{"links":{},"id":220778,"metadata":{"_oai":{"id":"oai:ipsj.ixsq.nii.ac.jp:00220778","sets":["6504:11035:11043"]},"path":["11043"],"owner":"44499","recid":"220778","title":["AI画像検査におけるモデル劣化検知手法"],"pubdate":{"attribute_name":"公開日","attribute_value":"2022-02-17"},"_buckets":{"deposit":"0464ed69-e821-4dca-a2af-9001dd6c1a56"},"_deposit":{"id":"220778","pid":{"type":"depid","value":"220778","revision_id":0},"owners":[44499],"status":"published","created_by":44499},"item_title":"AI画像検査におけるモデル劣化検知手法","author_link":["577686","577685"],"item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"AI画像検査におけるモデル劣化検知手法"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"人工知能と認知科学","subitem_subject_scheme":"Other"}]},"item_type_id":"22","publish_date":"2022-02-17","item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_22_text_3":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"東芝"},{"subitem_text_value":"東芝"}]},"item_publisher":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"情報処理学会","subitem_publisher_language":"ja"}]},"publish_status":"0","weko_shared_id":-1,"item_file_price":{"attribute_name":"Billing file","attribute_type":"file","attribute_value_mlt":[{"url":{"url":"https://ipsj.ixsq.nii.ac.jp/record/220778/files/IPSJ-Z84-6C-03.pdf","label":"IPSJ-Z84-6C-03.pdf"},"date":[{"dateType":"Available","dateValue":"2022-10-22"}],"format":"application/pdf","filename":"IPSJ-Z84-6C-03.pdf","filesize":[{"value":"634.8 kB"}],"mimetype":"application/pdf","accessrole":"open_date","version_id":"0f44ba72-b5cd-4c67-9fa2-35e83c5f7000","displaytype":"detail","licensetype":"license_note","license_note":"Copyright (c) 2022 by the Information Processing Society of Japan"}]},"item_22_creator_5":{"attribute_name":"著者名","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"内田, 美幸"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"鷲谷, 泰佑"}],"nameIdentifiers":[{}]}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourceuri":"http://purl.org/coar/resource_type/c_5794","resourcetype":"conference paper"}]},"item_22_source_id_9":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AN00349328","subitem_source_identifier_type":"NCID"}]},"item_22_description_7":{"attribute_name":"論文抄録","attribute_value_mlt":[{"subitem_description":"近年、AIによる画像分類の発展に伴い、生産現場においてもAIを使った外観画像検査が推進されている。しかし、運用当初は高い検査精度であっても、運用開始後に経時変化に伴って徐々に検査精度が低下し、AIモデルが劣化してしまう課題がある。AIモデルの劣化は不良品流出につながるため、早期に検知して対策することが必要である。弊社では、これまで特徴量空間を利用した異常検知技術を開発してきた。その技術を応用し、特徴量空間を利用したAIモデルの劣化検出技術を新たに開発した。開発したAIモデル劣化の検知手法と画像検査への適用検討結果について報告する。","subitem_description_type":"Other"}]},"item_22_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicPageEnd":"58","bibliographic_titles":[{"bibliographic_title":"第84回全国大会講演論文集"}],"bibliographicPageStart":"57","bibliographicIssueDates":{"bibliographicIssueDate":"2022-02-17","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"1","bibliographicVolumeNumber":"2022"}]},"relation_version_is_last":true,"weko_creator_id":"44499"},"created":"2025-01-19T01:20:48.381822+00:00","updated":"2025-01-19T14:26:04.663372+00:00"}