{"metadata":{"_oai":{"id":"oai:ipsj.ixsq.nii.ac.jp:00227394","sets":["6164:6165:7651:11316"]},"path":["11316"],"owner":"44499","recid":"227394","title":["LSIの放射性エミッションノイズモデリングに向けたTEG設計"],"pubdate":{"attribute_name":"公開日","attribute_value":"2023-08-23"},"_buckets":{"deposit":"93c85b1e-568b-45b6-9397-62f885b1e36e"},"_deposit":{"id":"227394","pid":{"type":"depid","value":"227394","revision_id":0},"owners":[44499],"status":"published","created_by":44499},"item_title":"LSIの放射性エミッションノイズモデリングに向けたTEG設計","author_link":["605681","605689","605686","605688","605694","605685","605682","605687","605691","605692","605693","605684","605690","605683"],"item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"LSIの放射性エミッションノイズモデリングに向けたTEG設計"},{"subitem_title":"TEG Design for Radioactive Emission Noise Modeling of LSI","subitem_title_language":"en"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"テスト・信頼性，ポスター","subitem_subject_scheme":"Other"}]},"item_type_id":"18","publish_date":"2023-08-23","item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_18_text_3":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"弘前大学"},{"subitem_text_value":"弘前大学"},{"subitem_text_value":"弘前大学"},{"subitem_text_value":"弘前大学"},{"subitem_text_value":"日本大学"},{"subitem_text_value":"金沢大学"},{"subitem_text_value":"弘前大学"}]},"item_18_text_4":{"attribute_name":"著者所属(英)","attribute_value_mlt":[{"subitem_text_value":"Hirosaki University","subitem_text_language":"en"},{"subitem_text_value":"Hirosaki University","subitem_text_language":"en"},{"subitem_text_value":"Hirosaki University","subitem_text_language":"en"},{"subitem_text_value":"Hirosaki University","subitem_text_language":"en"},{"subitem_text_value":"Nihon University","subitem_text_language":"en"},{"subitem_text_value":"Kanazawa University","subitem_text_language":"en"},{"subitem_text_value":"Hirosaki University","subitem_text_language":"en"}]},"item_publisher":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"情報処理学会","subitem_publisher_language":"ja"}]},"publish_status":"0","weko_shared_id":-1,"item_file_price":{"attribute_name":"Billing file","attribute_type":"file","attribute_value_mlt":[{"url":{"url":"https://ipsj.ixsq.nii.ac.jp/record/227394/files/IPSJ-DAS2023029.pdf","label":"IPSJ-DAS2023029.pdf"},"date":[{"dateType":"Available","dateValue":"2025-08-23"}],"format":"application/pdf","billing":["billing_file"],"filename":"IPSJ-DAS2023029.pdf","filesize":[{"value":"1.9 MB"}],"mimetype":"application/pdf","priceinfo":[{"tax":["include_tax"],"price":"660","billingrole":"5"},{"tax":["include_tax"],"price":"330","billingrole":"6"},{"tax":["include_tax"],"price":"0","billingrole":"10"},{"tax":["include_tax"],"price":"0","billingrole":"44"}],"accessrole":"open_date","version_id":"62279c98-9904-4f81-84ef-1c9d999896f3","displaytype":"detail","licensetype":"license_note","license_note":"Copyright (c) 2023 by the Information Processing Society of Japan"}]},"item_18_creator_5":{"attribute_name":"著者名","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"石田, 大和"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"佐野, 文也"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"葛西, 瀬梨亜"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"神谷, 浩"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"松村, 哲哉"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"今村, 幸祐"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"金本, 俊幾"}],"nameIdentifiers":[{}]}]},"item_18_creator_6":{"attribute_name":"著者名(英)","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Yamato, Ishida","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Fumiya, Sano","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Seria, Kasai","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Hiroshi, Kamiya","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Tetsuya, Matsumura","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Kousuke, Imamura","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Toshiki, Kanamoto","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourceuri":"http://purl.org/coar/resource_type/c_5794","resourcetype":"conference paper"}]},"item_18_description_7":{"attribute_name":"論文抄録","attribute_value_mlt":[{"subitem_description":"近年の LSI の高速化に伴い，外部へ放射するエミッションノイズが EMC (Electromagnetic Compatibility) 問題として議論されている．これまでに，伝導性エミッションノイズの解析手法は確立しつつあるが，新たに放射性エミッションノイズの検証が望まれている．そこで本論文では，IEC62433-3 (ICEM-RE) に規定される放射性エミッションノイズの解析モデル導出に向けた TEG (Test Element Group)設計を提案する．当該TEGの設計データを用いたシミュレーションと，放射ノイズの実測との対比により，PDN (Passive Distribution Network) と等価オンチップアンテナのモデリングを行う．","subitem_description_type":"Other"}]},"item_18_description_8":{"attribute_name":"論文抄録(英)","attribute_value_mlt":[{"subitem_description":"Recently, with the increase in operating speeds of LSIs, emission noise has been discussed as an EMC (Electromagnetic Compatibility) problem. So far, methods for analyzing conducted emissions have been established, but methods for radiated emissions have not. Therefore, verification of radiated emissions is desired. In this paper, we propose a TEG (Test Element Group) design for deriving an analysis model of radiated emissions specified in IEC62433-3 (ICEM-RE). In our future work, we will model the equivalent on-chip antenna and the PDN (Passive Distribution Network) by comparing simulated noise from the TEG design with the actual measurement of radiated noise.","subitem_description_type":"Other"}]},"item_18_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicPageEnd":"186","bibliographic_titles":[{"bibliographic_title":"DAシンポジウム2023論文集"}],"bibliographicPageStart":"180","bibliographicIssueDates":{"bibliographicIssueDate":"2023-08-23","bibliographicIssueDateType":"Issued"},"bibliographicVolumeNumber":"2023"}]},"relation_version_is_last":true,"weko_creator_id":"44499"},"id":227394,"updated":"2025-01-19T12:11:16.552555+00:00","links":{},"created":"2025-01-19T01:26:39.663341+00:00"}