{"metadata":{"_oai":{"id":"oai:ipsj.ixsq.nii.ac.jp:00220005","sets":["1164:3500:10803:10983"]},"path":["10983"],"owner":"44499","recid":"220005","title":["不揮発メモリを対象とする性能マイクロベンチマークpmmeterの検討と予備試験"],"pubdate":{"attribute_name":"公開日","attribute_value":"2022-09-02"},"_buckets":{"deposit":"a714cf7b-aba3-4c4e-bad6-f7c7b29cc584"},"_deposit":{"id":"220005","pid":{"type":"depid","value":"220005","revision_id":0},"owners":[44499],"status":"published","created_by":44499},"item_title":"不揮発メモリを対象とする性能マイクロベンチマークpmmeterの検討と予備試験","author_link":["574684","574685","574683","574687","574688","574686","574682","574689"],"item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"不揮発メモリを対象とする性能マイクロベンチマークpmmeterの検討と予備試験"},{"subitem_title":"Design study and preliminary experiment of pmmeter: performance microbenchmarking tool for non-volatile memory","subitem_title_language":"en"}]},"item_type_id":"4","publish_date":"2022-09-02","item_4_text_3":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"東京大学大学院情報理工学系研究科"},{"subitem_text_value":"東京大学生産技術研究所"},{"subitem_text_value":"東京大学生産技術研究所"},{"subitem_text_value":"東京大学生産技術研究所"}]},"item_4_text_4":{"attribute_name":"著者所属(英)","attribute_value_mlt":[{"subitem_text_value":"Graduate School of Information Science and Technology, The University of Tokyo","subitem_text_language":"en"},{"subitem_text_value":" Institute of Industrial Science, The University of Tokyo","subitem_text_language":"en"},{"subitem_text_value":" Institute of Industrial Science, The University of Tokyo","subitem_text_language":"en"},{"subitem_text_value":" Institute of Industrial Science, The University of Tokyo","subitem_text_language":"en"}]},"item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_publisher":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"情報処理学会","subitem_publisher_language":"ja"}]},"publish_status":"0","weko_shared_id":-1,"item_file_price":{"attribute_name":"Billing file","attribute_type":"file","attribute_value_mlt":[{"url":{"url":"https://ipsj.ixsq.nii.ac.jp/record/220005/files/IPSJ-IFAT22148007.pdf","label":"IPSJ-IFAT22148007.pdf"},"format":"application/pdf","billing":["billing_file"],"filename":"IPSJ-IFAT22148007.pdf","filesize":[{"value":"1.0 MB"}],"mimetype":"application/pdf","priceinfo":[{"tax":["include_tax"],"price":"0","billingrole":"39"},{"tax":["include_tax"],"price":"0","billingrole":"44"}],"accessrole":"open_login","version_id":"d575532b-ae0f-40e2-9927-0bf7b83055ff","displaytype":"detail","licensetype":"license_note","license_note":"Copyright (c) 2022 by the Institute of Electronics, Information and Communication Engineers This SIG report is only available to those in membership of the SIG."}]},"item_4_creator_5":{"attribute_name":"著者名","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"吉岡, 弘隆"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"早水, 悠登"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"合田, 和生"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"喜連川, 優"}],"nameIdentifiers":[{}]}]},"item_4_creator_6":{"attribute_name":"著者名(英)","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"Hirotaka, Yoshioka","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Yuto, Hayamizu","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Kazuo, Goda","creatorNameLang":"en"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"Masaru, Kitsuregawa","creatorNameLang":"en"}],"nameIdentifiers":[{}]}]},"item_4_source_id_9":{"attribute_name":"書誌レコードID","attribute_value_mlt":[{"subitem_source_identifier":"AN10114171","subitem_source_identifier_type":"NCID"}]},"item_4_textarea_12":{"attribute_name":"Notice","attribute_value_mlt":[{"subitem_textarea_value":"SIG Technical Reports are nonrefereed and hence may later appear in any journals, conferences, symposia, etc."}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourceuri":"http://purl.org/coar/resource_type/c_18gh","resourcetype":"technical report"}]},"item_4_source_id_11":{"attribute_name":"ISSN","attribute_value_mlt":[{"subitem_source_identifier":"2188-8884","subitem_source_identifier_type":"ISSN"}]},"item_4_description_7":{"attribute_name":"論文抄録","attribute_value_mlt":[{"subitem_description":"近年製品出荷された不揮発メモリ（Non Volatile Memory 以下 NVM）を対象とする性能マイクロベンチマーク（pmmeter と称す）を開発し予備試験を実施した．NVM は通常の揮発性メモリ（DRAM）と同様にバイト単位のアクセスが可能であるが揮発性メモリ（DRAM）と異なりデータ永続性を持つ．データ永続性を持たせるために明示的な flush 命令やクラッシュ一貫性を担保するための fence 命令（同期命令）などが必要となる．NVM 製品である Intel Optane DC Persistent Memory Module (以下 Intel Optane DCPMM) ではキャッシュの内容を DCPMM に永続化するための flush 命令が複数あり，更に一貫性を担保する fence 命令の有無によって，そのレイテンシーやスループットが異なる．またキャッシュを利用しない non temporal 命令もあり，それらの組合せたときの動作性能（レイテンシーおよびスループット）も DRAM とはことなっていて自明ではない．そこで本研究では Intel Optane DCPMM 向けにマイクロベンチマークを検討し，その予備試験を行った．","subitem_description_type":"Other"}]},"item_4_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicPageEnd":"6","bibliographic_titles":[{"bibliographic_title":"研究報告情報基礎とアクセス技術（IFAT）"}],"bibliographicPageStart":"1","bibliographicIssueDates":{"bibliographicIssueDate":"2022-09-02","bibliographicIssueDateType":"Issued"},"bibliographicIssueNumber":"7","bibliographicVolumeNumber":"2022-IFAT-148"}]},"relation_version_is_last":true,"weko_creator_id":"44499"},"id":220005,"updated":"2025-01-19T14:42:05.889366+00:00","links":{},"created":"2025-01-19T01:20:03.452577+00:00"}