{"created":"2025-01-18T22:54:23.857937+00:00","metadata":{"_oai":{"id":"oai:ipsj.ixsq.nii.ac.jp:00022830","sets":["1164:1579:1580:1582"]},"path":["1582"],"owner":"1","recid":"22830","title":["高信頼セルによる演算器の耐故障性と遅延時間の評価"],"pubdate":{"attribute_name":"公開日","attribute_value":"2008-07-29"},"_buckets":{"deposit":"5fb0ba85-e85d-4254-8ce2-a504293ba443"},"_deposit":{"id":"22830","pid":{"type":"depid","value":"22830","revision_id":0},"owners":[1],"status":"published","created_by":1},"item_title":"高信頼セルによる演算器の耐故障性と遅延時間の評価","author_link":["0","0"],"item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"高信頼セルによる演算器の耐故障性と遅延時間の評価"},{"subitem_title":"A Functional Unit with Highly Reliable Cells and its Evaluation of Fault-tolerance and Delay Time","subitem_title_language":"en"}]},"item_type_id":"4","publish_date":"2008-07-29","item_4_text_3":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"奈良先端科学技術大学院大学"},{"subitem_text_value":"奈良先端科学技術大学院大学"},{"subitem_text_value":"奈良先端科学技術大学院大学"},{"subitem_text_value":"奈良先端科学技術大学院大学"},{"subitem_text_value":"奈良先端科学技術大学院大学"}]},"item_4_text_4":{"attribute_name":"著者所属(英)","attribute_value_mlt":[{"subitem_text_value":"Nara Institute of Science and Technology","subitem_text_language":"en"},{"subitem_text_value":"Nara Institute of Science and Technology","subitem_text_language":"en"},{"subitem_text_value":"Nara Institute of Science and Technology","subitem_text_language":"en"},{"subitem_text_value":"Nara Institute of Science and Technology","subitem_text_language":"en"},{"subitem_text_value":"Nara Institute of Science and Technology","subitem_text_language":"en"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_publisher":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"情報処理学会","subitem_publisher_language":"ja"}]},"publish_status":"0","weko_shared_id":-1,"item_file_price":{"attribute_name":"Billing file","attribute_type":"file","attribute_value_mlt":[{"url":{"url":"https://ipsj.ixsq.nii.ac.jp/record/22830/files/IPSJ-ARC08179031.pdf"},"date":[{"dateType":"Available","dateValue":"2010-07-29"}],"format":"application/pdf","billing":["billing_file"],"filename":"IPSJ-ARC08179031.pdf","filesize":[{"value":"594.6 kB"}],"mimetype":"application/pdf","priceinfo":[{"tax":["include_tax"],"price":"660","billingrole":"5"},{"tax":["include_tax"],"price":"330","billingrole":"6"},{"tax":["include_tax"],"price":"0","billingrole":"16"},{"tax":["include_tax"],"price":"0","billingrole":"44"}],"accessrole":"open_date","version_id":"4be29c22-2dfb-4868-907f-dd80af5f0e03","displaytype":"detail","licensetype":"license_note","license_note":"Copyright (c) 2008 by the Information Processing Society of Japan"}]},"item_4_creator_5":{"attribute_name":"著者名","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"鈴木, 一範"},{"creatorName":"中田, 尚"},{"creatorName":"中西, 正樹"},{"creatorName":"山下, 茂"},{"creatorName":"中島, 康彦"}],"nameIdentifiers":[{}]}]},"item_4_creator_6":{"attribute_name":"著者名(英)","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Kazunori, Suzuki","creatorNameLang":"en"},{"creatorName":"Takashi, Nakada","creatorNameLang":"en"},{"creatorName":"Masaki, Nakanishi","creatorNameLang":"en"},{"creatorName":"Shigeru, Yamashita","creatorNameLang":"en"},{"creatorName":"Yasuhiko, Nakashima","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_4_source_id_9":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AN10096105","subitem_source_identifier_type":"NCID"}]},"item_4_textarea_12":{"attribute_name":"Notice","attribute_value_mlt":[{"subitem_textarea_value":"SIG Technical Reports are nonrefereed and hence may later appear in any journals, conferences, symposia, etc."}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourceuri":"http://purl.org/coar/resource_type/c_18gh","resourcetype":"technical report"}]},"item_4_description_7":{"attribute_name":"論文抄録","attribute_value_mlt":[{"subitem_description":"トランジスタの性能ばらつきおよびトランジスタの故障率増大に対する解決策として，我々は高信頼セルを提案している．本報告ではセルの耐故障性を評価する指針として，レイアウトを用いた新しい故障モデルを提案する．新しい故障モデルを用いて耐故障性を評価した結果，高信頼セルを用いて構成された回路は従来セルを用いて構成された回路より高い耐故障性を備えていることがわかった．またアナログシミュレーションの結果，回路について故障を正しく検知できることを確認した．さらに，入力値に依存しない耐故障性を確認するための LSI の設計手法について述べる．","subitem_description_type":"Other"}]},"item_4_description_8":{"attribute_name":"論文抄録(英)","attribute_value_mlt":[{"subitem_description":"We have proposed highly reliable cells to solve an increase in transistor variation and in failure rate of transistors. In this paper, we propose a new fault model that uses the cell's layout as a guideline of evaluating fault tolerance of the cells. We evaluate fault tolerance based on new fault model and show that the circuit composed of highly reliable cells is better than the circuit composed of traditional cells. We performed analog simulation and show that the circuit can detect faults. In addition, we describe how to design an LSI that evaluates the fault tolerance that does not depend on input values. ","subitem_description_type":"Other"}]},"item_4_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicPageEnd":"186","bibliographic_titles":[{"bibliographic_title":"情報処理学会研究報告計算機アーキテクチャ（ARC）"}],"bibliographicPageStart":"181","bibliographicIssueDates":{"bibliographicIssueDate":"2008-07-29","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"75(2008-ARC-179)","bibliographicVolumeNumber":"2008"}]},"relation_version_is_last":true,"weko_creator_id":"1"},"id":22830,"updated":"2025-01-22T20:43:36.347260+00:00","links":{}}