{"created":"2025-01-19T01:19:31.927570+00:00","updated":"2025-01-19T14:53:09.835878+00:00","metadata":{"_oai":{"id":"oai:ipsj.ixsq.nii.ac.jp:00219212","sets":["6164:6165:7651:10964"]},"path":["10964"],"owner":"44499","recid":"219212","title":["RISC-Vプロセッサにおける故障注入実験及び中性子照射実験の結果比較"],"pubdate":{"attribute_name":"公開日","attribute_value":"2022-08-24"},"_buckets":{"deposit":"1c7d9940-1c3e-417a-b2ae-5c64c20788c5"},"_deposit":{"id":"219212","pid":{"type":"depid","value":"219212","revision_id":0},"owners":[44499],"status":"published","created_by":44499},"item_title":"RISC-Vプロセッサにおける故障注入実験及び中性子照射実験の結果比較","author_link":["571572","571571"],"item_titles":{"attribute_name":"タイトル","attribute_value_mlt":[{"subitem_title":"RISC-Vプロセッサにおける故障注入実験及び中性子照射実験の結果比較"}]},"item_keyword":{"attribute_name":"キーワード","attribute_value_mlt":[{"subitem_subject":"信頼性","subitem_subject_scheme":"Other"}]},"item_type_id":"18","publish_date":"2022-08-24","item_language":{"attribute_name":"言語","attribute_value_mlt":[{"subitem_language":"jpn"}]},"item_18_text_3":{"attribute_name":"著者所属","attribute_value_mlt":[{"subitem_text_value":"大阪大学大学院情報科学研究科情報システム工学専攻"},{"subitem_text_value":"京都大学大学院情報学研究科通信情報システム専攻"}]},"item_publisher":{"attribute_name":"出版者","attribute_value_mlt":[{"subitem_publisher":"情報処理学会","subitem_publisher_language":"ja"}]},"publish_status":"0","weko_shared_id":-1,"item_file_price":{"attribute_name":"Billing file","attribute_type":"file","attribute_value_mlt":[{"url":{"url":"https://ipsj.ixsq.nii.ac.jp/record/219212/files/IPSJ-DAS2022040.pdf","label":"IPSJ-DAS2022040.pdf"},"date":[{"dateType":"Available","dateValue":"2024-08-24"}],"format":"application/pdf","billing":["billing_file"],"filename":"IPSJ-DAS2022040.pdf","filesize":[{"value":"877.7 kB"}],"mimetype":"application/pdf","priceinfo":[{"tax":["include_tax"],"price":"660","billingrole":"5"},{"tax":["include_tax"],"price":"330","billingrole":"6"},{"tax":["include_tax"],"price":"0","billingrole":"10"},{"tax":["include_tax"],"price":"0","billingrole":"44"}],"accessrole":"open_date","version_id":"6e2040c6-9e51-4a16-b074-df9bbec52258","displaytype":"detail","licensetype":"license_note","license_note":"Copyright (c) 2022 by the Information Processing Society of Japan"}]},"item_18_creator_5":{"attribute_name":"著者名","attribute_type":"creator","attribute_value_mlt":[{"creatorNames":[{"creatorName":"田上, 凱斗"}],"nameIdentifiers":[{}]},{"creatorNames":[{"creatorName":"橋本, 昌宜"}],"nameIdentifiers":[{}]}]},"item_resource_type":{"attribute_name":"資源タイプ","attribute_value_mlt":[{"resourceuri":"http://purl.org/coar/resource_type/c_5794","resourcetype":"conference paper"}]},"item_18_description_7":{"attribute_name":"論文抄録","attribute_value_mlt":[{"subitem_description":"ディジタルシステムでは宇宙線によってソフトエラーと呼ばれる一過性のエラーが発生し，信頼性を低下させる要因となっている．ソフトエラーを再現する方法として，ソフトウェアを用いた故障注入とデバイスへの放射線照射の二つがある．本研究では，市販の RISC-V プロセッサボードを対象に，この二つの実験手法によって得られる結果の比較を行う．五つのベンチマークプログラムを用いてそれぞれの実験を行った．故障注入実験では 32 個のレジスタ及びデータメモリを対象とし，放射線照射実験では中性子をプロセッサに照射した．Silent data corruption（SDC）についてはレジスタへの故障注入実験結果と中性子照射実験結果に正の相関関係が見られたが，detectable uncorrectable error（DUE）についてはレジスタ及びデータメモリのどちらにも正の相関関係が見られなかった．一方，プログラムサイズと中性子照射実験における DUE の間には正の相関関係が見られた．","subitem_description_type":"Other"}]},"item_18_biblio_info_10":{"attribute_name":"書誌情報","attribute_value_mlt":[{"bibliographicPageEnd":"226","bibliographic_titles":[{"bibliographic_title":"DAシンポジウム2022論文集"}],"bibliographicPageStart":"221","bibliographicIssueDates":{"bibliographicIssueDate":"2022-08-24","bibliographicIssueDateType":"Issued"},"bibliographicVolumeNumber":"2022"}]},"relation_version_is_last":true,"weko_creator_id":"44499"},"id":219212,"links":{}}