{"metadata":{"_oai":{"id":"oai:ipsj.ixsq.nii.ac.jp:00227281","sets":["6164:6165:6522:11317"]},"path":["11317"],"owner":"44499","recid":"227281","title":["モジュール粒度の違いがBug Localization手法へ与える影響の調査"],"pubdate":{"attribute_name":"公開日","attribute_value":"2023-08-16"},"_buckets":{"deposit":"e2da8f16-f231-411f-a389-0d0d7f50e678"},"_deposit":{"id":"227281","pid":{"type":"depid","value":"227281","revision_id":0},"owners":[44499],"status":"published","created_by":44499},"item_title":"モジュール粒度の違いがBug Localization手法へ与える影響の調査","author_link":["605248","605249","605247"],"item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"モジュール粒度の違いがBug Localization手法へ与える影響の調査"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"欠陥限局・テスト","subitem_subject_scheme":"Other"}]},"item_type_id":"18","publish_date":"2023-08-16","item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_18_text_3":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"東京工業大学情報理工学院"},{"subitem_text_value":"岡山県立大学情報工学部"},{"subitem_text_value":"東京工業大学情報理工学院"}]},"item_18_text_4":{"attribute_name":"著者所属(英)","attribute_value_mlt":[{"subitem_text_value":"School of Computing, Tokyo Institute of Technology","subitem_text_language":"en"},{"subitem_text_value":"Computer Science and Systems Engineering, Okayama Prefectural University","subitem_text_language":"en"},{"subitem_text_value":"School of Computing, Tokyo Institute of Technology","subitem_text_language":"en"}]},"item_publisher":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"情報処理学会","subitem_publisher_language":"ja"}]},"publish_status":"0","weko_shared_id":-1,"item_file_price":{"attribute_name":"Billing file","attribute_type":"file","attribute_value_mlt":[{"url":{"url":"https://ipsj.ixsq.nii.ac.jp/record/227281/files/IPSJ-SES2023010.pdf","label":"IPSJ-SES2023010.pdf"},"date":[{"dateType":"Available","dateValue":"2025-08-16"}],"format":"application/pdf","billing":["billing_file"],"filename":"IPSJ-SES2023010.pdf","filesize":[{"value":"685.3 kB"}],"mimetype":"application/pdf","priceinfo":[{"tax":["include_tax"],"price":"660","billingrole":"5"},{"tax":["include_tax"],"price":"330","billingrole":"6"},{"tax":["include_tax"],"price":"0","billingrole":"12"},{"tax":["include_tax"],"price":"0","billingrole":"44"}],"accessrole":"open_date","version_id":"1d6c2f6b-21e1-4a48-b454-44b8fed96764","displaytype":"detail","licensetype":"license_note","license_note":"Copyright (c) 2023 by the Information Processing Society of Japan"}]},"item_18_creator_5":{"attribute_name":"著者名","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"積田, 静夏"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"天嵜, 聡介"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"林, 晋平"}],"nameIdentifiers":[{}]}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourceuri":"http://purl.org/coar/resource_type/c_5794","resourcetype":"conference paper"}]},"item_18_description_7":{"attribute_name":"論文抄録","attribute_value_mlt":[{"subitem_description":"Bug Localization とはバグの原因箇所を特定する，ソフトウェア保守において重要な作業である．メソッドレベルで自動で Bug Localization を行う手法は開発者にとって有用なものの，手法数が少なく，評価可能なフレームワークも存在しないため知見が少ない．本論文では，既存の情報検索を用いた Bug Localization 手法をメソッドレベルで大規模に比較可能なフレームワークである FinerBench4BL を提案し，推薦モジュール粒度の違いが手法の精度や推薦時に考慮する追加情報，実行時間へ与える影響の調査を行う．本フレームワークはリポジトリ変換により Bench4BL のデータセットをメソッドレベルに再構築したメソッドリポジトリからデータセットを作成する．またメソッドリポジトリに基づき，既存のファイルレベルの手法を少ない修正でメソッドレベルに変更することで，データセットと組み合わせた評価フレームワークとした．FinerBench4BL を利用した調査の結果，メソッドレベルの手法は精度が低下する一方で，デバッグに必要な労力が削減されることが明らかになった．またメソッドレベルへの変更に伴い，既存手法が考慮する追加情報の影響が小さくなることから，多角的にソースコードの情報を利用し，より高精度なバグ箇所の推薦を可能にする調整が必要であることがわかった．メソッドレベルへの変更に伴う実行時間の増加は許容範囲内であった．","subitem_description_type":"Other"}]},"item_18_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicPageEnd":"57","bibliographic_titles":[{"bibliographic_title":"ソフトウェアエンジニアリングシンポジウム2023論文集"}],"bibliographicPageStart":"48","bibliographicIssueDates":{"bibliographicIssueDate":"2023-08-16","bibliographicIssueDateType":"Issued"},"bibliographicVolumeNumber":"2023"}]},"relation_version_is_last":true,"weko_creator_id":"44499"},"id":227281,"updated":"2025-01-19T12:13:37.352132+00:00","links":{},"created":"2025-01-19T01:26:33.051233+00:00"}