{"links":{},"metadata":{"_oai":{"id":"oai:ipsj.ixsq.nii.ac.jp:00224555","sets":["1164:1384:11164:11165"]},"path":["11165"],"owner":"44499","recid":"224555","title":["自動プログラム修正に対する実行経路を考慮した自動テストケース生成の評価"],"pubdate":{"attribute_name":"公開日","attribute_value":"2023-03-02"},"_buckets":{"deposit":"5d32695d-2a2c-4808-b71e-20cdf9876170"},"_deposit":{"id":"224555","pid":{"type":"depid","value":"224555","revision_id":0},"owners":[44499],"status":"published","created_by":44499},"item_title":"自動プログラム修正に対する実行経路を考慮した自動テストケース生成の評価","author_link":["592326","592329","592328","592325","592327"],"item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"自動プログラム修正に対する実行経路を考慮した自動テストケース生成の評価"},{"subitem_title":"Evaluation of Automated Test Case Generation Considering Execution Paths for Automated Program Repair","subitem_title_language":"en"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"テスト・自動修正・信頼性","subitem_subject_scheme":"Other"}]},"item_type_id":"4","publish_date":"2023-03-02","item_4_text_3":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"九州大学"},{"subitem_text_value":"九州大学"},{"subitem_text_value":"九州大学"},{"subitem_text_value":"九州大学"},{"subitem_text_value":"九州大学"}]},"item_4_text_4":{"attribute_name":"著者所属(英)","attribute_value_mlt":[{"subitem_text_value":"Kyushu University","subitem_text_language":"en"},{"subitem_text_value":"Kyushu University","subitem_text_language":"en"},{"subitem_text_value":"Kyushu University","subitem_text_language":"en"},{"subitem_text_value":"Kyushu University","subitem_text_language":"en"},{"subitem_text_value":"Kyushu University","subitem_text_language":"en"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_publisher":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"情報処理学会","subitem_publisher_language":"ja"}]},"publish_status":"0","weko_shared_id":-1,"item_file_price":{"attribute_name":"Billing file","attribute_type":"file","attribute_value_mlt":[{"url":{"url":"https://ipsj.ixsq.nii.ac.jp/record/224555/files/IPSJ-SE23213015.pdf","label":"IPSJ-SE23213015.pdf"},"date":[{"dateType":"Available","dateValue":"2025-03-02"}],"format":"application/pdf","billing":["billing_file"],"filename":"IPSJ-SE23213015.pdf","filesize":[{"value":"902.5 kB"}],"mimetype":"application/pdf","priceinfo":[{"tax":["include_tax"],"price":"660","billingrole":"5"},{"tax":["include_tax"],"price":"330","billingrole":"6"},{"tax":["include_tax"],"price":"0","billingrole":"12"},{"tax":["include_tax"],"price":"0","billingrole":"44"}],"accessrole":"open_date","version_id":"57d59479-db55-4b07-b474-ced1774caaea","displaytype":"detail","licensetype":"license_note","license_note":"Copyright (c) 2023 by the Information Processing Society of Japan"}]},"item_4_creator_5":{"attribute_name":"著者名","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"若松, 昌宏"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"松田, 雄河"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"近藤, 将成"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"亀井, 靖高"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"鵜林, 尚靖"}],"nameIdentifiers":[{}]}]},"item_4_source_id_9":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AN10112981","subitem_source_identifier_type":"NCID"}]},"item_4_textarea_12":{"attribute_name":"Notice","attribute_value_mlt":[{"subitem_textarea_value":"SIG Technical Reports are nonrefereed and hence may later appear in any journals, conferences, symposia, etc."}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourceuri":"http://purl.org/coar/resource_type/c_18gh","resourcetype":"technical report"}]},"item_4_source_id_11":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"2188-8825","subitem_source_identifier_type":"ISSN"}]},"item_4_description_7":{"attribute_name":"論文抄録","attribute_value_mlt":[{"subitem_description":"失敗テストケースの実行経路を考慮して自動生成したテストスイートを自動プログラム修正に用いることで，パッチの生成数は減少するが，デバッグの手がかりとならないパッチの生成数は減少し，生成されるパッチの精度が向上するという先行研究がある．この先行研究では kGenProg という自動プログラム修正手法のみを対象として実験を行なっていた．本研究では，AVATAR および TBar の 2 つの自動プログラム修正手法を加えることで先行研究の実験を拡張する．これにより，先行研究の主張である生成されるパッチの精度が向上するという結果の妥当性を検証する．実験を行った結果，デバッグの手がかりとなるパッチの生成数は変化しないか増加するが，デバッグの手がかりとならないパッチの生成数は変化しないか減少するという結果になった．kGenProg へ適用した時の先行研究の結果と比較すると，AVATAR および TBar では生成されるパッチの精度が向上したといえるため，先行研究の主張は AVATAR および TBar でも正しい．","subitem_description_type":"Other"}]},"item_4_description_8":{"attribute_name":"論文抄録(英)","attribute_value_mlt":[{"subitem_description":"Previous study has shown that using a test suite automatically generated by considering the execution paths of failed test cases for automated program repair decreases the number of patches generated, and decreases the number of patches that do not provide clues for debugging and therefore improves the accuracy of the generated patches. In previous study, experiments were conducted using only the kGenProg automated program repair method. In this study, we extend the previous study's experiments by adding two automated program repair methods, AVATAR and TBar. We verify the validity of the previous study's claim that this improves the accuracy of the generated patches. The results of our experiments show that automated program repair either do not change or increases the number of patches that provide clues for debugging, and either do not change or decreases the number of patches that do not provide clues for debugging. Compared to the results of the previous study applied to the kGenProg, The claim of the previous study is also true for AVATAR and TBar, since the accuracy of the patches generated by AVATAR and TBar is improved.","subitem_description_type":"Other"}]},"item_4_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicPageEnd":"8","bibliographic_titles":[{"bibliographic_title":"研究報告ソフトウェア工学（SE）"}],"bibliographicPageStart":"1","bibliographicIssueDates":{"bibliographicIssueDate":"2023-03-02","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"15","bibliographicVolumeNumber":"2023-SE-213"}]},"relation_version_is_last":true,"weko_creator_id":"44499"},"created":"2025-01-19T01:24:07.857618+00:00","updated":"2025-01-19T13:06:10.474590+00:00","id":224555}