{"bibliographicIssueDate":"2023-11-10","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"4","bibliographicVolumeNumber":"2023-SLDM-204"}]},"relation_version_is_last":true,"weko_creator_id":"44499"},"created":"2025-01-19T01:28:00.299858+00:00","updated":"2025-01-19T11:41:15.918853+00:00","id":228871}